Skip to content
BooksB Vincent Crist2019-09-05T07:19:48-07:00
Useful Books
XPS / ESCA
- Practical Surface Analysis -Auger and X-ray Photoelectron Spectroscopy
D. Briggs and M. P. Seah (Editors), Wiley Interscience, 1990 (2nd ed.)
- Photoelectron Spectroscopy (Springer Series in Solid-State Sciences Vol. 82)
S. Huefner, Springer Verlag, 1995
- Introduction to Photoelectron Spectroscopy (Chemical Analysis Vol. 67)
P. K. Ghosh, Wiley Interscience, 1983
- Modern ESCA – The Principles and Practice of X-ray Photoelectron Spectroscopy
T. L. Barr, CRC, 1994
- Photo-electron Spectra Induced by X-rays of Above 600 Non-Metallic Compounds Containing 77 Elements
C. K. Jorgensen and H. Berthou, Munksgaard Publishers, Denmark, 1972
- Handbook of X-ray Photoelectron Spectroscopy
J. Moulder, William F. Stickle, P. E. Sobol, and K.D. Bomben, (J. Chastain, editor) Perkin Elmer Corporation (Physical Electronics), 1992 (2nd edition)
- Handbook of X-ray Photoelectron Spectroscopy
C. D. Wagner, W. M. Riggs, L. E. Davis, and J. Moulder (G. E. Muilenberg, editor) Perkin Elmer Corporation (Physical Electronics), 1979 (1st edition)
- Handbook of X-ray Photoelectron Spectroscopy
N. Ikeo, Y. Iijima, N. Nimura, M. Sigematsu, T. Tazawa, S. Matsumoto, K. Kojima, and Y. Nagasawa, JEOL, 1991
- High Resolution XPS of Organic Polymers – The Scienta ESCA300 Database
G. Beamson and D. Briggs, Wiley Interscience, 1992
- Practical Handbook of Spectroscopy
J. W. Robinson, CRC, 1991
- VG Scientific XPS Handbook
E. Adem, VG Scientific, 1991 (1st edition)
- Handbook of Monochromatic XPS Spectra – Vol. 1 – The Elements and Native Oxides
B. V. Crist, XPS International, Inc., 1999
- Handbook of Monochromatic XPS Spectra – Vol. 2 – Commercially Pure Binary Oxides
B. V. Crist, XPS International, Inc., 1999
- Handbook of Monochromatic XPS Spectra – Vol. 3 – Semiconductors
B. V. Crist, XPS International, Inc., 1999
- Handbook of Monochromatic XPS Spectra – Vol. 4 – Polymers and Polymer Damage
B. V. Crist, XPS International, Inc., 1999
- Handbook of Monochromatic XPS Spectra – Vol. 5 – Miscellaneous Materials
B. V. Crist, XPS International, Inc., 1999
- On-Screen PDF Handbook of Monochromatic XPS Spectra – Vol. 1 – The Elements and Native Oxides,
B. V. Crist, XPS International, Inc., 1999
Equipment to Help Build Surface Analysis Instruments
- Experimental Innovations in Surface Science – A Guide to Practical Laboratory Methods and Instruments
J. T. Yates, Jr.. Springer Verlag, 1998
- Building Scientific Apparatus – A Practical Guide to Design and Construction
J. H. Moore, C. C. Davis, and M. A. Coplan, Addison-Wesley Publishing, 1983
- Optical Systems for Soft X-rays
A. G. Michette, Plenum Press, 1986
Introduction to Surface Science
- Encyclopedia of Materials Characterization
C. R. Brundle, C. A.Evans, and S. Wilson, Butterworth-Heinemann, 1992
- Surface Science – An Introduction
J. B. Hudson, Butterworth-Heinemann, 1992
- Characterization of Solid Surfaces
P. F. Kane and G. B. Larrabee, Plenum Press, 1978
- Surface Analytical Techniques (Monographs on the Physics and Chemistry of Materials)
J. C. Riviere, Oxford Science Publications, 1990
- Methods of Surface Analysis
J. M. Walls (editor), Cambridge University Press, 1989
- Surfaces and Interfaces of Solids (Springer Series in Surface Sciences – Vol. 15)
H. Lueth, Springer Verlag, 1993
- Journal of Electron Spectroscopy and Related Phenomena – First International Conference on Electron Spectroscopy in Namur (April 1974)
R. Caudano and J. Verbist (editors), Elsevier Scientific Publishing, 1974
- Journal of Electron Spectroscopy and Related Phenomena – Fourth International Conference on Electron Spectroscopy in Hawaii (July 1989)
C. R. Brundle, G. E. McGuire, and J. J. Pireaux (editors), Elsevier, 1990
Real World Applications of Surface Science
- Applied Electron Spectroscopy for Chemical Analysis (Chemical Analysis Vol. 63)
H. Windawi and F. F-L. Ho (Editors), Wiley Interscience, 1982
- Laser Damage in Optical Materials
R. Wood, Adam Hilger Ltd., 1986
- Surface Studies with Lasers (Springer Series in Chemical Physics – Vol.33)
F. R. Aussenegg, A. Leitner, and M. E. Lippitsch (editors), Springer Verlag, 1983
- Industrial Adhesion Problems
S. M. Brewis and D. Briggs (editors), Wiley Interscience, 1985
- Applied Surface Analysis (ASTM STP 699)
T. L. Barr and L. E. Davis (editors), ASTM, 1980
- Industrial Applications of Surface Analysis (ACS Symposium Series Vol 199)
L. A. Casper and C. J. Powell (editors), ACS, 1982
- Introduction to Photoelectron Spectroscopy (Chemical Analysis Vol. 67)
P. K. Ghosh, Wiley Interscience, 1983
Special Topics
- Thin Film Processes
J. L. Vossen and W. Kern, Academic Press, 1978
- The Physics and Chemistry of Color – The Fifteen Causes of Color
K. Nassau, Wiley Interscience, 1983
- X-rays in Atomic and Nuclear Physics
N. A. Dyson, Cambridge University Press, 1990 (2nd edition)
- X-ray Spectroscopy (Springer Series in Optical Sciences)
B. K. Agarwal, Spriner Verlag, 1991 (2nd ed.)
- Materials Handbook
G. S. Brady and H. R. Clauser, McGraw-Hill Book Co., 1979 (11th edition)
- The Elements
J. Emsley, Oxford University Press, 1991 (2nd edition)
- Polarized Electrons (Springer Series on Atoms and Plasmas)
J. Kessler, Springer Verlag, 1985 (2nd edition)
- Thin Film and Depth Profile Analysis (Topics in Current Physics Vol. 37)
H. Oechsner (editor), Springer Verlag, 1984
- Physical Analysis for Tribology
T. F. J. Quinn, Cambridge University Press, 1991
- Surface Studies with Lasers (Springer Series in Chemical Physics – Vol.33)
F. R. Aussenegg, A. Leitner, and M. E. Lippitsch (editors), Springer Verlag, 1983
- Surface Reactions (Springer Series in Surface Sciences Vol. 34)
R. J. Madix (Editor), Springer Verlag, 1994
- Adsorption on Ordered Surfaces of Ionic Solids and Thin Films
(Springer Series in Surface Sciences Vol 33)
H-J. Freund and E. Umbach (editors), Springer Verlag, 1993
- Photo-electron Spectra Induced by X-rays of Above 600 Non-Metallic Compounds Containing 77 Elements
C. K. Jorgensen and H. Berthou, Munksgaard Publishers, Denmark, 1972
- Journal of Electron Spectroscopy and Related Phenomena – First International Conference on Electron Spectroscopy in Namur (April 1974)
R. Caudano and J. Verbist (editors), Elsevier Scientific Publishing, 1974
- Journal of Electron Spectroscopy and Related Phenomena – Fourth International Conference on Electron Spectroscopy in Hawaii (July 1989)
