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  • XPS SPECTRA
    • *Free Library Membership
    • *Translate Website to My Language
    • Accuracy Limits – LiF as example
    • Anatomy / Features of Chemical State Spectra
    • Anatomy / Features of Survey Spectra
    • Chemical State Peak-fits – Examples
    • Chemical State Spectra – Overlays
    • Flood Gun Effect on Native Oxides
    • Free XPS Spectra – ISO 14976
    • FWHM for Peak-fitting Chemical Compounds
    • Gas Phase XPS
    • Ion Etched Elements – Capture UHV Gases
    • Literature Spectra (Reference Spectra)
    • Multiplet Splitting – Cr, Mn, Fe, Co, Ni, Cu
    • Native Oxides – Examples
    • Native Oxide Spectra – BEs of C (1s) ?
    • Polymer Spectra
    • Pure Element Spectra – Principal Signals
    • Pure Element Spectra – Survey Scans
    • Pure Element Spectra – Survey Scans + Labels
    • Rare Earth Metals – Principle Signals
    • Sources of Spectra and Data-File Formats
      • Thermo K-Alpha XPS
    • Survey Spectra – Examples
    • Valence Band Spectra – Elements
      • Valence Band – Examples
    • XPS Service by TXL
    • Auger Spectra – Examples
  • Background
    • Atom% & Shake-up
    • Background Endpoints
    • Background – Active Fitting
    • Background Subtraction-Removal
    • Background Width
    • Comparison of Background Types
    • Endpoint Averaging
    • Extrinsic Background
    • High BE Endpoint
    • Insulator Band Gap
    • Intrinsic Signal
    • Linear Background
    • Sherwood & Proctor Background
    • Shirley Background
    • Tougaard Background
    • Vegh Castle Salvi Background
  • BE Calibration
    • *** BE CALIBRATION – RULES
    • BE Calibration Values
    • BE Calibration – History
    • BE Reliability Problem
    • Calibration Checks – Validation
    • Calibration Metals
    • Deposited Gold
    • Fermi Edge
    • International BE Calibration – IXIR
    • Ion Etching – Ag, Au, Cu
    • ISO BE Standards
    • Publishing XPS Data
    • SCE Values
    • X-ray Energies
  • BE Tables
    • BE Table – Atomic # Order
    • Chemical State Identification – AgCl -ZrO2
    • Crist Table of BEs & FWHMs
    • Histogram Plots of NIST BEs
    • Periodic Table of Principal BEs
    • Summaries of NIST BEs
  • Charging
    • Adventitious Carbon
    • Charge Compensation
      • Charge Compensation – M. Biesinger
    • Charge Control
    • Charge-Control Mesh-Screen
    • Charge Referencing
      • Charge Correction – M. Beisinger
    • Charge Referencing Problems
    • Deposited Gold
    • Differential Charging
    • Flood Gun Optimization & Alignment
    • Peak-Shapes (charging)
  • Chemical States
    • Adventitious Carbon
    • Assigning Chemical States
    • BE Lookup Table
    • Charge Referencing
    • Chemical Shifts
    • Chemical State Definition
    • Chemical State Identification Tables – Ag to Zr
    • Chemical State Spectra
    • Crist Table of BEs & FWHMs
    • Deposited Gold
    • Energy Resolution – 2
    • From Auger Signals
    • From Survey Spectra
    • Hydrocarbon Carbon (not calibration)
    • Multiplet Splitting and BE Shifts
    • Multiplet Splitting
    • Overlaid Spectra – Examples
    • Overlapping Peaks
    • Pass Energies: 5-300 eV
    • Spin-Orbit Coupling
  • Data
    • Bad Data
    • Bad Peak-fit Example
    • Bad Survey Spectra
    • Cheat-Sheet
    • Data Collection Settings
    • Data File Formats
    • Data Processing Steps
    • Data Quality
    • Extending Spectrum Range Benefits
    • Publishing XPS Data
    • Statistics
    • XPS Detection Limit
  • Data Quality
    • **BE CALIBRATION – RULES
    • **Peak-Fitting – Facts, Rules & Guides
    • Accuracy
    • Bad Peak-fits
    • BE Scale Calibration
    • Chemical State Assignments
    • Energy Resolution (PE)
    • FWHMs – Peak-widths
    • GI-GO ?
    • Peak-fitting Results
    • Precision
    • RELIABILITY
    • Reliable BEs ?
    • Reliable Peak-fits ?
    • Repeatability
    • Reproducibility
    • Responsible
    • Signal-to-Noise (S/N)
  • Features
    • Asymmetric tail
    • Auger Signals
    • Background baseline
    • Background bulge
    • Background noise
    • Background shapes for peak-fitting
    • Band Gaps from Spectra
    • Charging artifact
    • Chemical shift
    • Chemical state
    • Degradation
    • Energy loss peak
    • Fermi edge
    • Gaussian Lorentzian Peak-shapes
    • Intrinsic and Extrinsic Losses
    • Multiplet splitting
    • Noise
    • Overlapping peaks
    • Peak-shapes (G, L, V)
    • Plasmon loss peaks
    • Plasmon or Shake-up – Which?
    • Satellite Peaks?
    • Shake-up peaks
    • Spin-Orbit coupling
    • Trace level signals
    • Voigt Peak-shape
  • FWHM Info
    • Core-Hole Lifetimes
    • Energy Resolution
    • FWHM for Peak-fitting Chemical Compounds
    • FWHM for Pure Metals – Mono and Non-Mono
    • FWHM vs Pass Energy
    • FWHM = Peak-width = Core-Hole Lifetime
    • Gaussian-Lorentzian Ratios
    • Natural FWHM
    • Pass Energies: 5-300 eV
    • Peak-Shapes (G, L, V)
    • Peak-Shape Tails
    • Peak-Shape Fit Example
    • s, p, d, f Peak-widths
    • X-ray Energies
  • Peak-fit Models
    • *Peak-Fit Review Service – Free
    • Asymmetry – Al (2p) metal
    • Background Types
      • Endpoints & Averaging
      • Linear Background
      • Shirley Background
      • Tougaard Background
      • Vegh Background
    • Bad vs Good Peak-fits Explained
    • Bad Peak-fits Published in Journals– Explained
    • Bad Peak-fitting Example – Ni (2p3)
    • Complex Peak-fits Explained
    • Gaussian Lorentzian Models
    • Multiplet Splitting – 3s – orbitals
    • Multiplet Splitting – 2p – Cr, Mn, Fe, Co, Ni, Cu
    • Multiplet Splitting – Rare Earths
    • Multiplet Splitting Calculated by P. Bagus
    • Noisy Data – Coal
    • Noisy Data – Ni metal
    • Overlapping Doublets – Sulfur
    • Peak Base and Top
    • Peak-Shapes (G, L, V)
    • Peak-Shapes – Example #1
    • Peak-fitting a Single O (1s) Peak
    • Peak Area Ratios – PET C (1s)
    • Pt overlaps Al – ratios
    • Pure Single Crystal – CaCO3 (Calcite)
    • Sb overlaps O – ratios
    • Shake-up – Metals
    • Shake-up – Organics
    • Smoothing – Bad vs OK
    • Super Coster-Kronig Effect
    • Synthetic Peaks
    • Too Many Peaks – O (1s) – native SiOx
    • Vibrational Bands – PE & PP
    • Which Peak-fit is Bad or Good ??
  • Peak-fitting
    • **Peak-fitting – Facts, Rules & Guides
    • **Peak-fitting a Single O (1s) Peak – Easy!
