Auger Spectra from XPS – Examples

Auger Spectra from Ti, Ni, V, Cu, Zn and Cr after cleaning by Ar+ ion etching . Carbon Auger spectra at left reveal that Auger is sensitive to structure differences.






Carbon (KLL) Auger Signals produced by XPS show the Potential to use Carbon (KLL) to Charge Reference Chemical State Auger Spectra (from high energy resolution mode)