Samples, Specimen
| Samples, Specimen |
Photos of Samples Inside Analysis Chamber of XPS
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| Menu Links | Green Ellipse is the Position and size of X-ray Beam used for the XPS analysis | |
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 Photos of Samples Inside Analysis Chamber of XPS Instrument
Captured by Video Camera
Green Ellipse is the Position and size of X-ray Beam used for the XPS analysis
Sample (Specimen) History
Pre-Analysis Discussion
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Sample Storage Equipment
Sample Preparation Variables
- Angle lapping
- Ball cratering
- Blisters – break open with tweezers
- Carbon is often deposited by SEM
- Chemical derivatization
- Chemical etch
- Clean sample mount
- Clean with gas jet
- Clean with solvents
- Cleanliness
- Contamination
- Damage can be caused by SEM
- Doping: n-, p- vs none
- Floating or grounded
- Fracture (in air, in LN2, under solvent)
- Glove bag (argon fill)
- Heating
- Horizontal traps
- In air – oxidation
- In nitrogen – drying
- In vacuum – drying – cooling
- Indium foil – press onto
- LN2 fracturing in air
- Magnetic sample
- Need to cut to fit on sample mounts
- Never store in Plastic bags – contaminated inside
- Never touch Surface Contact
- Oil analysis
- Outgassing materials
- Plasma clean
- Powder tray
- Pressed pellet
- Sample conductivity
- Sample damage
- Sample degradation
- Sample fracturing
- Sample history
- Sample mounting
- Sample porosity
- Sample preparation
- Sample roughness
- Sample scraping
- Sample shape
- Sample treatments
- Sample storage
- Scrape (in air, under hexane or other solvent)
- Scribe Analysis Area for transparent sample
- Selective rinsing with solvents
- Sequence of analysis
- Super gentle ion etching
- Surface derivatization
- Surface roughness
- Tools for preparation
- Use Double-sided tape to hold sample