    • **Peak-fitting MOVIES
    • **Plot Examples
    • Abbe Criterion
    • Advanced Peak-fitting Examples
    • Background Endpoints
    • Background Shapes for Peak-fitting
    • Bad Peak-fits Explained
    • BEs & FWHMs – Tables
    • Bubble Chart for Peak-fitting
    • Chemical State Spectra Peak-fits – Examples
    • Chi-Squared
    • Constrained Peak-fit
    • Curve-fitting = Peak-fitting
    • Energy Resolution – 2
    • FWHM Peak-width vs Pass Energy
    • Gaussian-Lorentzian Ratios
    • Multiplet Splitting
    • Overlapping Peaks
    • Pass Energies: 5-300 eV
    • Peak Area vs Background Endpoints
    • Peak-fit Quality
    • Peak-fitting Flow-Chart
    • Peak-fitting Guides
    • Peak-fitting Process – Examples
    • Peak-fitting Variables
    • Peak-Shapes (G, L, V)
    • Shirley Background
    • Simple Peak-fit Examples
    • Tougaard Backgound
  • Quantification %s
    • *Accuracy Limits – LiF as example
    • *Quantification – Atom%s
    • Atom% gives Empirical Formula
    • Background
    • Calculated IMFPs, Scattering & Photoemission
    • EAL – Effective Attenuation Length
    • IMFP – Metal vs Metal Oxide
    • Integration Endpoints
    • Linear Background
    • Shirley Background
    • Tougaard Background
    • XPS Detection Limits
  • Sample
    • Beam Alignment
    • Chemical Suppliers
    • Contamination
    • In-Situ Treatments
    • Ion Beam Etching
    • Ion Etching Variables
    • Ion Etch Rate Films
    • Photos of Samples
    • Reference Materials
    • Sample “specimen” Handling
    • Sample History
    • Sample Preparation Bench
    • Sample Preparation Methods
    • Sample Preparation Equipment
    • Sample Size, Shape & Form
    • Sample Storage
    • Suppliers – Single Xtals, Nano, 2D, Perovskites, Graphene
      • 2D Materials Suppliers
      • Graphene Materials
      • NanoParticle Suppliers
      • Perovskite Suppliers
      • Single Crystal Suppliers
    • X-ray Beam Size
  • Software
    • *Spectra Data Processor – 1 yr free license
      • SDP v7 – Training Videos
    • AAnalyzer
    • Avantage
    • CasaXPS
    • ComPro
    • ESCApe
    • Multi-Pak
    • MultiQuant
    • Quases
    • Sessa
    • TPP-2M IMFP Calculator
    • Unifit
    • Free Software
  • XPS Labs
    • *XPS Labs around the World
    • Contract Labs having XPS
    • Industrial Labs having XPS
    • National Labs having XPS
    • Synchrotron Labs having XPS
    • University Labs having XPS
  • XPS Basics
    • Advantages of XPS
    • Basic Principles – PHI Handbook
    • Common Difficulties
    • Data Collection Settings
    • Data Processing Steps
    • Limits & Weaknesses
    • Physics of XPS
    • Wikipedia – XPS
    • XPS Detection Limits
  • Advanced XPS
    • Charge Referencing
    • AR-XPS
    • Auger Parameter
    • Bagus Papers
      • Advanced Interpretation of XPS
    • Band Gaps
    • Capture of UHV Gases
    • Circular Dichroism in XPS
    • Depth Profiling
    • Electron Configuration – Orbitals
    • Electronic State Info
    • Environmental XPS
    • Experimental Details
    • Excited States
    • Final & Initial States
    • HAXPES
    • IMFP & AL
    • Imaging – Mapping
    • Initial & Final States
    • Ion Etch Rate Films
    • Ion Etch Rate Tables
    • Laser-XPS
    • One Electron Approximation
    • Photoelectron BE Diagrams
    • Photoemission Process
    • Quantification – Atom%s
    • Quantum Mechanics of XPS
    • Scattering Effects
    • Spin-Orbit Coupling
    • Tesla Coil Irradiation Effects
    • Thickness Estimates
    • TPP-2M and IMFPs
    • Transmission Function
    • Work Functions of Elements
    • XPS Theory
    • X-ray Data Booklet – LBL – PDF
  • Application Notes
    • Common Applications
    • EAG Application Notes
    • Kratos Application Notes
    • Surface Science Western
    • Thermo Application Notes
    • Ulvac-PHI Application Notes
    • XPS International Application Notes
  • Degradation
    • Degradation of Polymers
    • Degradation due to Flood Gun Electrons
    • Degradation due to Ar+ Ion Etching
    • Degradation due to X-ray Flux
  • Experts
    • Consultants
    • Legal Witness
  • Information Depth
    • XPS vs Auger Information Depth
    • XPS vs SEM-EDS Information Depth
    • XPS vs ToF-SIMS Information Depth
  • Instrument
    • Inside View – Analysis Chamber
    • Instrument Buying Guide
    • Instrument Components & Accessories
    • Instrument Design
    • Instrument Geometries
    • Instrument Makers
    • Instrument Service
    • Operating Conditions
    • Performance vs Specification
    • Sample Mounts
    • Synchrotrons for XPS
    • Transmission Function
    • Troubleshooting
    • X-ray Beam Alignment
    • X-ray Sources
  • Journals
    • Experimental Details to Publish
    • Journal Editors
    • XPS Books
    • XPS Journals
  • Makers
    • Instrument Makers
  • NIST
    • *Publishing XPS Data
    • *XPS BEs – On-line Database – NIST
    • Histogram Plots of NIST BEs
    • Review of NIST XPS BEs
    • SRD 64 Electron Elastic Scattering
    • SRD 71 Electron IMFP Database
    • SRD 82 Electron EAL Database
    • Summaries of BE Tables – NIST
    • Wagner Book of XPS BEs (NIST)
    • XPS Information from NIST
  • Posters
    • Drawings & Schematics
    • Flowcharts & Guides
    • Graphs & Charts
    • Instrument Details & Adjustments
    • Interactive Visualizations
    • Physics & Theory
    • Sample Degradation
    • Spectra Examples
    • Tables & Guides
    • Wall Charts & Wall Posters
  • σ, SF, ASF, & RSF
    • *Quantification – Atom%s
    • *Table of Scofield σ, (RSFs)
    • Beisinger SFs – Wagner e-ASFs variation
    • Crist Inflection-Point SFs – Scofield variation
    • Kratos SFs – 1990 – Scofield
    • Plots Comparing SFs
    • Plots of Ulvac PHI e-ASFs
    • Scofield SFs – Al X-rays – Theoretical
    • Scofield SFs – Al X-rays – Crist Modified
    • Scofield SFs – Al X-rays – Thermo Modified