C. R. Brundle, G. E. McGuire, and J. J. Pireaux (editors), Elsevier, 1990
Surface Physics
- Introduction to Solid State Physics
C. Kittel, Wiley & Sons, 1956 (2nd edition)
- Physics at Surfaces
A. Zangwill, Cambridge University Press, 1988
- Intermolecular & Surface Forces
J. Israelachvili, Academic Press, 1992 (2nd ed.)
- Electronic Properties of Surfaces
M. Prutton (editor), Adam Hilger Ltd., 1984
- Physical Chemistry of Surfaces
A. W. Adamson, Wiley Intersciences, 1990 (5th edition)
- Introduction to Surface Physics
M. Prutton, Oxford Science Publications, 1994
- Solids and Surfaces – A Chemist’s View of Bonding in Extended Structures
R. Hoffmann, VCH Publishers, 1988
- Breakdown of the One-Electron Pictures in Photoelectron Spectra (Structure and Bonding – Vol 45)
G. Wendin, Springer Verlag, 1981
- Basic Theory of Surface States (Monographs on the Physics and Chemistry of Materials – Vol. 46)
S. G. Davison and M. Steslicka, Oxford Science Publications, 1992
- The Chemical Physics of Surfaces
S. Roy Morrison, Plenum Press, 1990 (2nd edition)
Surface Science or Analysis of Various Materials
- Encyclopedia of Materials Characterization
C. R. Brundle, C. A.Evans, and S. Wilson, Butterworth-Heinemann, 1992
- The Microelectronics Processing – Inorganic Materials Characterization
ACS Symposium Series – Vol. 295. L. A. Caspar (editor), American Chemical Society, 1986
- The Surface Science of Metal Oxides
V. E. Henrich and P. A. Cox, Cambridge University Press, 1994
- Physics and Chemistry at Oxide Surfaces
C. Noguera, Cambridge University Press, 1996
- Surface and Near-Surface Chemistry of Oxide Materials
(Materials Science Monographs Vol. 47)
J. Nowotny and L-C. DuFour (editors), Elsevier, 1988
- Electronic Conduction in Oxides (Springer Series in Solid-State Sciences Vol. 94)
N. Tsuda, K. Nasu, A. Yanase and K. Siratori, Springer Verlag, 1991
- Semiconductor Surfaces and Interfaces (Springer Series in Surface Sciences Vol. 26)
W. Moench, Springer Verlag, 1995 (2nd ed)
- The Fundamentals of Corrosion
J. C. Scully, Pergamon Press, 1990 (3rd ed.)
- Laser Damage in Optical Materials
R. Wood, Adam Hilger Ltd., 1986
- Spectroscopy in Catalysis
J. W. Niemantsverdriet, VCH Publishers, 1995
- Introduction to Surface Chemistry and Catalysis
G. A. Somorjai, Wiley Interscience, 1994
- Surface Science of Catalysis (In-situ Probes and Reaction Kinetics)
D. J. Dwyer and D. M. Hoffman (editors), ACS Symposium Series Vol 482, ACS, 1992
- Materials Handbook
G. S. Brady and H. R. Clauser, McGraw-Hill Book Co., 1979 (11th edition)
- Industrial Adhesion Problems
S. M. Brewis and D. Briggs (editors), Wiley Interscience, 1985
- Polymer Surfaces
D. T. Clark and W. J. Feast (editors), Wiley & Sons, 1978
- Polymer Degradation – Principles and Practical Applications
W. Schnabel, Hanser International (Macmillan Publishing Co.), 1981
- Photon, Electron, and Ion Probes of Polymer Structure and Properties (ASC Series 162)
D. W. Dwight, T. J. Fabish, and H. Ronald Thomas, Amercian Chemical Society, 1981
- Physical Analysis for Tribology
T. F. J. Quinn, Cambridge University Press, 1991
Synchrotron As Excitation Source
- Introduction to Synchrotron Radiation
G. Margaritondo, Oxford University Press, 1988
- Photoelectron Spectroscopy (Springer Series in Solid-State Sciences Vol. 82)
S. Huefner, Springer Verlag, 1995
- Atomic Collisions – Electron and Photon Projectiles
E. W. McDaniel, Wiley Interscience, 1989
- Electron Spectrometry of Atoms using Synchrotron Radiation
V. Schmidt, Cambridge University Press, 1997
Teaching
- Introduction to Photoelectron Spectroscopy (Chemical Analysis Vol. 67)
P. K. Ghosh, Wiley Interscience, 1983
- X-ray Photoelectron Spectroscopy (XPS/ESCA) – AVS Training Course Book
J. T. Grant, University of Dayton, 1994
- Course on ESCA and Auger Spectroscopy – Am. Chem. Soc. Training Course Book
D. M. Hercules, American Chemical Society, ca. 1985
Training Courses
- X-ray Photoelectron Spectroscopy (XPS/ESCA) – AVS Training Course Book
J. T. Grant, University of Dayton, 1994
- Course on ESCA and Auger Spectroscopy – Am. Chem. Soc. Training Course Book
D. M. Hercules, American Chemical Society, ca. 1985
Statistical Analysis of Data
- Data Fitting in the Chemical Sciences
P. Gans, Wiley Interscience, 1992
- Data Analysis for the Chemical Sciences – A Guide to Statistical Techniques
R. C. Graham, VCH Publishers, 1993
- *** International BE Calibration – Status Reports
- *** TEMPLATE – 3 column tables
- ***BE CALIBRATION – RULES
- ***BE CALIBRATION – RULES
- **Membership
- **PEAK-FITTING – FACTS, RULES & GUIDELINES
- **PEAK-FITTING – FACTS, RULES & GUIDELINES
- **Plot Examples
- **Registration FORM
- **Registration FORM
- *Accuracy Limits – LiF as example
- *Free Library Membership
- *Suggestions
- *Table of RSFs – Normalized Scofield SFs
- – Periodic Table TEMPLATE v1
- – Periodic Table TEMPLATE v2
- 2D Materials Suppliers
- 6 Tables of Sensitivity Factors
- AAnalyzer
- Abbe Criterion
- About The XPS Library
- Accuracy
- Ads
- Advanced Interpretation of XPS
- Advanced Peak-fitting Examples
- Advanced XPS
- Advantages of XPS
- Adventitious Carbon
- Adventitious Carbon
- Adventitious Carbon
- Advertise
- Advertising Members
- AES (.SDP, .NPL, .VMS) 2281 data-sets
- AES (.SDP, .NPL, .VMS) 2281 data-sets
- AFNOR Standards
- Ag – Basic Spectra
- Al – Basic Spectra
- Alberto Herrera Gomez
- Alloy & Stainless Steel Samples Kit
- amCharts v4 test
- Anatomy / Features of Chemical State Spectra
- Anatomy / Features of Survey Spectra
- Angels who Donated
- Anti-Static, Anti-Caking
- Application Notes
- Application Notes ©
- Application Notes from Makers
- Applications
- Ar – Basic Spectra
- AR-XPS
- As – Basic Spectra
- Assigning Chemical States
- ASTM Standards
- Asymmetric tail
- Asymmetry
- Atom% & Shake-up
- Atom% gives Empirical Formula
- Au – Basic Spectra
- Auger (AES) Information Depth
- Auger Parameter
- Auger Signals
- Auger Spectra from XPS – Examples
- Avantage
- AVS Training Courses
- © 2019, Copyrights
- B – Basic Spectra
- B. Vincent Crist
- B. Vincent Crist – CEO
- Background
- Background – Active Fitting
- Background baseline
- Background bulge
- Background Endpoints
- Background Endpoints
- Background Noise
- Background Shapes for Peak-fitting
- Background Shapes for Peak-fitting
- Background Subtraction-Removal
- Background Type – Shirley or Linear
- Background Width
- Bad Data
- Bad Peak-fits
- Bad Peak-fits Explained
- Bad Peak-fits Explained
- Bad Peak-fits Published in Journals – Explained
- Bad Peak-fitting Example
- Bad Peak-fitting Example – Ni (2p3)
- Bad Peak-fitting or Good Peak-fitting
- Bad Survey Spectra
- Bagus Papers
- BAM Standards
- Band Gaps
- Band Gaps from Spectra
- Baselines for Peak-fitting (S, L, T)
- Be – Basic Spectra
- BE Calibration – History
- BE Calibration Values
- BE Lookup Table
- BE RELIABILITY – VITAL
- BE Reliability Problem
- BE Scale Calibration
- BE Table – Atomic # Order
- BE Tables
- Beam Alignment
- Benefits
- Bi – Basic Spectra
