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BooksB Vincent Crist2019-09-05T07:19:48-07:00
Useful Books
XPS / ESCA
- Practical Surface Analysis -Auger and X-ray Photoelectron Spectroscopy
D. Briggs and M. P. Seah (Editors), Wiley Interscience, 1990 (2nd ed.)
- Photoelectron Spectroscopy (Springer Series in Solid-State Sciences Vol. 82)
S. Huefner, Springer Verlag, 1995
- Introduction to Photoelectron Spectroscopy (Chemical Analysis Vol. 67)
P. K. Ghosh, Wiley Interscience, 1983
- Modern ESCA – The Principles and Practice of X-ray Photoelectron Spectroscopy
T. L. Barr, CRC, 1994
- Photo-electron Spectra Induced by X-rays of Above 600 Non-Metallic Compounds Containing 77 Elements
C. K. Jorgensen and H. Berthou, Munksgaard Publishers, Denmark, 1972
- Handbook of X-ray Photoelectron Spectroscopy
J. Moulder, William F. Stickle, P. E. Sobol, and K.D. Bomben, (J. Chastain, editor) Perkin Elmer Corporation (Physical Electronics), 1992 (2nd edition)
- Handbook of X-ray Photoelectron Spectroscopy
C. D. Wagner, W. M. Riggs, L. E. Davis, and J. Moulder (G. E. Muilenberg, editor) Perkin Elmer Corporation (Physical Electronics), 1979 (1st edition)
- Handbook of X-ray Photoelectron Spectroscopy
N. Ikeo, Y. Iijima, N. Nimura, M. Sigematsu, T. Tazawa, S. Matsumoto, K. Kojima, and Y. Nagasawa, JEOL, 1991
- High Resolution XPS of Organic Polymers – The Scienta ESCA300 Database
G. Beamson and D. Briggs, Wiley Interscience, 1992
- Practical Handbook of Spectroscopy
J. W. Robinson, CRC, 1991
- VG Scientific XPS Handbook
E. Adem, VG Scientific, 1991 (1st edition)
- Handbook of Monochromatic XPS Spectra – Vol. 1 – The Elements and Native Oxides
B. V. Crist, XPS International, Inc., 1999
- Handbook of Monochromatic XPS Spectra – Vol. 2 – Commercially Pure Binary Oxides
B. V. Crist, XPS International, Inc., 1999
- Handbook of Monochromatic XPS Spectra – Vol. 3 – Semiconductors
B. V. Crist, XPS International, Inc., 1999
- Handbook of Monochromatic XPS Spectra – Vol. 4 – Polymers and Polymer Damage
B. V. Crist, XPS International, Inc., 1999
- Handbook of Monochromatic XPS Spectra – Vol. 5 – Miscellaneous Materials
B. V. Crist, XPS International, Inc., 1999
- On-Screen PDF Handbook of Monochromatic XPS Spectra – Vol. 1 – The Elements and Native Oxides,
B. V. Crist, XPS International, Inc., 1999
Equipment to Help Build Surface Analysis Instruments
- Experimental Innovations in Surface Science – A Guide to Practical Laboratory Methods and Instruments
J. T. Yates, Jr.. Springer Verlag, 1998
- Building Scientific Apparatus – A Practical Guide to Design and Construction
J. H. Moore, C. C. Davis, and M. A. Coplan, Addison-Wesley Publishing, 1983
- Optical Systems for Soft X-rays
A. G. Michette, Plenum Press, 1986
Introduction to Surface Science
- Encyclopedia of Materials Characterization
C. R. Brundle, C. A.Evans, and S. Wilson, Butterworth-Heinemann, 1992
- Surface Science – An Introduction
J. B. Hudson, Butterworth-Heinemann, 1992
- Characterization of Solid Surfaces
P. F. Kane and G. B. Larrabee, Plenum Press, 1978
- Surface Analytical Techniques (Monographs on the Physics and Chemistry of Materials)
J. C. Riviere, Oxford Science Publications, 1990
- Methods of Surface Analysis