    • Thermo SFs – Scofield RSFs
    • Test of Scofield SFs
    • Ulvac-PHI e-ASFs – March 2002 – Wagner
    • Ulvac-PHI e-ASFs – Wagner variation
    • Wagner’s Original e-ASFs
    • Wagner e-ASFs – Al X-rays – MultiPak
    • Wagner e-ASFs – Al X-rays – PHI – Omni-5
    • Wagner e-ASFs – F (1s)=1.0 vs C (1s)=1.0
  • Spectra-Bases #1
    • XPS (.SDP format) 7304 data-sets pwp
    • XPS (.VMS, .ISO, .TXT) 3177 data-sets pwp
    • XPS (.VGD) 7113 data-sets pwp
    • AES (.SDP, .NPL, .VMS) 2281 data-sets pwp
  • Spectra-Bases #2
    • Binary Oxides, 46 MB (*.sdp)
    • Carbon KLL Auger, 2 MB (*.sdp)
    • Chemical State Groups, 1 GB (*.vgd)
    • Flood Gun ON – Native Oxides, 1 MB (plots)
    • Handbook Series, 34 MB (*.iso, *.vms)
    • HER Auger Spectra, 12 MB (*.sdp)
    • Industrial Goods, 67 MB (*.vgd)
    • Miscellaneous, 60 MB (*.txt)
    • Native Oxides, 16 MB, FG OFF (*.vgd)
    • Native Oxides FG ON-OFF, 5 MB (*.sdp)
    • NECSA-Bio Polymers, 2 MB (*.mrs)
    • Original S-Probe, 90 MB (*.mrs)
    • PHI Handbook Spectra, 6 MB (*.spe)
    • Polymers, 46 MB (*.sdp)
    • Rare Earth Materials, 36 MB (*.vgd)
    • S-Probe, 200 MB (*.mrs, ASCII)
    • Single Crystals, 240 MB (*.vgd)
    • TXL IP-eSF, 340 MB (*.vgd)
    • UHV Gas Capture, 1 MB (3D plots)
    • Valence Band, 3 MB (*.txt, *.sdp)
    • VG Eclipse Database, 9 MB (*.dts)
    • X-ray Degradation of Polymers, 1 MB (*.sdp)
    • XPS Simplified, 14 MB (*.vgd)
  • Spectra Handbooks
    • Crist – Vol 1 – The Elements & Native Oxides
    • Crist – Vol 2 – Commercially Pure Metal Oxides
    • Crist – Vol 3 – Semiconductors
    • Crist – Vol 4 – Polymers
    • Crist – Vol 5 – RE Oxides, Carbonates, Hydroxides, Sulfides, Nitrides…
    • JEOL – Handbook of Spectra – Elements
    • Kratos – Polymers – PDF
    • PHI – Handbook of Spectra – Elements
    • Photos of XPS Handbooks
    • SurfaceSpectra – Polymers PDF
    • Wiley – Vol 1-3 -of Monochromatic XPS Spectra
  • Sponsors
    • Advertise
    • Donation Please – Cart – Checkout
    • Future for XPS Instrument Sales
    • Landing Page
    • Logo’s of Advertisers
  • Standards
    • AFNOR Standards
    • ASTM Standards
    • BAM Standards
    • BSI Standards
    • CSA Standards
    • DIN Standards
    • GOST-R & RuStandards
    • ISO Standards
    • JIS Standards
    • KSA Standards
    • Publishing XPS Data
    • SiS Standards
  • Surface Chemistry
    • Adventitious Carbon
    • Anti-Static, Anti-Caking
    • Capture of UHV Gases
    • Carbonates from CO2
    • Catalyst Surface
    • Clean Surface
    • Chemical Treatments
    • Contamination
    • Corrosion
    • Creeping Lubricants
    • Deposition Methods
    • Gas Treatments
    • Heat Treatments
    • Ion Etching
    • Hydroxides from Oxides
    • Lifetime of Clean Surfaces
    • Lubricants
    • Natural Oxidation
    • Oxidation Treatments
    • PDMS – Silicone Oil
    • Plasma Treatments
    • Sticking Coefficients of Gases
    • Sulfides from H2S (air)
    • Surface Chemical Reaction
    • Surface Contaminants
    • Surface Photo-Chemistry
    • Surface Reactivity
    • Tesla Coil Irradiation
  • Training
    • AVS Training Courses
    • Instrument Training
    • Instrument Training by Maker
    • Professional Teachers
      • Kateryna Artyushova
      • C. Richard Brundle
      • John T. Grant
      • Sven Tougaard
    • PPT / PDF Presentations
    • Software Operation
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    • XPS Training Videos
  • Vocabulary
    • ISO 18115-1:2013 XPS Terms
    • Terms & Phrases for XPS
  • XPS
    • The History of XPS
    • Collections of XPS Spectra
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    • XPS Job Openings
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  • $$ SUPPORT The XPS Library
    • Angels who Donate
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  • IXIR
    • International XPS Instruments Registry – IXIR
    • Register into IXIR Database System
    • IXIR Database ON-LINE
    • flat-database-test
  • TXL Members
    • *Contact TXL
    • Advertising
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    • Contributing Editors
      • Bagus, Paul S. (USA)
      • Biesinger, Mark C. (Canada)
      • Brundle, C. Richard (USA)
      • Fairley, Neal (England)
      • Fernandez, Vincent (France)
      • Herrera Gomez, Alberto (Mexico)
      • Linford, Matthew (USA)
      • Moulder, John (USA)
      • Smentkowski, Vincent S. (USA)
    • Expert Members
  • Membership
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  • TXL Videos
    • Videos of TXL Website
  • Useful Links
    • Alloy & Stainless Steel Kit Supplier
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    • Cleanliness of Surfaces
    • Database Websites – XPS
    • HyperPhysics
    • International Conferences – XPS
    • Links to >700 pages at TXL
    • Materials Analysis Methods – List
    • Polymer Suppliers
    • Rare Earth Suppliers
    • Semiconductor Suppliers
    • Single Crystal Suppliers
    • Synchrotrons
    • Useful Websites
  • XPS Service by TXL
  • About TXL
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  • Home Page (Front)
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    • XPS Library – SEO TERMS
  • Site-Map
  • XPS SPECTRA
    • *Free Library Membership
    • *Translate Website to My Language
    • Accuracy Limits – LiF as example
    • Anatomy / Features of Chemical State Spectra
    • Anatomy / Features of Survey Spectra
    • Chemical State Peak-fits – Examples
    • Chemical State Spectra – Overlays
    • Flood Gun Effect on Native Oxides
    • Free XPS Spectra – ISO 14976
    • FWHM for Peak-fitting Chemical Compounds
    • Gas Phase XPS
    • Ion Etched Elements – Capture UHV Gases
    • Literature Spectra (Reference Spectra)
    • Multiplet Splitting – Cr, Mn, Fe, Co, Ni, Cu
    • Native Oxides – Examples
    • Native Oxide Spectra – BEs of C (1s) ?
