. Kraut-Vass, S. W. Gaarenstroom, and C. J. Powell, NIST X-ray Photoelectron Spectroscopy Database, NIST SRD 20, Version 4.1, National Institute of Standards and Technology, Gaithersburg, MD, 2012; available at http://srdata.nist.gov/xps. This publication is available free of charge from http://dx.doi.org/10.6028/NIST.NSRDS.164 12 APPENDIX A UNCERTAINTIES OF CROSS SECTIONS FROM THE DATABASE Llovet et al. [4] evaluated calculated and measured cr…