J. M. Walls (editor), Cambridge University Press, 1989
- Surfaces and Interfaces of Solids (Springer Series in Surface Sciences – Vol. 15)
H. Lueth, Springer Verlag, 1993
- Journal of Electron Spectroscopy and Related Phenomena –Â First International Conference on Electron Spectroscopy in Namur (April 1974)
R. Caudano and J. Verbist (editors), Elsevier Scientific Publishing, 1974
- Journal of Electron Spectroscopy and Related Phenomena –Â Fourth International Conference on Electron Spectroscopy in Hawaii (July 1989)
C. R. Brundle, G. E. McGuire, and J. J. Pireaux (editors), Elsevier, 1990
Real World Applications of Surface Science
- Applied Electron Spectroscopy for Chemical Analysis (Chemical Analysis Vol. 63)
H. Windawi and F. F-L. Ho (Editors), Wiley Interscience, 1982
- Laser Damage in Optical Materials
R. Wood, Adam Hilger Ltd., 1986
- Surface Studies with Lasers (Springer Series in Chemical Physics – Vol.33)
F. R. Aussenegg, A. Leitner, and M. E. Lippitsch (editors), Springer Verlag, 1983
- Industrial Adhesion Problems
S. M. Brewis and D. Briggs (editors), Wiley Interscience, 1985
- Applied Surface Analysis (ASTM STP 699)
T. L. Barr and L. E. Davis (editors), ASTM, 1980
- Industrial Applications of Surface Analysis (ACS Symposium Series Vol 199)
L. A. Casper and C. J. Powell (editors), ACS, 1982
- Introduction to Photoelectron Spectroscopy (Chemical Analysis Vol. 67)
P. K. Ghosh, Wiley Interscience, 1983
Special Topics
- Thin Film Processes
J. L. Vossen and W. Kern, Academic Press, 1978
- The Physics and Chemistry of Color – The Fifteen Causes of Color
K. Nassau, Wiley Interscience, 1983
- X-rays in Atomic and Nuclear Physics
N. A. Dyson, Cambridge University Press, 1990 (2nd edition)
- X-ray Spectroscopy (Springer Series in Optical Sciences)
B. K. Agarwal, Spriner Verlag, 1991 (2nd ed.)
- Materials Handbook
G. S. Brady and H. R. Clauser, McGraw-Hill Book Co., 1979 (11th edition)
- The Elements
J. Emsley, Oxford University Press, 1991 (2nd edition)
- Polarized Electrons (Springer Series on Atoms and Plasmas)
J. Kessler, Springer Verlag, 1985 (2nd edition)
- Thin Film and Depth Profile Analysis (Topics in Current Physics Vol. 37)
H. Oechsner (editor), Springer Verlag, 1984
- Physical Analysis for Tribology
T. F. J. Quinn, Cambridge University Press, 1991
- Surface Studies with Lasers (Springer Series in Chemical Physics – Vol.33)
F. R. Aussenegg, A. Leitner, and M. E. Lippitsch (editors), Springer Verlag, 1983
- Surface Reactions (Springer Series in Surface Sciences Vol. 34)
R. J. Madix (Editor), Springer Verlag, 1994
- Adsorption on Ordered Surfaces of Ionic Solids and Thin Films
(Springer Series in Surface Sciences Vol 33)
H-J. Freund and E. Umbach (editors), Springer Verlag, 1993
- Photo-electron Spectra Induced by X-rays of Above 600 Non-Metallic Compounds Containing 77 Elements
C. K. Jorgensen and H. Berthou, Munksgaard Publishers, Denmark, 1972
- Journal of Electron Spectroscopy and Related Phenomena –Â First International Conference on Electron Spectroscopy in Namur (April 1974)
R. Caudano and J. Verbist (editors), Elsevier Scientific Publishing, 1974
- Journal of Electron Spectroscopy and Related Phenomena –Â Fourth International Conference on Electron Spectroscopy in Hawaii (July 1989)