    • Polymer Spectra
    • Pure Element Spectra – Principal Signals
    • Pure Element Spectra – Survey Scans
    • Pure Element Spectra – Survey Scans + Labels
    • Rare Earth Metals – Principle Signals
    • Sources of Spectra and Data-File Formats
      • Thermo K-Alpha XPS
    • Survey Spectra – Examples
    • Valence Band Spectra – Elements
      • Valence Band – Examples
    • XPS Service by TXL
    • Auger Spectra – Examples
  • Background
    • Atom% & Shake-up
    • Background Endpoints
    • Background – Active Fitting
    • Background Subtraction-Removal
    • Background Width
    • Comparison of Background Types
    • Endpoint Averaging
    • Extrinsic Background
    • High BE Endpoint
    • Insulator Band Gap
    • Intrinsic Signal
    • Linear Background
    • Sherwood & Proctor Background
    • Shirley Background
    • Tougaard Background
    • Vegh Castle Salvi Background
  • BE Calibration
    • *** BE CALIBRATION – RULES
    • BE Calibration Values
    • BE Calibration – History
    • BE Reliability Problem
    • Calibration Checks – Validation
    • Calibration Metals
    • Deposited Gold
    • Fermi Edge
    • International BE Calibration – IXIR
    • Ion Etching – Ag, Au, Cu
    • ISO BE Standards
    • Publishing XPS Data
    • SCE Values
    • X-ray Energies
  • BE Tables
    • BE Table – Atomic # Order
    • Chemical State Identification – AgCl -ZrO2
    • Crist Table of BEs & FWHMs
    • Histogram Plots of NIST BEs
    • Periodic Table of Principal BEs
    • Summaries of NIST BEs
  • Charging
    • Adventitious Carbon
    • Charge Compensation
      • Charge Compensation – M. Biesinger
    • Charge Control
    • Charge-Control Mesh-Screen
    • Charge Referencing
      • Charge Correction – M. Beisinger
    • Charge Referencing Problems
    • Deposited Gold
    • Differential Charging
    • Flood Gun Optimization & Alignment
    • Peak-Shapes (charging)
  • Chemical States
    • Adventitious Carbon
    • Assigning Chemical States
    • BE Lookup Table
    • Charge Referencing
    • Chemical Shifts
    • Chemical State Definition
    • Chemical State Identification Tables – Ag to Zr
    • Chemical State Spectra
    • Crist Table of BEs & FWHMs
    • Deposited Gold
    • Energy Resolution – 2
    • From Auger Signals
    • From Survey Spectra
    • Hydrocarbon Carbon (not calibration)
    • Multiplet Splitting and BE Shifts
    • Multiplet Splitting
    • Overlaid Spectra – Examples
    • Overlapping Peaks
    • Pass Energies: 5-300 eV
    • Spin-Orbit Coupling
  • Data
    • Bad Data
    • Bad Peak-fit Example
    • Bad Survey Spectra
    • Cheat-Sheet
    • Data Collection Settings
    • Data File Formats
    • Data Processing Steps
    • Data Quality
    • Extending Spectrum Range Benefits
    • Publishing XPS Data
    • Statistics
    • XPS Detection Limit
  • Data Quality
    • **BE CALIBRATION – RULES
    • **Peak-Fitting – Facts, Rules & Guides
    • Accuracy
    • Bad Peak-fits
    • BE Scale Calibration
    • Chemical State Assignments
    • Energy Resolution (PE)
    • FWHMs – Peak-widths
    • GI-GO ?
    • Peak-fitting Results
    • Precision
    • RELIABILITY
    • Reliable BEs ?
    • Reliable Peak-fits ?
    • Repeatability
    • Reproducibility
    • Responsible
    • Signal-to-Noise (S/N)
  • Features
    • Asymmetric tail
    • Auger Signals
    • Background baseline
    • Background bulge
    • Background noise
    • Background shapes for peak-fitting
    • Band Gaps from Spectra
    • Charging artifact
    • Chemical shift
    • Chemical state
    • Degradation
    • Energy loss peak
    • Fermi edge
    • Gaussian Lorentzian Peak-shapes
    • Intrinsic and Extrinsic Losses
    • Multiplet splitting
    • Noise
    • Overlapping peaks
    • Peak-shapes (G, L, V)
    • Plasmon loss peaks
    • Plasmon or Shake-up – Which?
    • Satellite Peaks?
    • Shake-up peaks
    • Spin-Orbit coupling
    • Trace level signals
    • Voigt Peak-shape
  • FWHM Info
    • Core-Hole Lifetimes
    • Energy Resolution
    • FWHM for Peak-fitting Chemical Compounds
    • FWHM for Pure Metals – Mono and Non-Mono
    • FWHM vs Pass Energy
    • FWHM = Peak-width = Core-Hole Lifetime
    • Gaussian-Lorentzian Ratios
    • Natural FWHM
    • Pass Energies: 5-300 eV
    • Peak-Shapes (G, L, V)
    • Peak-Shape Tails
    • Peak-Shape Fit Example
    • s, p, d, f Peak-widths
    • X-ray Energies
  • Peak-fit Models
    • *Peak-Fit Review Service – Free
    • Asymmetry – Al (2p) metal
    • Background Types
      • Endpoints & Averaging
      • Linear Background
      • Shirley Background
      • Tougaard Background
      • Vegh Background
    • Bad vs Good Peak-fits Explained
    • Bad Peak-fits Published in Journals– Explained
    • Bad Peak-fitting Example – Ni (2p3)
    • Complex Peak-fits Explained
    • Gaussian Lorentzian Models
    • Multiplet Splitting – 3s – orbitals
    • Multiplet Splitting – 2p – Cr, Mn, Fe, Co, Ni, Cu
    • Multiplet Splitting – Rare Earths
    • Multiplet Splitting Calculated by P. Bagus
    • Noisy Data – Coal
    • Noisy Data – Ni metal
    • Overlapping Doublets – Sulfur
    • Peak Base and Top
    • Peak-Shapes (G, L, V)
    • Peak-Shapes – Example #1
    • Peak-fitting a Single O (1s) Peak
    • Peak Area Ratios – PET C (1s)
    • Pt overlaps Al – ratios
    • Pure Single Crystal – CaCO3 (Calcite)
    • Sb overlaps O – ratios
    • Shake-up – Metals
    • Shake-up – Organics
    • Smoothing – Bad vs OK
    • Super Coster-Kronig Effect
    • Synthetic Peaks
    • Too Many Peaks – O (1s) – native SiOx
    • Vibrational Bands – PE & PP
    • Which Peak-fit is Bad or Good ??
  • Peak-fitting
    • **Peak-fitting – Facts, Rules & Guides
    • **Peak-fitting a Single O (1s) Peak – Easy!
