XPS Papers – NIST

The NIST xps Database gives access to energies of many photoelectron and Auger-electron spectral lines. The database contains over 29,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-el…

Quantitative surface analysis of Fe-Ni alloy thin films has been proposed as a new subject for a pilot study by the surface analysis working group of the Consul

Standard test data for x-ray photoelectron spectroscopy (xps-STD) have been developed for determining bias and random error in peak parameters derived from curv

Substantial ongoing research efforts are investigating the production of novel composite material enhanced by the incorporation of nanomaterial fillers such as

Over the past decade, energy-dependent X-ray photoelectron spectroscopy (xps) has emerged as a powerful analytical probe of the ion spatial distributions at the

The interaction potential for elastic scattering of electrons by atoms influences the magnitudes of calculated elastic-scattering cross sections.

X-ray photoelectron spectroscopy (xps) is one of the most sensitive and informative surface analysis techniques available.

We give an overview of two issues that are important in quantitative X-ray photoelectron spectroscopy (xps) and Auger-electron spectroscopy (AES).

The effective attenuation length (EAL) is normally used in place of the inelastic mean free path (IMFP) to account for elastic-scattering effects when describin

We describe the complementary use of x-ray photoelectron spectroscopy (xps) and fourier transform infrared (FTIR) spectroscopy to quantitatively characterize th

The terms inelastic mean free path (IMFP), effective attenuation length (EAL), and mean escape depth (MED) are frequently used to specify the surface sensitivit

A description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for x-ray photoelectron spectroscopy

A commercial silicon powder was studied by x-ray photoelectron spectroscopy (xps) and x-ray induced Auger electron spectroscopy (XAES).

Surface analyses are now made by techniques such as Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (xps), and appearance potential spectros

Cerium oxide nanomaterials (nanoceria, CNMs) are receiving increased attention from the research community due to their unique chemical properties, most promine

Self-assembled monolayers (SAMs) of perfluoroalkylthiols [CF3(CF2)xCH2CH2SH (x=3, 5, 7, and 9)] on gold w

X-Ray Photoelectron Spectroscopy (xps) is being used to an increasing extent for the characterization of new gate-oxide materials, particularly for the determin

Quantification of surface and bulk analytical methods, e.g., Auger-electron spectroscopy (AES), X-ray photoelectron spectroscopy (xps), electron-probe microanal

We describe two NIST databases that can be used to characterize thin films from Auger-electron spectroscopy (AES) and X-ray photoelectron spectroscopy (xps) mea

It is now customary for the effects of elastic-electron scattering to be ignored in measurements of the thicknesses of overlayer films by X-ray photoelectron sp

We present results in the final part of a three-part of a three-part study employing standard test data (STD) to estimate errors in peak parameters derived from

FOREWORD This NIST Special Publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NN

We evaluated two methods for determining shell thicknesses of core-shell nanoparticles (NPs) by X-ray photoelectron spectroscopy (xps).

The information depth (ID) is a measure of the sampling depth for the detected signal in Auger-electron spectroscopy (AES) and x-ray photoelectron spectroscopy

. Kraut-Vass, S. W. Gaarenstroom, and C. J. Powell, NIST X-ray Photoelectron Spectroscopy Database, NIST SRD 20, Version 4.1, National Institute of Standards and Technology, Gaithersburg, MD, 2012; available at http://srdata.nist.gov/xps. This publication is available free of charge from http://dx.doi.org/10.6028/NIST.NSRDS.164 12 APPENDIX A UNCERTAINTIES OF CROSS SECTIONS FROM THE DATABASE Llovet et al. [4] evaluated calculated and measured cr…

We report electron effective attenuation lengths (EALs) for SiO2 films on Si that were obtained from Monte Carlo simulations of substrate Si 2p3/2 photoelectron

Grazing Incidence X-ray Photoelectron Spectroscopy (GIxps) is a method that offers promise as a non-destructive technique to measure the thickness and chemistry

The electron effective attenuation length (EAL) can be defined for the measurement of overlayer film thicknesses (the most common application) and for the measu

Self-assembled films of thiolated poly(dT)25 single-stranded DNA (ssDNA) on gold areintroduced as a model system for quantitative characterization of DNA films

We investigate the systematic error due to neglet of elastic scattering of photoelectrons in measurements of the thicknesses of thin films of SiO2 on

It is now customary for the effects of elastic-electron scattering to be ignored in measurements of the thicknesses of overlayer films by X-ray photoelectron sp

The objective of the NIST database for Simulation of Electron Spectra for Surface Analysis (SESSA) is to facilitate quantitative interpretation of Auger-electro

The NIST Electron Effective-Attenuation-Length Database provides values of electron effective attenuation lengths (EALs) in solid elements and compounds at sele

The x-ray standing wave technique is an experimental method that can accurately determine the precise crystallographic positions of atoms within a crystalline u

Surface-grafted styrene-based homopolymer and diblock copolymer brushes bearing semifluorinated alkyl groups were synthesized by nitroxide-mediated controlled r

We report on a comparative measurement of SiO2/Si dielectric film thickness (t < 10 nm) using grazing incidence x-ray photoelectron spectroscopy,

We report photoelectron intensities of N 1s and O 1s peaks at selected emission angles for an SiON film on Si with different assumed amounts and distributions o

Standard test data(STD) are simulations of analytical instrument responses that help determine the veracity of computer-based, data analysis procedures that are

Ambient pressure X-ray photoelectron spectroscopy (APxps) has become an effective tool to interrogate chemical states at surfaces relevant to real operational c

We discuss analyses of trace levels of surface contamination using X-ray photoelectron spectroscopy (XPS).

A survey is given of the available cross-section data for ionization of inner-shell electrons by incident electrons in the range of interest for electron-probe

Early attempts to observe electron polarization in the scattering of low-energy electrons from solids are reviewed.

We show that the spin polarization of the secondary electrons, P(E), yields useful information about the electron-electron interaction.

The electron-sodium system is an excellent prototype of non-relativistic electron scattering from a quasi-one-electron atomic target, and is tractable both expe

The electron-sodium system is an excellent prototype of non-relativistic electron scattering from a quasi-one-electron atomic target, and is tractable both expe