C. R. Brundle, G. E. McGuire, and J. J. Pireaux (editors), Elsevier, 1990
Surface Physics
- Introduction to Solid State Physics
C. Kittel, Wiley & Sons, 1956 (2nd edition)
- Physics at Surfaces
A. Zangwill, Cambridge University Press, 1988
- Intermolecular & Surface Forces
J. Israelachvili, Academic Press, 1992 (2nd ed.)
- Electronic Properties of Surfaces
M. Prutton (editor), Adam Hilger Ltd., 1984
- Physical Chemistry of Surfaces
A. W. Adamson, Wiley Intersciences, 1990 (5th edition)
- Introduction to Surface Physics
M. Prutton, Oxford Science Publications, 1994
- Solids and Surfaces – A Chemist’s View of Bonding in Extended Structures
R. Hoffmann, VCH Publishers, 1988
- Breakdown of the One-Electron Pictures in Photoelectron Spectra (Structure and Bonding – Vol 45)
G. Wendin, Springer Verlag, 1981
- Basic Theory of Surface States (Monographs on the Physics and Chemistry of Materials – Vol. 46)
S. G. Davison and M. Steslicka, Oxford Science Publications, 1992
- The Chemical Physics of Surfaces
S. Roy Morrison, Plenum Press, 1990 (2nd edition)
Surface Science or Analysis of Various Materials
- Encyclopedia of Materials Characterization
C. R. Brundle, C. A.Evans, and S. Wilson, Butterworth-Heinemann, 1992
- The Microelectronics Processing – Inorganic Materials Characterization
ACS Symposium Series – Vol. 295. L. A. Caspar (editor), American Chemical Society, 1986
- The Surface Science of Metal Oxides
V. E. Henrich and P. A. Cox, Cambridge University Press, 1994
- Physics and Chemistry at Oxide Surfaces
C. Noguera, Cambridge University Press, 1996
- Surface and Near-Surface Chemistry of Oxide Materials
(Materials Science Monographs Vol. 47)
J. Nowotny and L-C. DuFour (editors), Elsevier, 1988
- Electronic Conduction in Oxides (Springer Series in Solid-State Sciences Vol. 94)
N. Tsuda, K. Nasu, A. Yanase and K. Siratori, Springer Verlag, 1991
- Semiconductor Surfaces and Interfaces (Springer Series in Surface Sciences Vol. 26)
W. Moench, Springer Verlag, 1995 (2nd ed)
- The Fundamentals of Corrosion
J. C. Scully, Pergamon Press, 1990 (3rd ed.)
- Laser Damage in Optical Materials
R. Wood, Adam Hilger Ltd., 1986
- Spectroscopy in Catalysis
J. W. Niemantsverdriet, VCH Publishers, 1995
- Introduction to Surface Chemistry and Catalysis
G. A. Somorjai, Wiley Interscience, 1994
- Surface Science of Catalysis (In-situ Probes and Reaction Kinetics)
D. J. Dwyer and D. M. Hoffman (editors), ACS Symposium Series Vol 482, ACS, 1992
- Materials Handbook
G. S. Brady and H. R. Clauser, McGraw-Hill Book Co., 1979 (11th edition)
- Industrial Adhesion Problems
S. M. Brewis and D. Briggs (editors), Wiley Interscience, 1985
- Polymer Surfaces
D. T. Clark and W. J. Feast (editors), Wiley & Sons, 1978
- Polymer Degradation – Principles and Practical Applications
W. Schnabel, Hanser International (Macmillan Publishing Co.), 1981
- Photon, Electron, and Ion Probes of Polymer Structure and Properties (ASC Series 162)
D. W. Dwight, T. J. Fabish, and H. Ronald Thomas, Amercian Chemical Society, 1981
- Physical Analysis for Tribology
T. F. J. Quinn, Cambridge University Press, 1991
Synchrotron As Excitation Source
- Introduction to Synchrotron Radiation
G. Margaritondo, Oxford University Press, 1988
- Photoelectron Spectroscopy (Springer Series in Solid-State Sciences Vol. 82)
S. Huefner, Springer Verlag, 1995
- Atomic Collisions – Electron and Photon Projectiles
E. W. McDaniel, Wiley Interscience, 1989
- Electron Spectrometry of Atoms using Synchrotron Radiation