- bi-Carbonates
- Biesinger SFs
- Binary Oxides, 46 MB (*.sdp)
- Binding Energy (BE) Scale Calibration
- Blog
- Books
- Borates
- Borides
- Br – Basic Spectra
- BSI Standards
- Bubble Chart for Peak-fitting
- C – Basic Spectra
- C. Richard Brundle
- C. Richard Brundle
- Ca – Basic Spectra
- Calculated IMFP Values
- Calibration Checks – Validation
- Calibration Metals
- Capture of UHV Gases
- Carbides
- Carbon KLL Auger, 2 MB (*.sdp)
- Carbonates
- Carbonates from CO2
- Careers at TXL
- CasaXPS
- Catalyst Surface
- Catalysts
- Cd – Basic Spectra
- Ce – Basic Spectra
- Ceramics Suppliers
- Charge Compensation
- Charge Compensation – Biesinger
- Charge Control
- Charge Correction (Referencing)
- Charge Referencing
- Charge Referencing
- Charge Referencing (CS)
- Charge Referencing Problems
- Charge-Control Mesh-Screen
- Charging
- Charging artifact
- Cheat-Sheet
- Checkout
- Chemical Shift
- Chemical Shifts
- Chemical State Assignments
- Chemical State Definition
- Chemical State Groups, 1 GB (*.vgd)
- Chemical State Identification – BE Lookup Table – Ag to Zr
- Chemical State Identification – BE Lookup Table – Ag to Zr
- Chemical State Peak-fits – Examples
- Chemical State Spectra
- Chemical State Spectra – OVERLAYS
- Chemical State Spectra Peak-fits – Examples
- Chemical States
- Chemical States
- Chemical Suppliers
- Chemical Suppliers
- Chemical Treatments
- Chemical Treatments
- Chi-Squared
- Chlorides
- Circular Dichroism in XPS
- Cl – Basic Spectra
- Clean Surface
- Cleanliness of Surfaces
- Client Portal
- Co – Basic Spectra
- Collections of XPS Spectra
- Common Difficulties
- Comparison of Background Types
- Complex Peak-fits Explained
- Components
- ComPro v12 (SASJ)
- Constrained Peak-fit
- Consultants
- Contact TXL
- Contact TXL
- Contact TXL
- Contact TXL
- Contamination
- Contamination
- Contract Analysis Labs
- Contributing Editors
- Contributing Editors
- Contributors
- Core Hole Lifetimes – FWHM
- Corrosion
- Cr – Basic Spectra
- Creeping Lubricants
- Crist – Handbooks of Monochromatic XPS
- Crist – PDF Book of Commercially Pure Metal Oxides
- Crist – PDF Book of Polymers
- Crist – PDF Book of RE Oxides, Carbonates, Hydroxides, Sulfides, Nitrides…
- Crist – PDF Book of Semiconductors
- Crist – PDF Book of The Elements & Native Oxides
- Crist – Spectra Handbook – Metal Oxides
- Crist – Spectra Handbook – The Elements & Native Oxides
- Crist Empirical IP eSFs – Scofield Base
- Crist Handbook Series – Parameters
- Crist Publications for Download
- Crist Table of BEs & FWHMs
- Crist Table of BEs & FWHMs
- Crist Table of BEs & FWHMs
- Critical Review of NIST XPS BEs
- Cs – Basic Spectra
- CSA Standards
- Cu – Basic Spectra
- Curve-fitting = Peak-fitting
- Data
- Data Collection Settings
- Data Collection Settings
- Data Collection Software
- Data File Formats
- Data Processing Steps
- Data Processing Steps
- Data Quality
- Data Quality
- Degradation
- Degradation
- Degradation due to Ar+ Ion Etching
- Degradation due to Flood Gun Electrons
- Degradation due to X-ray Flux
- Degradation of Polymers
- Deposited Gold
- Deposited Gold
- Deposited Gold
- Deposition Methods
- Depth of Information
- Depth Profiling
- Differential Charging
- DIN Standards
- DIN Standards
- Documentary Standards and Guidelines
- Don Baer (USA)
- Downloads
- Drawings and Schematics
- Due to Bremsstrahlung
- Due to High Vacuum
- Due to Non-Mono Heat
- Dy – Basic Spectra
- EAG-EuroFin Application Notes
- EAL, Effective Attenuation Length
- Electron Configuration – Atomic Orbitals
- Electronic State Info
- Element Cyclopedia TEMPLATE
- Element X-pedia TEMPLATE
- Element XP-Cyclopedia
- Endpoint Averaging
- Energy loss peak
- Energy Resolution
- Energy Resolution (PE)
- Environmental XPS
- Er – Basic Spectra
- ESCApe
- Eu – Basic Spectra
- EULA
- Examples of Bad Peak-fitting
- Excited States
- Expert Members
- Experts
- Extending Spectrum Range Benefits
- Extrinsic Background
- F – Basic Spectra
- Fe – Basic Spectra
- Features
- Features in Chemical State Spectra
- Features in Survey Spectra
- Fermi Edge
- Fermi Edge (features)
- FG Effect on Native Oxides
- Final & Initial States
- Final State Effects
- flat-database-2
- Flood Gun Effect on Native Oxides
- Flood Gun on Native Oxides, 1 MB (plots)
- Flood Gun Optimization & Alignment
- Flowcharts & Guides
- Fluorides
- Free Membership
- Free Software
- Free XPS Spectra – Free XPS Software
- Free XPS Spectra – ISO 14976
- Frequently Asked Questions
- From Auger Signals
- From Survey Spectra
- Future for XPS Instrument Sales
- Future for XPS Instrument Sales
- Future for XPS Instrument Sales
- FWHM = Peak-width
- FWHM = Peak-width
- FWHM for Peak-fitting Chemical Compounds
- FWHM for Pure Metals – Mono and Non-Mono
- FWHM Information
- FWHM Peak-width vs Pass Energy
- FWHM Peak-width vs Pass Energy (ER)
- Ga – Basic Spectra
- Gas Capture of UHV Gases
- Gas Phase XPS
- Gas Treatments
- Gaussian Lorentzian Model
- Gaussian Lorentzian Models
- Gaussian-Lorentzian Ratios
- Gaussian-Lorentzian Ratios
- Gd – Basic Spectra
- Ge – Basic Spectra
- GI-GO ?
- GOST-R & RuStandards
- Graphene Materials
- Graphs and Charts
- Groups as Members
- gtest
- H – Basic Spectra
- Handbook Series, 34 MB (*.ISO, *.VMS)
- Handbooks – XPS Spectra
- Handbooks of XPS Spectra
- HAXPES
- He – Basic Spectra
- Heat Treatments
- HER Auger Spectra, 12 MB (*.sdp)
- Hf – Basic Spectra
- Hg – Basic Spectra
- Hidden
- High BE Endpoint
- Histogram Plots of NIST BEs
- Histogram Plots of NIST BEs
- History of XPS
- Ho – Basic Spectra
- Home
- Hydrocarbon Carbon (not for calibration)
- Hydroxides
- Hydroxides from Oxides
- HyperPhysics
- I – Basic Spectra
- Imaging – Mapping
- IMFP & AL
- IMFP – Metal vs Metal Oxide
- In – Basic Spectra
- In-Situ Treatments
- Index / Site-map
- Industrial Goods, 67 MB (*.vgd)
- Industrial Labs
- Initial & Final States
- Inside View – Analysis Chamber
- Instrument Buying Guide
- Instrument Component Suppliers
- Instrument Components
- Instrument Design
- Instrument Details & Adjustments
- Instrument Geometries
- Instrument Makers
- Instrument Makers
- Instrument Operation
- Instrument Service
- Instrument Training by Maker
- Instruments
- Insulator Band Gap
- Integration Endpoints
- Interactive Visualizations
- International Conferences – XPS
- International XPS Instrument Registry (IXIR)
- Intrinsic and Extrinsic Losses
- Intrinsic Signal
- Ion Beam Etching
- Ion Etch Rate Films
- Ion Etch Rate Tables
- Ion Etched Elements – Capture UHV Gases
- Ion Etching
- Ion Etching – Ag, Au, Cu
- Ion Etching Variables
- Ir – Basic Spectra
- ISO 18115-1:2013 XPS Terms
- ISO BE Standards
- ISO Standards
- IXIR
- IXIR Database ON-LINE
- σ, SF, ASF, RSF, and e-RSF
- JEOL – XPS Handbook
- JIS Standards
- Job Openings for XPS
- Job Openings for XPS
- John Moulder (USA)
- John T. Grant
- Journal Editors
- Journals & Publishers
- K – Basic Spectra
- Kateryna Artyushova
- Knowledge Base
- Kr – Basic Spectra
- Kratos – XPS Handbook
- Kratos Application Notes, etc.