    • **Peak-fitting MOVIES
    • **Plot Examples
    • Abbe Criterion
    • Advanced Peak-fitting Examples
    • Background Endpoints
    • Background Shapes for Peak-fitting
    • Bad Peak-fits Explained
    • BEs & FWHMs – Tables
    • Bubble Chart for Peak-fitting
    • Chemical State Spectra Peak-fits – Examples
    • Chi-Squared
    • Constrained Peak-fit
    • Curve-fitting = Peak-fitting
    • Energy Resolution – 2
    • FWHM Peak-width vs Pass Energy
    • Gaussian-Lorentzian Ratios
    • Multiplet Splitting
    • Overlapping Peaks
    • Pass Energies: 5-300 eV
    • Peak Area vs Background Endpoints
    • Peak-fit Quality
    • Peak-fitting Flow-Chart
    • Peak-fitting Guides
    • Peak-fitting Process – Examples
    • Peak-fitting Variables
    • Peak-Shapes (G, L, V)
    • Shirley Background
    • Simple Peak-fit Examples
    • Tougaard Backgound
  • Quantification %s
    • *Accuracy Limits – LiF as example
    • *Quantification – Atom%s
    • Atom% gives Empirical Formula
    • Background
    • Calculated IMFPs, Scattering & Photoemission
    • EAL – Effective Attenuation Length
    • IMFP – Metal vs Metal Oxide
    • Integration Endpoints
    • Linear Background
    • Shirley Background
    • Tougaard Background
    • XPS Detection Limits
  • Sample
    • Beam Alignment
    • Chemical Suppliers
    • Contamination
    • In-Situ Treatments
    • Ion Beam Etching
    • Ion Etching Variables
    • Ion Etch Rate Films
    • Photos of Samples
    • Reference Materials
    • Sample “specimen” Handling
    • Sample History
    • Sample Preparation Bench
    • Sample Preparation Methods
    • Sample Preparation Equipment
    • Sample Size, Shape & Form
    • Sample Storage
    • Suppliers – Single Xtals, Nano, 2D, Perovskites, Graphene
      • 2D Materials Suppliers
      • Graphene Materials
      • NanoParticle Suppliers
      • Perovskite Suppliers
      • Single Crystal Suppliers
    • X-ray Beam Size
  • Software
    • *Spectra Data Processor – 1 yr free license
      • SDP v7 – Training Videos
    • AAnalyzer
    • Avantage
    • CasaXPS
    • ComPro
    • ESCApe
    • Multi-Pak
    • MultiQuant
    • Quases
    • Sessa
    • TPP-2M IMFP Calculator
    • Unifit
    • Free Software
  • XPS Labs
    • *XPS Labs around the World
    • Contract Labs having XPS
    • Industrial Labs having XPS
    • National Labs having XPS
    • Synchrotron Labs having XPS
    • University Labs having XPS
  • XPS Basics
    • Advantages of XPS
    • Basic Principles – PHI Handbook
    • Common Difficulties
    • Data Collection Settings
    • Data Processing Steps
    • Limits & Weaknesses
    • Physics of XPS
    • Wikipedia – XPS
    • XPS Detection Limits
  • Advanced XPS
    • Charge Referencing
    • AR-XPS
    • Auger Parameter
    • Bagus Papers
      • Advanced Interpretation of XPS
    • Band Gaps
    • Capture of UHV Gases
    • Circular Dichroism in XPS
    • Depth Profiling
    • Electron Configuration – Orbitals
    • Electronic State Info
    • Environmental XPS
    • Experimental Details
    • Excited States
    • Final & Initial States
    • HAXPES
    • IMFP & AL
    • Imaging – Mapping
    • Initial & Final States
    • Ion Etch Rate Films
    • Ion Etch Rate Tables
    • Laser-XPS
    • One Electron Approximation
    • Photoelectron BE Diagrams
    • Photoemission Process
    • Quantification – Atom%s
    • Quantum Mechanics of XPS
    • Scattering Effects
    • Spin-Orbit Coupling
    • Tesla Coil Irradiation Effects
    • Thickness Estimates
    • TPP-2M and IMFPs
    • Transmission Function
    • Work Functions of Elements
    • XPS Theory
    • X-ray Data Booklet – LBL – PDF
  • Application Notes
    • Common Applications
    • EAG Application Notes
    • Kratos Application Notes
    • Surface Science Western
    • Thermo Application Notes
    • Ulvac-PHI Application Notes
    • XPS International Application Notes
  • Degradation
    • Degradation of Polymers
    • Degradation due to Flood Gun Electrons
    • Degradation due to Ar+ Ion Etching
    • Degradation due to X-ray Flux
  • Experts
    • Consultants
    • Legal Witness
  • Information Depth
    • XPS vs Auger Information Depth
    • XPS vs SEM-EDS Information Depth
    • XPS vs ToF-SIMS Information Depth
  • Instrument
    • Inside View – Analysis Chamber
    • Instrument Buying Guide
    • Instrument Components & Accessories
    • Instrument Design
    • Instrument Geometries
    • Instrument Makers
    • Instrument Service
    • Operating Conditions
    • Performance vs Specification
    • Sample Mounts
    • Synchrotrons for XPS
    • Transmission Function
    • Troubleshooting
    • X-ray Beam Alignment
    • X-ray Sources
  • Journals
    • Experimental Details to Publish
    • Journal Editors
    • XPS Books
    • XPS Journals
  • Makers
    • Instrument Makers
  • NIST
    • *Publishing XPS Data
    • *XPS BEs – On-line Database – NIST
    • Histogram Plots of NIST BEs
    • Review of NIST XPS BEs
    • SRD 64 Electron Elastic Scattering
    • SRD 71 Electron IMFP Database
    • SRD 82 Electron EAL Database
    • Summaries of BE Tables – NIST
    • Wagner Book of XPS BEs (NIST)
    • XPS Information from NIST
  • Posters
    • Drawings & Schematics
    • Flowcharts & Guides
    • Graphs & Charts
    • Instrument Details & Adjustments
    • Interactive Visualizations
    • Physics & Theory
    • Sample Degradation
    • Spectra Examples
    • Tables & Guides
    • Wall Charts & Wall Posters
  • σ, SF, ASF, & RSF
    • *Quantification – Atom%s
    • *Table of Scofield σ, (RSFs)
    • Beisinger SFs – Wagner e-ASFs variation
    • Crist Inflection-Point SFs – Scofield variation
    • Kratos SFs – 1990 – Scofield
    • Plots Comparing SFs
    • Plots of Ulvac PHI e-ASFs
    • Scofield SFs – Al X-rays – Theoretical
    • Scofield SFs – Al X-rays – Crist Modified
    • Scofield SFs – Al X-rays – Thermo Modified
    • Thermo SFs – Scofield RSFs
    • Test of Scofield SFs
    • Ulvac-PHI e-ASFs – March 2002 – Wagner
    • Ulvac-PHI e-ASFs – Wagner variation
    • Wagner’s Original e-ASFs
    • Wagner e-ASFs – Al X-rays – MultiPak
    • Wagner e-ASFs – Al X-rays – PHI – Omni-5
    • Wagner e-ASFs – F (1s)=1.0 vs C (1s)=1.0
  • Spectra-Bases #1
    • XPS (.SDP format) 7304 data-sets pwp
    • XPS (.VMS, .ISO, .TXT) 3177 data-sets pwp
    • XPS (.VGD) 7113 data-sets pwp
    • AES (.SDP, .NPL, .VMS) 2281 data-sets pwp
  • Spectra-Bases #2
    • Binary Oxides, 46 MB (*.sdp)
    • Carbon KLL Auger, 2 MB (*.sdp)
    • Chemical State Groups, 1 GB (*.vgd)
    • Flood Gun ON – Native Oxides, 1 MB (plots)
    • Handbook Series, 34 MB (*.iso, *.vms)
    • HER Auger Spectra, 12 MB (*.sdp)
    • Industrial Goods, 67 MB (*.vgd)
    • Miscellaneous, 60 MB (*.txt)
    • Native Oxides, 16 MB, FG OFF (*.vgd)
    • Native Oxides FG ON-OFF, 5 MB (*.sdp)
    • NECSA-Bio Polymers, 2 MB (*.mrs)
    • Original S-Probe, 90 MB (*.mrs)
    • PHI Handbook Spectra, 6 MB (*.spe)
    • Polymers, 46 MB (*.sdp)
    • Rare Earth Materials, 36 MB (*.vgd)
    • S-Probe, 200 MB (*.mrs, ASCII)
    • Single Crystals, 240 MB (*.vgd)
    • TXL IP-eSF, 340 MB (*.vgd)
    • UHV Gas Capture, 1 MB (3D plots)
    • Valence Band, 3 MB (*.txt, *.sdp)
    • VG Eclipse Database, 9 MB (*.dts)
    • X-ray Degradation of Polymers, 1 MB (*.sdp)
    • XPS Simplified, 14 MB (*.vgd)
  • Spectra Handbooks
    • Crist – Vol 1 – The Elements & Native Oxides
    • Crist – Vol 2 – Commercially Pure Metal Oxides
    • Crist – Vol 3 – Semiconductors
    • Crist – Vol 4 – Polymers
    • Crist – Vol 5 – RE Oxides, Carbonates, Hydroxides, Sulfides, Nitrides…
    • JEOL – Handbook of Spectra – Elements
    • Kratos – Polymers – PDF
    • PHI – Handbook of Spectra – Elements
    • Photos of XPS Handbooks
    • SurfaceSpectra – Polymers PDF
    • Wiley – Vol 1-3 -of Monochromatic XPS Spectra
  • Sponsors
    • Advertise
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  • Standards
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    • Publishing XPS Data
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  • Surface Chemistry
    • Adventitious Carbon
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    • Capture of UHV Gases
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    • Catalyst Surface
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  • Training
    • AVS Training Courses
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  • TXL Members
    • *Contact TXL
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    • Contributing Editors
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    • Expert Members
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  • Useful Links
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    • Database Websites – XPS
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    • Links to >700 pages at TXL
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  • XPS Service by TXL
  • About TXL
    • © 2019-2023, Copyrights
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  • Home Page (Front)
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  • XPS SPECTRA
    • *Free Library Membership
    • *Translate Website to My Language
    • Accuracy Limits – LiF as example
    • Anatomy / Features of Chemical State Spectra
    • Anatomy / Features of Survey Spectra
    • Chemical State Peak-fits – Examples
    • Chemical State Spectra – Overlays
    • Flood Gun Effect on Native Oxides
    • Free XPS Spectra – ISO 14976
    • FWHM for Peak-fitting Chemical Compounds
    • Gas Phase XPS
    • Ion Etched Elements – Capture UHV Gases
    • Literature Spectra (Reference Spectra)
    • Multiplet Splitting – Cr, Mn, Fe, Co, Ni, Cu
    • Native Oxides – Examples
    • Native Oxide Spectra – BEs of C (1s) ?