V. Schmidt, Cambridge University Press, 1997
Teaching
- Introduction to Photoelectron Spectroscopy (Chemical Analysis Vol. 67)
P. K. Ghosh, Wiley Interscience, 1983
- X-ray Photoelectron Spectroscopy (XPS/ESCA) – AVS Training Course Book
J. T. Grant, University of Dayton, 1994
- Course on ESCA and Auger Spectroscopy – Am. Chem. Soc. Training Course Book
D. M. Hercules, American Chemical Society, ca. 1985
Training Courses
- X-ray Photoelectron Spectroscopy (XPS/ESCA) – AVS Training Course Book
J. T. Grant, University of Dayton, 1994
- Course on ESCA and Auger Spectroscopy – Am. Chem. Soc. Training Course Book
D. M. Hercules, American Chemical Society, ca. 1985
Statistical Analysis of Data
- Data Fitting in the Chemical Sciences
P. Gans, Wiley Interscience, 1992
- Data Analysis for the Chemical Sciences – A Guide to Statistical Techniques
R. C. Graham, VCH Publishers, 1993
- *** International BE Calibration – Status Reports
- *** TEMPLATE – 3 column tables
- ***BE CALIBRATION – RULES
- ***BE CALIBRATION – RULES
- **Membership
- **PEAK-FITTING – FACTS, RULES & GUIDELINES
- **PEAK-FITTING – FACTS, RULES & GUIDELINES
- **Plot Examples
- **Registration FORM
- **Registration FORM
- *Accuracy Limits – LiF as example
- *Free Library Membership
- *Suggestions
- *Table of RSFs – Normalized Scofield SFs
- – Periodic Table TEMPLATE v1
- – Periodic Table TEMPLATE v2
- 2D Materials Suppliers
- 6 Tables of Sensitivity Factors
- AAnalyzer
- Abbe Criterion
- About The XPS Library
- Accuracy
- Ads
- Advanced Interpretation of XPS
- Advanced Peak-fitting Examples
- Advanced XPS
- Advantages of XPS
- Adventitious Carbon
- Adventitious Carbon
- Adventitious Carbon
- Advertise
- Advertising Members
- AES (.SDP, .NPL, .VMS) 2281 data-sets
- AES (.SDP, .NPL, .VMS) 2281 data-sets
- AFNOR Standards
- Ag – Basic Spectra
- Al – Basic Spectra
- Alberto Herrera Gomez
- Alloy & Stainless Steel Samples Kit
- amCharts v4 test
- Anatomy / Features of Chemical State Spectra
- Anatomy / Features of Survey Spectra
- Angels who Donated
- Anti-Static, Anti-Caking
- Application Notes
- Application Notes ©
- Application Notes from Makers
- Applications
- Ar – Basic Spectra
- AR-XPS
- As – Basic Spectra
- Assigning Chemical States
- ASTM Standards
- Asymmetric tail
- Asymmetry
- Atom% & Shake-up
- Atom% gives Empirical Formula
- Au – Basic Spectra
- Auger (AES) Information Depth
- Auger Parameter
- Auger Signals
- Auger Spectra from XPS – Examples
- Avantage
- AVS Training Courses
- © 2019, Copyrights
- B – Basic Spectra
- B. Vincent Crist
- B. Vincent Crist – CEO
- Background
- Background – Active Fitting
- Background baseline
- Background bulge
- Background Endpoints
- Background Endpoints
- Background Noise
- Background Shapes for Peak-fitting
- Background Shapes for Peak-fitting
- Background Subtraction-Removal
- Background Type – Shirley or Linear
- Background Width
- Bad Data
- Bad Peak-fits
- Bad Peak-fits Explained
- Bad Peak-fits Explained
- Bad Peak-fits Published in Journals – Explained
- Bad Peak-fitting Example
- Bad Peak-fitting Example – Ni (2p3)
- Bad Peak-fitting or Good Peak-fitting
- Bad Survey Spectra
- Bagus Papers
- BAM Standards
- Band Gaps
- Band Gaps from Spectra
- Baselines for Peak-fitting (S, L, T)
- Be – Basic Spectra
- BE Calibration – History
- BE Calibration Values
- BE Lookup Table
- BE RELIABILITY – VITAL
- BE Reliability Problem
- BE Scale Calibration
- BE Table – Atomic # Order
- BE Tables
- Beam Alignment