- Kratos SFs – Scofield SFs until 1995
- KSA Standards
- La – Basic Spectra
- Landing Page
- Laser-XPS
- Legal Witness
- Li – Basic Spectra
- Li, Na, K, Rb, Cs
- Licensing by Membership
- Lifetime of Clean Surfaces
- Limits & Weaknesses
- Linear Background
- Linear Background
- Linked-In people who want On-Line Self-training
- Links
- Links to >700 pages at TXL
- List of Members
- Literature Spectra (used as Reference Spectra)
- Log-In Here
- Logo’s
- Lorentzian % – Excessive
- Lorentzian % – Excessive
- Lu – Basic Spectra
- Lubricants
- Makers
- Mark C. Biesinger
- Materials Analysis Methods – List
- Matthew Linford
- Member Benefits
- Metal Oxides – Binary
- Mg – Basic Spectra
- Miscellaneous, 60 MB (*.txt)
- Mn – Basic Spectra
- Mo – Basic Spectra
- Molybdates
- Multi-Pak
- Multiplet Splitting
- Multiplet Splitting
- Multiplet Splitting
- Multiplet Splitting – 2p – Cr, Mn, Fe, Co, Ni, Cu
- Multiplet Splitting – 3s – Orbitals
- Multiplet Splitting – Cr, Mn, Fe, Co, Ni, Cu
- Multiplet Splitting – La, Ce, Pr, Nd, Sm, Eu, Gd, Tb
- Multiplet Splitting and BE Shifts
- Multiplet Splitting Calculated by P. Bagus
- MultiQuant – XPS
- My account
- My Personal Account
- N – Basic Spectra
- Na – Basic Spectra
- NanoParticle Suppliers
- National Labs and Research Institutes
- Native Oxide Spectra – BE of C (1s) ?
- Native Oxides
- Native Oxides – Examples
- Native Oxides FG ON-OFF, 5 MB (*.sdp)
- Native Oxides, 16 MB, FG OFF (*.vgd)
- Natural FWHM
- Natural Oxidation
- Nb – Basic Spectra
- Nd – Basic Spectra
- Ne – Basic Spectra
- Neal Fairley (UK)
- Necsa-Bio Polymers, 2 MB (*.mrs)
- Negligence
- News
- Ni – Basic Spectra
- Niobates
- NIST BEs
- Nitrides
- Noise
- Noisy Data – Coal
- Noisy Data – Ni metal
- O – Basic Spectra
- Old Links
- On-Site Professional Teachers
- On-Site Professional Teachers
- One Electron Approximation
- Operating Conditions
- Original S-Probe, 90 MB (*.mrs)
- Os – Basic Spectra
- Our Sponsors
- Overlaid Chemical State Spectra – Examples
- Overlapping Doublets – Sulfur
- Overlapping Peaks
- Overlapping Peaks
- Overlapping Peaks
- Oxidation Treatments
- P – Basic Spectra
- Partnerships & Sponsorships
- Pass Energies: 5-300 eV
- Paul S. Bagus
- Pb – Basic Spectra
- Pd – Basic Spectra
- PDMS – Silicone Oil
- Peak Area Ratios – PET
- Peak Area vs Background Endpoints
- Peak Base and Top
- Peak-fit Examples
- Peak-fit Models
- Peak-fit Quality
- Peak-Fit Review Service
- Peak-fits of Principal Signals – Elements
- Peak-fitted Spectra Examples
- Peak-fitting = Curve-fitting
- Peak-fitting a Single O (1s) Peak
- Peak-fitting a Single O (1s) Peak – Easy!
- Peak-fitting Flow-Chart
- Peak-fitting Guides
- Peak-fitting Process – Examples
- Peak-fitting Process – Examples
- Peak-fitting Results
- Peak-fitting Variables
- Peak-shape – Example #1
- Peak-shape – Example #1
- Peak-Shapes (charging)
- Peak-Shapes (charging)
- Peak-Shapes (G, L, V)
- Peak-Shapes (G, L, V)
- Peak-Shapes (G, L, V)
- Peak-Shapes (G, L, V)
- Performance vs Specification
- Periodic Table of BEs
- Periodic Tables
- Perovskite Suppliers
- Peroxides
- PHI – XPS Handbook of Spectra – The Elements
- PHI – XPS Handbooks
- PHI Handbook Pages
- PHI Handbook Spectra, 6 MB (*.spe)
- Phosphates
- Photoelectron BE Diagrams
- Photoemission Process
- Photos of Samples
- Physics & Theory
- Physics of XPS
- Physics of XPS
- Plasma Treatments
- Plasmon Loss Peaks
- Plasmon Loss Peaks (features)
- Plasmon or Shake-up – Which?
- Plots Comparing SFs
- Polymer Spectra
- Polymer Suppliers
- Polymers, 46 MB (*.sdp)
- Polymers2
- Posters & InfoGraphics
- PPT / PDF Presentations
- Pr – Basic Spectra
- Precision
- Press Center
- Price for Professional Membership
- Privacy Policy
- Professional Members
- Professional Teachers
- Professors who Donated
- Pt – Basic Spectra
- Pt overlaps Al – ratios
- Publishing XPS Data
- Publishing XPS Data
- Publishing XPS Data
- Publishing XPS Data
- Publishing XPS Data
- Publishing XPS Experimental Details – Journals
- Purchase Professional Membership (US$)
- Pure Element – Survey Spectra + L
- Pure Element Spectra – Main Signals
- Pure Element Spectra – Survey Scans
- Pure Elements
- Pure Single Crystal – CaCO3 (Calcite)
- Quantification – Atom%s
- Quantification – Atom%s
- Quantification – Atom%s
- Quantification – Atom%s
- Quantum Mechanics of XPS
- Quases
- Rare Earth Materials…, 36 MB (*.vgd)
- Rare Earth Metals – Principle
- Rare Earth Suppliers
- Rb – Basic Spectra
- Re – Basic Spectra
- Reference Materials
- Refund Policy
- Registration Form – IXIR System
- Reliable BEs ?
- Reliable Peak-fits ?
- Repeatability
- Reproducibility
- Research Members
- Rh – Basic Spectra
- Ru – Basic Spectra
- S – Basic Spectra
- s, p, d, f Peak-widths
- S-Probe, 200 MB (*.mrs, ASCII)
- Sample (Specimen)
- Sample (specimen) Handling
- Sample (specimen) History
- Sample (specimen) Storage
- Sample Degradation
- Sample Mount Charge-up
- Sample Mounts
- Sample Prep Equipment
- Sample Preparation Bench
- Sample Preparation Methods
- Sample Size, Shape & Form
- Satellite Peaks?