    • Polymer Spectra
    • Pure Element Spectra – Principal Signals
    • Pure Element Spectra – Survey Scans
    • Pure Element Spectra – Survey Scans + Labels
    • Rare Earth Metals – Principle Signals
    • Sources of Spectra and Data-File Formats
      • Thermo K-Alpha XPS
    • Survey Spectra – Examples
    • Valence Band Spectra – Elements
      • Valence Band – Examples
    • XPS Service by TXL
    • Auger Spectra – Examples
  • Background
    • Atom% & Shake-up
    • Background Endpoints
    • Background – Active Fitting
    • Background Subtraction-Removal
    • Background Width
    • Comparison of Background Types
    • Endpoint Averaging
    • Extrinsic Background
    • High BE Endpoint
    • Insulator Band Gap
    • Intrinsic Signal
    • Linear Background
    • Sherwood & Proctor Background
    • Shirley Background
    • Tougaard Background
    • Vegh Castle Salvi Background
  • BE Calibration
    • *** BE CALIBRATION – RULES
    • BE Calibration Values
    • BE Calibration – History
    • BE Reliability Problem
    • Calibration Checks – Validation
    • Calibration Metals
    • Deposited Gold
    • Fermi Edge
    • International BE Calibration – IXIR
    • Ion Etching – Ag, Au, Cu
    • ISO BE Standards
    • Publishing XPS Data
    • SCE Values
    • X-ray Energies
  • BE Tables
    • BE Table – Atomic # Order
    • Chemical State Identification – AgCl -ZrO2
    • Crist Table of BEs & FWHMs
    • Histogram Plots of NIST BEs
    • Periodic Table of Principal BEs
    • Summaries of NIST BEs
  • Charging
    • Adventitious Carbon
    • Charge Compensation
      • Charge Compensation – M. Biesinger
    • Charge Control
    • Charge-Control Mesh-Screen
    • Charge Referencing
      • Charge Correction – M. Beisinger
    • Charge Referencing Problems
    • Deposited Gold
    • Differential Charging
    • Flood Gun Optimization & Alignment
    • Peak-Shapes (charging)
  • Chemical States
    • Adventitious Carbon
    • Assigning Chemical States
    • BE Lookup Table
    • Charge Referencing
    • Chemical Shifts
    • Chemical State Definition
    • Chemical State Identification Tables – Ag to Zr
    • Chemical State Spectra
    • Crist Table of BEs & FWHMs
    • Deposited Gold
    • Energy Resolution – 2
    • From Auger Signals
    • From Survey Spectra
    • Hydrocarbon Carbon (not calibration)
    • Multiplet Splitting and BE Shifts
    • Multiplet Splitting
    • Overlaid Spectra – Examples
    • Overlapping Peaks
    • Pass Energies: 5-300 eV
    • Spin-Orbit Coupling
  • Data
    • Bad Data
    • Bad Peak-fit Example
    • Bad Survey Spectra
    • Cheat-Sheet
    • Data Collection Settings
    • Data File Formats
    • Data Processing Steps
    • Data Quality
    • Extending Spectrum Range Benefits
    • Publishing XPS Data
    • Statistics
    • XPS Detection Limit
  • Data Quality
    • **BE CALIBRATION – RULES
    • **Peak-Fitting – Facts, Rules & Guides
    • Accuracy
    • Bad Peak-fits
    • BE Scale Calibration
    • Chemical State Assignments
    • Energy Resolution (PE)
    • FWHMs – Peak-widths
    • GI-GO ?
    • Peak-fitting Results
    • Precision
    • RELIABILITY
    • Reliable BEs ?
    • Reliable Peak-fits ?
    • Repeatability
    • Reproducibility
    • Responsible
    • Signal-to-Noise (S/N)
  • Features
    • Asymmetric tail
    • Auger Signals
    • Background baseline
    • Background bulge
    • Background noise
    • Background shapes for peak-fitting
    • Band Gaps from Spectra
    • Charging artifact
    • Chemical shift
    • Chemical state
    • Degradation
    • Energy loss peak
    • Fermi edge
    • Gaussian Lorentzian Peak-shapes
    • Intrinsic and Extrinsic Losses
    • Multiplet splitting
    • Noise
    • Overlapping peaks
    • Peak-shapes (G, L, V)
    • Plasmon loss peaks
    • Plasmon or Shake-up – Which?
    • Satellite Peaks?
    • Shake-up peaks
    • Spin-Orbit coupling
    • Trace level signals
    • Voigt Peak-shape
  • FWHM Info
    • Core-Hole Lifetimes
    • Energy Resolution
    • FWHM for Peak-fitting Chemical Compounds
    • FWHM for Pure Metals – Mono and Non-Mono
    • FWHM vs Pass Energy
    • FWHM = Peak-width = Core-Hole Lifetime
    • Gaussian-Lorentzian Ratios
    • Natural FWHM
    • Pass Energies: 5-300 eV
    • Peak-Shapes (G, L, V)
    • Peak-Shape Tails
    • Peak-Shape Fit Example
    • s, p, d, f Peak-widths
    • X-ray Energies
  • Peak-fit Models
    • *Peak-Fit Review Service – Free
    • Asymmetry – Al (2p) metal
    • Background Types
      • Endpoints & Averaging
      • Linear Background
      • Shirley Background
      • Tougaard Background
      • Vegh Background
    • Bad vs Good Peak-fits Explained
    • Bad Peak-fits Published in Journals– Explained
    • Bad Peak-fitting Example – Ni (2p3)
    • Complex Peak-fits Explained
    • Gaussian Lorentzian Models
    • Multiplet Splitting – 3s – orbitals
    • Multiplet Splitting – 2p – Cr, Mn, Fe, Co, Ni, Cu
    • Multiplet Splitting – Rare Earths
    • Multiplet Splitting Calculated by P. Bagus
    • Noisy Data – Coal
    • Noisy Data – Ni metal
    • Overlapping Doublets – Sulfur
    • Peak Base and Top
    • Peak-Shapes (G, L, V)
    • Peak-Shapes – Example #1
    • Peak-fitting a Single O (1s) Peak
    • Peak Area Ratios – PET C (1s)
    • Pt overlaps Al – ratios
    • Pure Single Crystal – CaCO3 (Calcite)
    • Sb overlaps O – ratios
    • Shake-up – Metals
    • Shake-up – Organics
    • Smoothing – Bad vs OK
    • Super Coster-Kronig Effect
    • Synthetic Peaks
    • Too Many Peaks – O (1s) – native SiOx
    • Vibrational Bands – PE & PP
    • Which Peak-fit is Bad or Good ??