- Benefits
- Bi – Basic Spectra
- bi-Carbonates
- Biesinger SFs
- Binary Oxides, 46 MB (*.sdp)
- Binding Energy (BE) Scale Calibration
- Blog
- Books
- Borates
- Borides
- Br – Basic Spectra
- BSI Standards
- Bubble Chart for Peak-fitting
- C – Basic Spectra
- C. Richard Brundle
- C. Richard Brundle
- Ca – Basic Spectra
- Calculated IMFP Values
- Calibration Checks – Validation
- Calibration Metals
- Capture of UHV Gases
- Carbides
- Carbon KLL Auger, 2 MB (*.sdp)
- Carbonates
- Carbonates from CO2
- Careers at TXL
- CasaXPS
- Catalyst Surface
- Catalysts
- Cd – Basic Spectra
- Ce – Basic Spectra
- Ceramics Suppliers
- Charge Compensation
- Charge Compensation – Biesinger
- Charge Control
- Charge Correction (Referencing)
- Charge Referencing
- Charge Referencing
- Charge Referencing (CS)
- Charge Referencing Problems
- Charge-Control Mesh-Screen
- Charging
- Charging artifact
- Cheat-Sheet
- Checkout
- Chemical Shift
- Chemical Shifts
- Chemical State Assignments
- Chemical State Definition
- Chemical State Groups, 1 GB (*.vgd)
- Chemical State Identification – BE Lookup Table – Ag to Zr
- Chemical State Identification – BE Lookup Table – Ag to Zr
- Chemical State Peak-fits – Examples
- Chemical State Spectra
- Chemical State Spectra – OVERLAYS
- Chemical State Spectra Peak-fits – Examples
- Chemical States
- Chemical States
- Chemical Suppliers
- Chemical Suppliers
- Chemical Treatments
- Chemical Treatments
- Chi-Squared
- Chlorides
- Circular Dichroism in XPS
- Cl – Basic Spectra
- Clean Surface
- Cleanliness of Surfaces
- Client Portal
- Co – Basic Spectra
- Collections of XPS Spectra
- Common Difficulties
- Comparison of Background Types
- Complex Peak-fits Explained
- Components
- ComPro v12 (SASJ)
- Constrained Peak-fit
- Consultants
- Contact TXL
- Contact TXL
- Contact TXL
- Contact TXL
- Contamination
- Contamination
- Contract Analysis Labs
- Contributing Editors
- Contributing Editors
- Contributors
- Core Hole Lifetimes – FWHM
- Corrosion
- Cr – Basic Spectra
- Creeping Lubricants
- Crist – Handbooks of Monochromatic XPS
- Crist – PDF Book of Commercially Pure Metal Oxides
- Crist – PDF Book of Polymers
- Crist – PDF Book of RE Oxides, Carbonates, Hydroxides, Sulfides, Nitrides…
- Crist – PDF Book of Semiconductors
- Crist – PDF Book of The Elements & Native Oxides
- Crist – Spectra Handbook – Metal Oxides
- Crist – Spectra Handbook – The Elements & Native Oxides
- Crist Empirical IP eSFs – Scofield Base
- Crist Handbook Series – Parameters
- Crist Publications for Download
- Crist Table of BEs & FWHMs
- Crist Table of BEs & FWHMs
- Crist Table of BEs & FWHMs
- Critical Review of NIST XPS BEs
- Cs – Basic Spectra
- CSA Standards
- Cu – Basic Spectra
- Curve-fitting = Peak-fitting
- Data
- Data Collection Settings
- Data Collection Settings
- Data Collection Software
- Data File Formats
- Data Processing Steps
- Data Processing Steps
- Data Quality
- Data Quality
- Degradation
- Degradation
- Degradation due to Ar+ Ion Etching
- Degradation due to Flood Gun Electrons
- Degradation due to X-ray Flux
- Degradation of Polymers
- Deposited Gold
- Deposited Gold
- Deposited Gold
- Deposition Methods
- Depth of Information
- Depth Profiling
- Differential Charging
- DIN Standards
- DIN Standards
- Documentary Standards and Guidelines
- Don Baer (USA)
- Downloads
- Drawings and Schematics
- Due to Bremsstrahlung
- Due to High Vacuum
- Due to Non-Mono Heat
- Dy – Basic Spectra
- EAG-EuroFin Application Notes