- Sb – Basic Spectra
- Sb overlaps O – ratios
- Sc – Basic Spectra
- Scattering Effects
- SCE Values
- Scofield SFs – Al X-rays – Crist Modified for Thermo K-Alpha
- Scofield SFs – Al X-rays – Theoretically Calculated – Central Field Potential – SCF
- Scofield SFs – Al X-rays – Thermo Modified
- SDP_v8 software
- Se – Basic Spectra
- Selenides
- SEM-EDS Information Depth
- Semiconductor Suppliers
- Sessa
- SF Table #6
- Shake-up – Cu (2+) vs Cu (1+)
- Shake-up – pi to pi*
- Shake-up peaks
- Shake-up Structures
- Sherwood & Proctor Background
- Shirley Background
- Shirley Background
- Shop
- Si – Basic Spectra
- Signal-to-Noise (S/N)
- Silicates
- Silicides
- Simple Peak-fit Examples
- Simple Peak-fit Examples 2
- Single Crystal Suppliers
- Single Crystal Suppliers
- Single Crystals, 240 MB (*.vgd)
- Single Xtals, 2D, Graphene, Nano, Perovskite
- SiS Standards
- Sm – Basic Spectra
- Smoothing – Bad vs OK
- Sn – Basic Spectra
- Software
- Software Operation
- Source of Spectra in The XPS Library
- SpecMaster Pro, 1.8 GB (*.sdp)
- SpecMaster, 527 MB (*.sdp)
- Spectra Data Processor (SDP) – 1 yr Free Use
- Spectra Data Processor v7 – Training Videos
- Spectra Examples
- Spectra Handbooks
- Spectra-Bases #1
- Spectra-Bases #2
- Spin-Orbit Coupling
- Spin-Orbit Coupling
- Spin-Orbit Coupling
- Sr – Basic Spectra
- SRD 64 Electron Elastic Scattering Cross-Sections
- SRD 71 Electron IMFP Database
- SRD 82 Electron EAL Database
- Standards
- Statistics
- Sticking Coefficients
- Store
- Strategic Partners
- Sub-Structure
- Subscriptions
- Sulfates
- Sulfides
- Sulfides from H2S (air)
- Summaries of BE Tables – NIST
- Summaries of BE Tables – NIST
- Super Coster-Kronig Effect – Ti (2p1) in TiO2
- Surface Charging
- Surface Chemical Reaction
- Surface Chemistry
- Surface Contaminants
- Surface Photo-Chemistry
- Surface Reactivity
- Surface Science Western (UWO) Application Notes
- SurfaceSpectra – XPS Handbook of Polymer Spectra
- Survey Spectra Examples
- Sven Tougaard
- Synchrotron Labs
- Synchrotrons
- Synchrotrons for XPS
- Synthetic Peaks
- Ta – Basic Spectra
- Tables & Guides
- Tb – Basic Spectra
- Tc – Basic Spectra
- Te – Basic Spectra
- Teaching Members
- Team
- Technical Support
- Tellurides
- Temp
- Terms & Phrases for XPS
- Terms of Use
- Tesla Coil Irradiation
- Tesla Coil Irradiation Effects
- TEST
- Test Page
- Tests of RSFs
- Th – Basic Spectra
- The History of XPS
- Thermo Application Notes
- Thermo K-Alpha XPS
- Thermo’s Modified Scofield SFs Al X-rays
- Thickness Estimates
- Ti – Basic Spectra
- Titanates
- Tl – Basic Spectra
- Tm – Basic Spectra
- ToF-SIMS Information Depth
- Too Many Peaks – O (1s) – native SiOx
- Tougaard Backgound
- Tougaard Background
- Tougaard Background
- TPP-2M and IMFPs
- TPP-2M IMFP Calculator
- Trace level signals
- Training & Videos
- Translate TXL Website to Your Language
- Translate TXL Website to Your Language
- Transmission Function
- Transmission Function
- Trouble-Shooter Pro
- Troubleshooting
- Tungstates
- TXL #2, 2.0 GB (*.vgd)
- TXL HQ IP-eSF, 340 MB (*.vgd)
- TXL Members
- TXL Misc, 60 MB, (*.vgd)
- TXL Store
- TXL Ultimate, 3 GB (*.txt, *.sdp, *.vgd)
- U – Basic Spectra
- UHV Gas Capture, 1 MB (3d plots)
- UKSAF Links
- Ulvac-PHI Application Notes
- Ulvac-PHI ASFs
- Ulvac-PHI ASFs – March 2002
- Ulvac-PHI SFs as Plots
- Unifit
- University Labs
- Useful Websites
- V – Basic Spectra
- Valence Band Examples
- Valence Band Spectra – Elements
- Valence Band, 3 MB (*.txt, *.sdp)
- Vanadates
- Vegh Background
- VG Eclipse Database, 9 MB (*.dts)
- Vibrational Bands – Gases & Polymers
- Video of Website Menus
- Videos of TXL Website
- Vincent Fernandez
- Vincent S. Smentkowski (USA)
- Vocabulary
- Voigt Peak-shape
- W – Basic Spectra
- Wagner Book of XPS BEs (NIST)
- Wagner SFs – Al X-rays – PHI Modified for 5800 Omni-5
- Wagner SFs – Al X-rays – PHI Modified for MultiPak v8
- Wagner SFs – Al X-rays – Empirically Defined : F (1s)=1.0 vs C (1s)=1.0
- Wagner’s Original ASFs
- Wall Charts & Wall Posters
- Website Menus Display
- Wikipedia – XPS
- Work Functions of Elements
- X-pedia for Elements
- X-ray Beam Alignment
- X-ray Beam Size
- X-ray Data Booklet – LBL
- X-ray Degradation of Polymers, 1 MB (*.sdp)
- X-ray Energies
- X-ray Energies
- X-ray Sources
- XI – Application Notes
- XI Sample Spectra
- XML Site-Map of The XPS Library
- XPS
- XPS (.SDP format) 7304 data-sets
- XPS (.SDP format) 7304 data-sets
- XPS (.VMS, .ISO, .TXT) 3177 data-sets
- XPS (.VMS, .ISO, .TXT) 3177 data-sets
- XPS (.VMS, .ISO, .TXT) 3177 data-sets
- XPS Analysis Service by XPS Metrology LLC
- XPS Basics
- XPS Basics
- XPS BE On-line Database – NIST
- XPS by Element
- XPS Detection Limit
- XPS Detection Limits
- XPS Detection Limits
- XPS Instruments, Components & Parts Makers
- XPS International Application Notes
- XPS International Database Websites
- XPS Job Openings
- XPS Jobs at XPS Makers
- XPS Jobs at XPS Makers
- XPS Journals
- XPS Labs
- XPS Labs around the World
- XPS Library – SEO TERMS
- XPS Manufacturers who Donated
- XPS Opportunities at Contract Analysis Labs
- XPS Papers – NIST
- XPS Peak-fitting MOVIES
- XPS Simplified, 14 MB (*.vgd)
- XPS Spectra & AES Spectra Libraries
- XPS Theory
- XPS Training Videos
- Y – Basic Spectra
- Yb – Basic Spectra
- Your Suggestions – Your Ideas to improve TXL
- Zn – Basic Spectra
- Zr – Basic Spectra
- *** International BE Calibration – Status Reports
- *** TEMPLATE – 3 column tables
- ***BE CALIBRATION – RULES
- ***BE CALIBRATION – RULES
- **Membership
- **PEAK-FITTING – FACTS, RULES & GUIDELINES
- **PEAK-FITTING – FACTS, RULES & GUIDELINES
- **Plot Examples
- **Registration FORM
- **Registration FORM
- *Accuracy Limits – LiF as example
- *Free Library Membership
- *Suggestions
- *Table of RSFs – Normalized Scofield SFs
- – Periodic Table TEMPLATE v1
- – Periodic Table TEMPLATE v2
- 2D Materials Suppliers
- 6 Tables of Sensitivity Factors
- AAnalyzer
- Abbe Criterion
- About The XPS Library
- Accuracy
- Ads
- Advanced Interpretation of XPS
- Advanced Peak-fitting Examples
- Advanced XPS
- Advantages of XPS
- Adventitious Carbon
- Adventitious Carbon
- Adventitious Carbon
- Advertise
- Advertising Members
- AES (.SDP, .NPL, .VMS) 2281 data-sets
- AES (.SDP, .NPL, .VMS) 2281 data-sets
- AFNOR Standards
- Ag – Basic Spectra
- Al – Basic Spectra
- Alberto Herrera Gomez
- Alloy & Stainless Steel Samples Kit
- amCharts v4 test
- Anatomy / Features of Chemical State Spectra
- Anatomy / Features of Survey Spectra
- Angels who Donated