  • Peak-fitting
    • **Peak-fitting – Facts, Rules & Guides
    • **Peak-fitting a Single O (1s) Peak – Easy!
    • **Peak-fitting MOVIES
    • **Plot Examples
    • Abbe Criterion
    • Advanced Peak-fitting Examples
    • Background Endpoints
    • Background Shapes for Peak-fitting
    • Bad Peak-fits Explained
    • BEs & FWHMs – Tables
    • Bubble Chart for Peak-fitting
    • Chemical State Spectra Peak-fits – Examples
    • Chi-Squared
    • Constrained Peak-fit
    • Curve-fitting = Peak-fitting
    • Energy Resolution – 2
    • FWHM Peak-width vs Pass Energy
    • Gaussian-Lorentzian Ratios
    • Multiplet Splitting
    • Overlapping Peaks
    • Pass Energies: 5-300 eV
    • Peak Area vs Background Endpoints
    • Peak-fit Quality
    • Peak-fitting Flow-Chart
    • Peak-fitting Guides
    • Peak-fitting Process – Examples
    • Peak-fitting Variables
    • Peak-Shapes (G, L, V)
    • Shirley Background
    • Simple Peak-fit Examples
    • Tougaard Backgound
  • Quantification %s
    • *Accuracy Limits – LiF as example
    • *Quantification – Atom%s
    • Atom% gives Empirical Formula
    • Background
    • Calculated IMFPs, Scattering & Photoemission
    • EAL – Effective Attenuation Length
    • IMFP – Metal vs Metal Oxide
    • Integration Endpoints
    • Linear Background
    • Shirley Background
    • Tougaard Background
    • XPS Detection Limits
  • Sample
    • Beam Alignment
    • Chemical Suppliers
    • Contamination
    • In-Situ Treatments
    • Ion Beam Etching
    • Ion Etching Variables
    • Ion Etch Rate Films
    • Photos of Samples
    • Reference Materials
    • Sample “specimen” Handling
    • Sample History
    • Sample Preparation Bench
    • Sample Preparation Methods
    • Sample Preparation Equipment
    • Sample Size, Shape & Form
    • Sample Storage
    • Suppliers – Single Xtals, Nano, 2D, Perovskites, Graphene
      • 2D Materials Suppliers
      • Graphene Materials
      • NanoParticle Suppliers
      • Perovskite Suppliers
      • Single Crystal Suppliers
    • X-ray Beam Size
  • Software
    • *Spectra Data Processor – 1 yr free license
      • SDP v7 – Training Videos
    • AAnalyzer
    • Avantage
    • CasaXPS
    • ComPro
    • ESCApe
    • Multi-Pak
    • MultiQuant
    • Quases
    • Sessa
    • TPP-2M IMFP Calculator
    • Unifit
    • Free Software
  • XPS Labs
    • *XPS Labs around the World
    • Contract Labs having XPS
    • Industrial Labs having XPS
    • National Labs having XPS
    • Synchrotron Labs having XPS
    • University Labs having XPS
  • XPS Basics
    • Advantages of XPS
    • Basic Principles – PHI Handbook
    • Common Difficulties
    • Data Collection Settings
    • Data Processing Steps
    • Limits & Weaknesses
    • Physics of XPS
    • Wikipedia – XPS
    • XPS Detection Limits
  • Advanced XPS
    • Charge Referencing
    • AR-XPS
    • Auger Parameter
    • Bagus Papers
      • Advanced Interpretation of XPS
    • Band Gaps
    • Capture of UHV Gases
    • Circular Dichroism in XPS
    • Depth Profiling
    • Electron Configuration – Orbitals
    • Electronic State Info
    • Environmental XPS
    • Experimental Details
    • Excited States
    • Final & Initial States
    • HAXPES
    • IMFP & AL
    • Imaging – Mapping
    • Initial & Final States
    • Ion Etch Rate Films
    • Ion Etch Rate Tables
    • Laser-XPS
    • One Electron Approximation
    • Photoelectron BE Diagrams
    • Photoemission Process
    • Quantification – Atom%s
    • Quantum Mechanics of XPS
    • Scattering Effects
    • Spin-Orbit Coupling
    • Tesla Coil Irradiation Effects
    • Thickness Estimates
    • TPP-2M and IMFPs
    • Transmission Function
    • Work Functions of Elements
    • XPS Theory
    • X-ray Data Booklet – LBL – PDF
  • Application Notes
    • Common Applications
    • EAG Application Notes
    • Kratos Application Notes
    • Surface Science Western
    • Thermo Application Notes
    • Ulvac-PHI Application Notes
    • XPS International Application Notes
  • Degradation
    • Degradation of Polymers
    • Degradation due to Flood Gun Electrons
    • Degradation due to Ar+ Ion Etching
    • Degradation due to X-ray Flux
  • Experts
    • Consultants
    • Legal Witness
  • Information Depth
    • XPS vs Auger Information Depth
    • XPS vs SEM-EDS Information Depth
    • XPS vs ToF-SIMS Information Depth
  • Instrument
    • Inside View – Analysis Chamber
    • Instrument Buying Guide
    • Instrument Components & Accessories
    • Instrument Design
    • Instrument Geometries
    • Instrument Makers
    • Instrument Service
    • Operating Conditions
    • Performance vs Specification
    • Sample Mounts
    • Synchrotrons for XPS
    • Transmission Function
    • Troubleshooting
    • X-ray Beam Alignment
    • X-ray Sources
  • Journals
    • Experimental Details to Publish
    • Journal Editors
    • XPS Books
    • XPS Journals
  • Makers
    • Instrument Makers
  • NIST
    • *Publishing XPS Data
    • *XPS BEs – On-line Database – NIST
    • Histogram Plots of NIST BEs
    • Review of NIST XPS BEs
    • SRD 64 Electron Elastic Scattering
    • SRD 71 Electron IMFP Database
    • SRD 82 Electron EAL Database
    • Summaries of BE Tables – NIST
    • Wagner Book of XPS BEs (NIST)
    • XPS Information from NIST
  • Posters
    • Drawings & Schematics
    • Flowcharts & Guides
    • Graphs & Charts
    • Instrument Details & Adjustments
    • Interactive Visualizations
    • Physics & Theory
    • Sample Degradation
    • Spectra Examples
    • Tables & Guides
    • Wall Charts & Wall Posters
  • σ, SF, ASF, & RSF
    • *Quantification – Atom%s
    • *Table of Scofield σ, (RSFs)
    • Beisinger SFs – Wagner e-ASFs variation
    • Crist Inflection-Point SFs – Scofield variation
    • Kratos SFs – 1990 – Scofield
    • Plots Comparing SFs
    • Plots of Ulvac PHI e-ASFs
    • Scofield SFs – Al X-rays – Theoretical
    • Scofield SFs – Al X-rays – Crist Modified
    • Scofield SFs – Al X-rays – Thermo Modified
    • Thermo SFs – Scofield RSFs
    • Test of Scofield SFs
    • Ulvac-PHI e-ASFs – March 2002 – Wagner
    • Ulvac-PHI e-ASFs – Wagner variation
    • Wagner’s Original e-ASFs
    • Wagner e-ASFs – Al X-rays – MultiPak
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  • *** International BE Calibration – Status Reports
  • *** TEMPLATE – 3 column tables
  • ***BE CALIBRATION – RULES
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  • **Membership
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  • *Accuracy Limits – LiF as example
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  • Adventitious Carbon
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  • AES (.SDP, .NPL, .VMS) 2281 data-sets
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  • Ag – Basic Spectra
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  • Alberto Herrera Gomez
  • Alloy & Stainless Steel Samples Kit
  • amCharts v4 test
  • Anatomy / Features of Chemical State Spectra
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  • Anti-Static, Anti-Caking
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  • Ar – Basic Spectra