- Anti-Static, Anti-Caking
- Application Notes
- Application Notes ©
- Application Notes from Makers
- Applications
- Ar – Basic Spectra
- AR-XPS
- As – Basic Spectra
- Assigning Chemical States
- ASTM Standards
- Asymmetric tail
- Asymmetry
- Atom% & Shake-up
- Atom% gives Empirical Formula
- Au – Basic Spectra
- Auger (AES) Information Depth
- Auger Parameter
- Auger Signals
- Auger Spectra from XPS – Examples
- Avantage
- AVS Training Courses
- © 2019, Copyrights
- B – Basic Spectra
- B. Vincent Crist
- B. Vincent Crist – CEO
- Background
- Background – Active Fitting
- Background baseline
- Background bulge
- Background Endpoints
- Background Endpoints
- Background Noise
- Background Shapes for Peak-fitting
- Background Shapes for Peak-fitting
- Background Subtraction-Removal
- Background Type – Shirley or Linear
- Background Width
- Bad Data
- Bad Peak-fits
- Bad Peak-fits Explained
- Bad Peak-fits Explained
- Bad Peak-fits Published in Journals – Explained
- Bad Peak-fitting Example
- Bad Peak-fitting Example – Ni (2p3)
- Bad Peak-fitting or Good Peak-fitting
- Bad Survey Spectra
- Bagus Papers
- BAM Standards
- Band Gaps
- Band Gaps from Spectra
- Baselines for Peak-fitting (S, L, T)
- Be – Basic Spectra
- BE Calibration – History
- BE Calibration Values
- BE Lookup Table
- BE RELIABILITY – VITAL
- BE Reliability Problem
- BE Scale Calibration
- BE Table – Atomic # Order
- BE Tables
- Beam Alignment
- Benefits
- Bi – Basic Spectra
- bi-Carbonates
- Biesinger SFs
- Binary Oxides, 46 MB (*.sdp)
- Binding Energy (BE) Scale Calibration
- Blog
- Books
- Borates
- Borides
- Br – Basic Spectra
- BSI Standards
- Bubble Chart for Peak-fitting
- C – Basic Spectra
- C. Richard Brundle
- C. Richard Brundle
- Ca – Basic Spectra
- Calculated IMFP Values
- Calibration Checks – Validation
- Calibration Metals
- Capture of UHV Gases
- Carbides
- Carbon KLL Auger, 2 MB (*.sdp)
- Carbonates
- Carbonates from CO2
- Careers at TXL
- CasaXPS
- Catalyst Surface
- Catalysts
- Cd – Basic Spectra
- Ce – Basic Spectra
- Ceramics Suppliers
- Charge Compensation
- Charge Compensation – Biesinger
- Charge Control
- Charge Correction (Referencing)
- Charge Referencing
- Charge Referencing
- Charge Referencing (CS)
- Charge Referencing Problems
- Charge-Control Mesh-Screen
- Charging
- Charging artifact
- Cheat-Sheet
- Checkout
- Chemical Shift
- Chemical Shifts
- Chemical State Assignments
- Chemical State Definition
- Chemical State Groups, 1 GB (*.vgd)
- Chemical State Identification – BE Lookup Table – Ag to Zr
- Chemical State Identification – BE Lookup Table – Ag to Zr
- Chemical State Peak-fits – Examples
- Chemical State Spectra
- Chemical State Spectra – OVERLAYS
- Chemical State Spectra Peak-fits – Examples
- Chemical States
- Chemical States
- Chemical Suppliers
- Chemical Suppliers
- Chemical Treatments
- Chemical Treatments
- Chi-Squared
- Chlorides
- Circular Dichroism in XPS
- Cl – Basic Spectra
- Clean Surface
- Cleanliness of Surfaces
- Client Portal
- Co – Basic Spectra
- Collections of XPS Spectra
- Common Difficulties
- Comparison of Background Types
- Complex Peak-fits Explained
- Components
- ComPro v12 (SASJ)
- Constrained Peak-fit
- Consultants
- Contact TXL
- Contact TXL
- Contact TXL
- Contact TXL
- Contamination
- Contamination
- Contract Analysis Labs
- Contributing Editors
- Contributing Editors
- Contributors
- Core Hole Lifetimes – FWHM
- Corrosion
- Cr – Basic Spectra
- Creeping Lubricants
- Crist – Handbooks of Monochromatic XPS
- Crist – PDF Book of Commercially Pure Metal Oxides
- Crist – PDF Book of Polymers
- Crist – PDF Book of RE Oxides, Carbonates, Hydroxides, Sulfides, Nitrides…
- Crist – PDF Book of Semiconductors
- Crist – PDF Book of The Elements & Native Oxides
- Crist – Spectra Handbook – Metal Oxides
- Crist – Spectra Handbook – The Elements & Native Oxides
- Crist Empirical IP eSFs – Scofield Base
- Crist Handbook Series – Parameters
- Crist Publications for Download
- Crist Table of BEs & FWHMs
- Crist Table of BEs & FWHMs
- Crist Table of BEs & FWHMs
- Critical Review of NIST XPS BEs
- Cs – Basic Spectra
- CSA Standards
- Cu – Basic Spectra
- Curve-fitting = Peak-fitting
- Data
- Data Collection Settings
- Data Collection Settings
- Data Collection Software
- Data File Formats
- Data Processing Steps
- Data Processing Steps
- Data Quality
- Data Quality
- Degradation
- Degradation
- Degradation due to Ar+ Ion Etching
- Degradation due to Flood Gun Electrons
- Degradation due to X-ray Flux
- Degradation of Polymers
- Deposited Gold
- Deposited Gold
- Deposited Gold
- Deposition Methods
- Depth of Information
- Depth Profiling
- Differential Charging
- DIN Standards
- DIN Standards
- Documentary Standards and Guidelines
- Don Baer (USA)
- Downloads
- Drawings and Schematics
- Due to Bremsstrahlung
- Due to High Vacuum
- Due to Non-Mono Heat
- Dy – Basic Spectra
- EAG-EuroFin Application Notes
- EAL, Effective Attenuation Length
- Electron Configuration – Atomic Orbitals
- Electronic State Info
- Element Cyclopedia TEMPLATE
- Element X-pedia TEMPLATE
- Element XP-Cyclopedia
- Endpoint Averaging
- Energy loss peak
- Energy Resolution
- Energy Resolution (PE)
- Environmental XPS
- Er – Basic Spectra
- ESCApe
- Eu – Basic Spectra
- EULA
- Examples of Bad Peak-fitting
- Excited States
- Expert Members
- Experts
- Extending Spectrum Range Benefits
- Extrinsic Background
- F – Basic Spectra
- Fe – Basic Spectra
- Features
- Features in Chemical State Spectra
- Features in Survey Spectra
- Fermi Edge
- Fermi Edge (features)
- FG Effect on Native Oxides
- Final & Initial States
- Final State Effects
- flat-database-2
- Flood Gun Effect on Native Oxides
- Flood Gun on Native Oxides, 1 MB (plots)
- Flood Gun Optimization & Alignment
- Flowcharts & Guides
- Fluorides
- Free Membership
- Free Software
- Free XPS Spectra – Free XPS Software
- Free XPS Spectra – ISO 14976
- Frequently Asked Questions
- From Auger Signals
- From Survey Spectra
- Future for XPS Instrument Sales
- Future for XPS Instrument Sales
- Future for XPS Instrument Sales
- FWHM = Peak-width
- FWHM = Peak-width
- FWHM for Peak-fitting Chemical Compounds
- FWHM for Pure Metals – Mono and Non-Mono
- FWHM Information
- FWHM Peak-width vs Pass Energy
- FWHM Peak-width vs Pass Energy (ER)
- Ga – Basic Spectra
- Gas Capture of UHV Gases
- Gas Phase XPS
- Gas Treatments
- Gaussian Lorentzian Model
- Gaussian Lorentzian Models
- Gaussian-Lorentzian Ratios
- Gaussian-Lorentzian Ratios
- Gd – Basic Spectra
- Ge – Basic Spectra
- GI-GO ?