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  • As – Basic Spectra
  • Assigning Chemical States
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  • Asymmetric tail
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  • Atom% & Shake-up
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  • Au – Basic Spectra
  • Auger (AES) Information Depth
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  • Background
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  • Chemical State Identification – BE Lookup Table – Ag to Zr
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  • FWHM = Peak-width
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  • FWHM for Peak-fitting Chemical Compounds
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  • FWHM Information
  • FWHM Peak-width vs Pass Energy
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  • Ga – Basic Spectra
  • Gas Capture of UHV Gases
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  • H – Basic Spectra
  • Handbook Series, 34 MB (*.ISO, *.VMS)
  • Handbooks – XPS Spectra
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  • He – Basic Spectra
  • Heat Treatments
  • HER Auger Spectra, 12 MB (*.sdp)
  • Hf – Basic Spectra
  • Hg – Basic Spectra
  • Hidden
  • High BE Endpoint
  • Histogram Plots of NIST BEs
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  • History of XPS
  • Ho – Basic Spectra
  • Home Page (Front)
  • Hydrocarbon Carbon (not for calibration)
  • Hydroxides
  • Hydroxides from Oxides
  • HyperPhysics
  • I – Basic Spectra
  • Imaging – Mapping
  • IMFP & AL
  • IMFP – Metal vs Metal Oxide
  • In – Basic Spectra
  • In-Situ Treatments
  • Index / Site-map
  • Industrial Goods, 67 MB (*.vgd)
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  • Intrinsic and Extrinsic Losses
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  • Ion Beam Etching
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  • Ion Etched Elements – Capture UHV Gases
  • Ion Etching
  • Ion Etching – Ag, Au, Cu
  • Ion Etching Variables
  • Ir – Basic Spectra
  • ISO 18115-1:2013 XPS Terms
  • ISO BE Standards
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  • IXIR
  • IXIR Database ON-LINE
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  • JEOL – XPS Handbook
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  • K – Basic Spectra
  • Kateryna Artyushova
  • Knowledge Base
  • Kr – Basic Spectra
  • Kratos – XPS Handbook
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  • Kratos SFs – Scofield SFs until 1995
  • KSA Standards
  • La – Basic Spectra
  • Landing Page
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  • Li – Basic Spectra
  • Li, Na, K, Rb, Cs
  • Licensing by Membership
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  • Linear Background
  • Linked-In people who want On-Line Self-training
  • Links
  • Links to >700 pages at TXL
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  • Literature Spectra (used as Reference Spectra)
  • Log-In Here
  • Logo’s
  • Lorentzian % – Excessive
  • Lorentzian % – Excessive
  • Lu – Basic Spectra
  • Lubricants
  • Makers
  • Mark C. Biesinger
  • Materials Analysis Methods – List
  • Matthew Linford
  • Member Benefits
  • Metal Oxides – Binary
  • Mg – Basic Spectra
  • Miscellaneous, 60 MB (*.txt)
  • Mn – Basic Spectra
  • Mo – Basic Spectra
  • Molybdates
  • Multi-Pak
  • Multiplet Splitting
  • Multiplet Splitting
  • Multiplet Splitting
  • Multiplet Splitting – 2p – Cr, Mn, Fe, Co, Ni, Cu
  • Multiplet Splitting – 3s – Orbitals
  • Multiplet Splitting – Cr, Mn, Fe, Co, Ni, Cu
  • Multiplet Splitting – La, Ce, Pr, Nd, Sm, Eu, Gd, Tb
  • Multiplet Splitting and BE Shifts
  • Multiplet Splitting Calculated by P. Bagus
  • MultiQuant – XPS
  • My account
  • My Personal Account
  • N – Basic Spectra
  • Na – Basic Spectra
  • NanoParticle Suppliers
  • National Labs and Research Institutes
  • Native Oxide Spectra – BE of C (1s) ?
  • Native Oxides
  • Native Oxides – Examples
  • Native Oxides FG ON-OFF, 5 MB (*.sdp)
  • Native Oxides, 16 MB, FG OFF (*.vgd)
  • Natural FWHM
  • Natural Oxidation
  • Nb – Basic Spectra
  • Nd – Basic Spectra
  • Ne – Basic Spectra
  • Neal Fairley (UK)
  • Necsa-Bio Polymers, 2 MB (*.mrs)
  • Negligence
  • News
  • Ni – Basic Spectra
  • Niobates
  • NIST BEs
  • Nitrides
  • Noise
  • Noisy Data – Coal
  • Noisy Data – Ni metal
  • O – Basic Spectra
  • Old Links
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  • One Electron Approximation
  • Operating Conditions
  • Original S-Probe, 90 MB (*.mrs)
  • Os – Basic Spectra
  • Our Sponsors
  • Overlaid Chemical State Spectra – Examples
  • Overlapping Doublets – Sulfur
  • Overlapping Peaks
  • Overlapping Peaks
  • Overlapping Peaks
  • Oxidation Treatments
  • P – Basic Spectra
  • Partnerships & Sponsorships
  • Pass Energies: 5-300 eV
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  • Pb – Basic Spectra
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  • PDMS – Silicone Oil
  • Peak Area Ratios – PET
  • Peak Area vs Background Endpoints
  • Peak Base and Top
  • Peak-fit Examples
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  • Peak-fits of Principal Signals – Elements
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  • Peak-fitting = Curve-fitting
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  • Peak-fitting Flow-Chart
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  • Peak-fitting Results
  • Peak-fitting Variables
  • Peak-shape – Example #1
  • Peak-shape – Example #1
  • Peak-Shapes (charging)
  • Peak-Shapes (charging)
  • Peak-Shapes (G, L, V)
  • Peak-Shapes (G, L, V)
  • Peak-Shapes (G, L, V)
  • Peak-Shapes (G, L, V)
  • Performance vs Specification
  • Periodic Table of BEs
  • Periodic Tables
  • Perovskite Suppliers
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  • PHI – XPS Handbook of Spectra – The Elements
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  • PHI Handbook Pages
  • PHI Handbook Spectra, 6 MB (*.spe)
  • Phosphates
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  • Photos of Samples
  • Physics & Theory
  • Physics of XPS
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  • Plasma Treatments
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  • Pr – Basic Spectra
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  • Pt – Basic Spectra
  • Pt overlaps Al – ratios
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  • Publishing XPS Experimental Details – Journals
  • Purchase Professional Membership (US$)
  • Pure Element – Survey Spectra + L
  • Pure Element Spectra – Main Signals
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  • Pure Single Crystal – CaCO3 (Calcite)
  • Quantification – Atom%s
  • Quantification – Atom%s
  • Quantification – Atom%s
  • Quantification – Atom%s
  • Quantum Mechanics of XPS
  • Quases
  • Rare Earth Materials…, 36 MB (*.vgd)
  • Rare Earth Metals – Principle
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  • Rb – Basic Spectra
  • Re – Basic Spectra
  • Reference Materials
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