- GOST-R & RuStandards
- Graphene Materials
- Graphs and Charts
- Groups as Members
- gtest
- H – Basic Spectra
- Handbook Series, 34 MB (*.ISO, *.VMS)
- Handbooks – XPS Spectra
- Handbooks of XPS Spectra
- HAXPES
- He – Basic Spectra
- Heat Treatments
- HER Auger Spectra, 12 MB (*.sdp)
- Hf – Basic Spectra
- Hg – Basic Spectra
- Hidden
- High BE Endpoint
- Histogram Plots of NIST BEs
- Histogram Plots of NIST BEs
- History of XPS
- Ho – Basic Spectra
- Home
- Hydrocarbon Carbon (not for calibration)
- Hydroxides
- Hydroxides from Oxides
- HyperPhysics
- I – Basic Spectra
- Imaging – Mapping
- IMFP & AL
- IMFP – Metal vs Metal Oxide
- In – Basic Spectra
- In-Situ Treatments
- Index / Site-map
- Industrial Goods, 67 MB (*.vgd)
- Industrial Labs
- Initial & Final States
- Inside View – Analysis Chamber
- Instrument Buying Guide
- Instrument Component Suppliers
- Instrument Components
- Instrument Design
- Instrument Details & Adjustments
- Instrument Geometries
- Instrument Makers
- Instrument Makers
- Instrument Operation
- Instrument Service
- Instrument Training by Maker
- Instruments
- Insulator Band Gap
- Integration Endpoints
- Interactive Visualizations
- International Conferences – XPS
- International XPS Instrument Registry (IXIR)
- Intrinsic and Extrinsic Losses
- Intrinsic Signal
- Ion Beam Etching
- Ion Etch Rate Films
- Ion Etch Rate Tables
- Ion Etched Elements – Capture UHV Gases
- Ion Etching
- Ion Etching – Ag, Au, Cu
- Ion Etching Variables
- Ir – Basic Spectra
- ISO 18115-1:2013 XPS Terms
- ISO BE Standards
- ISO Standards
- IXIR
- IXIR Database ON-LINE
- σ, SF, ASF, RSF, and e-RSF
- JEOL – XPS Handbook
- JIS Standards
- Job Openings for XPS
- Job Openings for XPS
- John Moulder (USA)
- John T. Grant
- Journal Editors
- Journals & Publishers
- K – Basic Spectra
- Kateryna Artyushova
- Knowledge Base
- Kr – Basic Spectra
- Kratos – XPS Handbook
- Kratos Application Notes, etc.
- Kratos SFs – Scofield SFs until 1995
- KSA Standards
- La – Basic Spectra
- Landing Page
- Laser-XPS
- Legal Witness
- Li – Basic Spectra
- Li, Na, K, Rb, Cs
- Licensing by Membership
- Lifetime of Clean Surfaces
- Limits & Weaknesses
- Linear Background
- Linear Background
- Linked-In people who want On-Line Self-training
- Links
- Links to >700 pages at TXL
- List of Members
- Literature Spectra (used as Reference Spectra)
- Log-In Here
- Logo’s
- Lorentzian % – Excessive
- Lorentzian % – Excessive
- Lu – Basic Spectra
- Lubricants
- Makers
- Mark C. Biesinger
- Materials Analysis Methods – List
- Matthew Linford
- Member Benefits
- Metal Oxides – Binary
- Mg – Basic Spectra
- Miscellaneous, 60 MB (*.txt)
- Mn – Basic Spectra
- Mo – Basic Spectra
- Molybdates
- Multi-Pak
- Multiplet Splitting
- Multiplet Splitting
- Multiplet Splitting
- Multiplet Splitting – 2p – Cr, Mn, Fe, Co, Ni, Cu
- Multiplet Splitting – 3s – Orbitals
- Multiplet Splitting – Cr, Mn, Fe, Co, Ni, Cu
- Multiplet Splitting – La, Ce, Pr, Nd, Sm, Eu, Gd, Tb
- Multiplet Splitting and BE Shifts
- Multiplet Splitting Calculated by P. Bagus
- MultiQuant – XPS
- My account
- My Personal Account
- N – Basic Spectra
- Na – Basic Spectra
- NanoParticle Suppliers
- National Labs and Research Institutes
- Native Oxide Spectra – BE of C (1s) ?
- Native Oxides
- Native Oxides – Examples
- Native Oxides FG ON-OFF, 5 MB (*.sdp)
- Native Oxides, 16 MB, FG OFF (*.vgd)
- Natural FWHM
- Natural Oxidation
- Nb – Basic Spectra
- Nd – Basic Spectra
- Ne – Basic Spectra
- Neal Fairley (UK)
- Necsa-Bio Polymers, 2 MB (*.mrs)
- Negligence
- News
- Ni – Basic Spectra
- Niobates
- NIST BEs
- Nitrides
- Noise
- Noisy Data – Coal
- Noisy Data – Ni metal
- O – Basic Spectra
- Old Links
- On-Site Professional Teachers
- On-Site Professional Teachers
- One Electron Approximation
- Operating Conditions
- Original S-Probe, 90 MB (*.mrs)
- Os – Basic Spectra
- Our Sponsors
- Overlaid Chemical State Spectra – Examples
- Overlapping Doublets – Sulfur
- Overlapping Peaks
- Overlapping Peaks
- Overlapping Peaks
- Oxidation Treatments
- P – Basic Spectra
- Partnerships & Sponsorships
- Pass Energies: 5-300 eV
- Paul S. Bagus
- Pb – Basic Spectra
- Pd – Basic Spectra
- PDMS – Silicone Oil
- Peak Area Ratios – PET
- Peak Area vs Background Endpoints
- Peak Base and Top
- Peak-fit Examples
- Peak-fit Models
- Peak-fit Quality
- Peak-Fit Review Service
- Peak-fits of Principal Signals – Elements
- Peak-fitted Spectra Examples
- Peak-fitting = Curve-fitting
- Peak-fitting a Single O (1s) Peak
- Peak-fitting a Single O (1s) Peak – Easy!
- Peak-fitting Flow-Chart
- Peak-fitting Guides
- Peak-fitting Process – Examples
- Peak-fitting Process – Examples
- Peak-fitting Results
- Peak-fitting Variables
- Peak-shape – Example #1
- Peak-shape – Example #1
- Peak-Shapes (charging)
- Peak-Shapes (charging)
- Peak-Shapes (G, L, V)
- Peak-Shapes (G, L, V)
- Peak-Shapes (G, L, V)
- Peak-Shapes (G, L, V)
- Performance vs Specification
- Periodic Table of BEs
- Periodic Tables
- Perovskite Suppliers
- Peroxides
- PHI – XPS Handbook of Spectra – The Elements
- PHI – XPS Handbooks
- PHI Handbook Pages
- PHI Handbook Spectra, 6 MB (*.spe)
- Phosphates
- Photoelectron BE Diagrams
- Photoemission Process
- Photos of Samples
- Physics & Theory
- Physics of XPS
- Physics of XPS
- Plasma Treatments
- Plasmon Loss Peaks
- Plasmon Loss Peaks (features)
- Plasmon or Shake-up – Which?
- Plots Comparing SFs
- Polymer Spectra
- Polymer Suppliers
- Polymers, 46 MB (*.sdp)
- Polymers2
- Posters & InfoGraphics
- PPT / PDF Presentations
- Pr – Basic Spectra
- Precision
- Press Center
- Price for Professional Membership
- Privacy Policy
- Professional Members
- Professional Teachers
- Professors who Donated
- Pt – Basic Spectra
- Pt overlaps Al – ratios
- Publishing XPS Data
- Publishing XPS Data
- Publishing XPS Data
- Publishing XPS Data
- Publishing XPS Data
- Publishing XPS Experimental Details – Journals
- Purchase Professional Membership (US$)
- Pure Element – Survey Spectra + L
- Pure Element Spectra – Main Signals
- Pure Element Spectra – Survey Scans
- Pure Elements
- Pure Single Crystal – CaCO3 (Calcite)
- Quantification – Atom%s
- Quantification – Atom%s
- Quantification – Atom%s
- Quantification – Atom%s
- Quantum Mechanics of XPS
- Quases
- Rare Earth Materials…, 36 MB (*.vgd)
- Rare Earth Metals – Principle
- Rare Earth Suppliers
- Rb – Basic Spectra
- Re – Basic Spectra
- Reference Materials
- Refund Policy
- Registration Form – IXIR System
- Reliable BEs ?
- Reliable Peak-fits ?
- Repeatability
- Reproducibility
- Research Members
- Rh – Basic Spectra
- Ru – Basic Spectra
- S – Basic Spectra
- s, p, d, f Peak-widths
- S-Probe, 200 MB (*.mrs, ASCII)
- Sample (Specimen)
- Sample (specimen) Handling
- Sample (specimen) History
- Sample (specimen) Storage
- Sample Degradation
- Sample Mount Charge-up
- Sample Mounts
- Sample Prep Equipment
- Sample Preparation Bench
- Sample Preparation Methods
- Sample Size, Shape & Form
- Satellite Peaks?
- Sb – Basic Spectra
- Sb overlaps O – ratios
- Sc – Basic Spectra
- Scattering Effects
- SCE Values
- Scofield SFs – Al X-rays – Crist Modified for Thermo K-Alpha
- Scofield SFs – Al X-rays – Theoretically Calculated – Central Field Potential – SCF
- Scofield SFs – Al X-rays – Thermo Modified
- SDP_v8 software
- Se – Basic Spectra
- Selenides
- SEM-EDS Information Depth
- Semiconductor Suppliers
- Sessa
- SF Table #6
- Shake-up – Cu (2+) vs Cu (1+)
- Shake-up – pi to pi*
- Shake-up peaks
- Shake-up Structures
- Sherwood & Proctor Background
- Shirley Background
- Shirley Background
- Shop
- Si – Basic Spectra
- Signal-to-Noise (S/N)
- Silicates
- Silicides
- Simple Peak-fit Examples
- Simple Peak-fit Examples 2
- Single Crystal Suppliers
- Single Crystal Suppliers
- Single Crystals, 240 MB (*.vgd)
- Single Xtals, 2D, Graphene, Nano, Perovskite
- SiS Standards
- Sm – Basic Spectra
- Smoothing – Bad vs OK
- Sn – Basic Spectra
- Software
- Software Operation
- Source of Spectra in The XPS Library
- SpecMaster Pro, 1.8 GB (*.sdp)
- SpecMaster, 527 MB (*.sdp)
- Spectra Data Processor (SDP) – 1 yr Free Use
- Spectra Data Processor v7 – Training Videos
- Spectra Examples
- Spectra Handbooks
- Spectra-Bases #1
- Spectra-Bases #2
- Spin-Orbit Coupling
- Spin-Orbit Coupling
- Spin-Orbit Coupling
- Sr – Basic Spectra
- SRD 64 Electron Elastic Scattering Cross-Sections
- SRD 71 Electron IMFP Database
- SRD 82 Electron EAL Database
- Standards
- Statistics
- Sticking Coefficients
- Store
- Strategic Partners
- Sub-Structure
- Subscriptions
- Sulfates
- Sulfides
- Sulfides from H2S (air)
- Summaries of BE Tables – NIST
- Summaries of BE Tables – NIST
- Super Coster-Kronig Effect – Ti (2p1) in TiO2
- Surface Charging
- Surface Chemical Reaction
- Surface Chemistry
- Surface Contaminants
- Surface Photo-Chemistry
- Surface Reactivity
- Surface Science Western (UWO) Application Notes
- SurfaceSpectra – XPS Handbook of Polymer Spectra
- Survey Spectra Examples
- Sven Tougaard
- Synchrotron Labs
- Synchrotrons
- Synchrotrons for XPS
- Synthetic Peaks
- Ta – Basic Spectra
- Tables & Guides
- Tb – Basic Spectra
- Tc – Basic Spectra
- Te – Basic Spectra
- Teaching Members
- Team
- Technical Support
- Tellurides
- Temp
- Terms & Phrases for XPS
- Terms of Use
- Tesla Coil Irradiation
- Tesla Coil Irradiation Effects
- TEST
- Test Page
- Tests of RSFs
- Th – Basic Spectra
- The History of XPS
- Thermo Application Notes
- Thermo K-Alpha XPS
- Thermo’s Modified Scofield SFs Al X-rays
- Thickness Estimates
- Ti – Basic Spectra
- Titanates
- Tl – Basic Spectra
- Tm – Basic Spectra
- ToF-SIMS Information Depth
- Too Many Peaks – O (1s) – native SiOx
- Tougaard Backgound
- Tougaard Background
- Tougaard Background
- TPP-2M and IMFPs
- TPP-2M IMFP Calculator
- Trace level signals
- Training & Videos
- Translate TXL Website to Your Language
- Translate TXL Website to Your Language
- Transmission Function
- Transmission Function
- Trouble-Shooter Pro
- Troubleshooting
- Tungstates
- TXL #2, 2.0 GB (*.vgd)
- TXL HQ IP-eSF, 340 MB (*.vgd)
- TXL Members
- TXL Misc, 60 MB, (*.vgd)
- TXL Store
- TXL Ultimate, 3 GB (*.txt, *.sdp, *.vgd)
- U – Basic Spectra
- UHV Gas Capture, 1 MB (3d plots)
- UKSAF Links
- Ulvac-PHI Application Notes
- Ulvac-PHI ASFs
- Ulvac-PHI ASFs – March 2002
- Ulvac-PHI SFs as Plots
- Unifit
- University Labs
- Useful Websites
- V – Basic Spectra
- Valence Band Examples
- Valence Band Spectra – Elements
- Valence Band, 3 MB (*.txt, *.sdp)
- Vanadates
- Vegh Background
- VG Eclipse Database, 9 MB (*.dts)
- Vibrational Bands – Gases & Polymers
- Video of Website Menus
- Videos of TXL Website
- Vincent Fernandez
- Vincent S. Smentkowski (USA)
- Vocabulary
- Voigt Peak-shape
- W – Basic Spectra
- Wagner Book of XPS BEs (NIST)
- Wagner SFs – Al X-rays – PHI Modified for 5800 Omni-5
- Wagner SFs – Al X-rays – PHI Modified for MultiPak v8
- Wagner SFs – Al X-rays – Empirically Defined : F (1s)=1.0 vs C (1s)=1.0
- Wagner’s Original ASFs
- Wall Charts & Wall Posters
- Website Menus Display
- Wikipedia – XPS
- Work Functions of Elements
- X-pedia for Elements
- X-ray Beam Alignment
- X-ray Beam Size
- X-ray Data Booklet – LBL
- X-ray Degradation of Polymers, 1 MB (*.sdp)
- X-ray Energies
- X-ray Energies
- X-ray Sources
- XI – Application Notes
- XI Sample Spectra
- XML Site-Map of The XPS Library
- XPS
- XPS (.SDP format) 7304 data-sets
- XPS (.SDP format) 7304 data-sets
- XPS (.VMS, .ISO, .TXT) 3177 data-sets
- XPS (.VMS, .ISO, .TXT) 3177 data-sets
- XPS (.VMS, .ISO, .TXT) 3177 data-sets
- XPS Analysis Service by XPS Metrology LLC
- XPS Basics
- XPS Basics
- XPS BE On-line Database – NIST
- XPS by Element
- XPS Detection Limit
- XPS Detection Limits
- XPS Detection Limits
- XPS Instruments, Components & Parts Makers
- XPS International Application Notes
- XPS International Database Websites
- XPS Job Openings
- XPS Jobs at XPS Makers
- XPS Jobs at XPS Makers
- XPS Journals
- XPS Labs
- XPS Labs around the World
- XPS Library – SEO TERMS
- XPS Manufacturers who Donated
- XPS Opportunities at Contract Analysis Labs
- XPS Papers – NIST
- XPS Peak-fitting MOVIES
- XPS Simplified, 14 MB (*.vgd)
- XPS Spectra & AES Spectra Libraries
- XPS Theory
- XPS Training Videos
- Y – Basic Spectra
- Yb – Basic Spectra
- Your Suggestions – Your Ideas to improve TXL
- Zn – Basic Spectra
- Zr – Basic Spectra
Page load link