- EAL, Effective Attenuation Length
- Electron Configuration – Atomic Orbitals
- Electronic State Info
- Element Cyclopedia TEMPLATE
- Element X-pedia TEMPLATE
- Element XP-Cyclopedia
- Endpoint Averaging
- Energy loss peak
- Energy Resolution
- Energy Resolution (PE)
- Environmental XPS
- Er – Basic Spectra
- ESCApe
- Eu – Basic Spectra
- EULA
- Examples of Bad Peak-fitting
- Excited States
- Expert Members
- Experts
- Extending Spectrum Range Benefits
- Extrinsic Background
- F – Basic Spectra
- Fe – Basic Spectra
- Features
- Features in Chemical State Spectra
- Features in Survey Spectra
- Fermi Edge
- Fermi Edge (features)
- FG Effect on Native Oxides
- Final & Initial States
- Final State Effects
- flat-database-2
- Flood Gun Effect on Native Oxides
- Flood Gun on Native Oxides, 1 MB (plots)
- Flood Gun Optimization & Alignment
- Flowcharts & Guides
- Fluorides
- Free Membership
- Free Software
- Free XPS Spectra – Free XPS Software
- Free XPS Spectra – ISO 14976
- Frequently Asked Questions
- From Auger Signals
- From Survey Spectra
- Future for XPS Instrument Sales
- Future for XPS Instrument Sales
- Future for XPS Instrument Sales
- FWHM = Peak-width
- FWHM = Peak-width
- FWHM for Peak-fitting Chemical Compounds
- FWHM for Pure Metals – Mono and Non-Mono
- FWHM Information
- FWHM Peak-width vs Pass Energy
- FWHM Peak-width vs Pass Energy (ER)
- Ga – Basic Spectra
- Gas Capture of UHV Gases
- Gas Phase XPS
- Gas Treatments
- Gaussian Lorentzian Model
- Gaussian Lorentzian Models
- Gaussian-Lorentzian Ratios
- Gaussian-Lorentzian Ratios
- Gd – Basic Spectra
- Ge – Basic Spectra
- GI-GO ?
- GOST-R & RuStandards
- Graphene Materials
- Graphs and Charts
- Groups as Members
- gtest
- H – Basic Spectra
- Handbook Series, 34 MB (*.ISO, *.VMS)
- Handbooks – XPS Spectra
- Handbooks of XPS Spectra
- HAXPES
- He – Basic Spectra
- Heat Treatments
- HER Auger Spectra, 12 MB (*.sdp)
- Hf – Basic Spectra
- Hg – Basic Spectra
- Hidden
- High BE Endpoint
- Histogram Plots of NIST BEs
- Histogram Plots of NIST BEs
- History of XPS
- Ho – Basic Spectra
- Home Page (Front)
- Hydrocarbon Carbon (not for calibration)
- Hydroxides
- Hydroxides from Oxides
- HyperPhysics
- I – Basic Spectra
- Imaging – Mapping
- IMFP & AL
- IMFP – Metal vs Metal Oxide
- In – Basic Spectra
- In-Situ Treatments
- Index / Site-map
- Industrial Goods, 67 MB (*.vgd)
- Industrial Labs
- Initial & Final States
- Inside View – Analysis Chamber
- Instrument Buying Guide
- Instrument Component Suppliers
- Instrument Components
- Instrument Design
- Instrument Details & Adjustments
- Instrument Geometries
- Instrument Makers
- Instrument Makers
- Instrument Operation
- Instrument Service
- Instrument Training by Maker
- Instruments
- Insulator Band Gap
- Integration Endpoints
- Interactive Visualizations
- International Conferences – XPS
- International XPS Instrument Registry (IXIR)
- Intrinsic and Extrinsic Losses
- Intrinsic Signal
- Ion Beam Etching
- Ion Etch Rate Films
- Ion Etch Rate Tables
- Ion Etched Elements – Capture UHV Gases
- Ion Etching
- Ion Etching – Ag, Au, Cu
- Ion Etching Variables
- Ir – Basic Spectra
- ISO 18115-1:2013 XPS Terms
- ISO BE Standards
- ISO Standards
- IXIR
- IXIR Database ON-LINE
- σ, SF, ASF, RSF, and e-RSF
- JEOL – XPS Handbook
- JIS Standards
- Job Openings for XPS
- Job Openings for XPS
- John Moulder (USA)
- John T. Grant
- Journal Editors
- Journals & Publishers
- K – Basic Spectra
- Kateryna Artyushova
- Knowledge Base
- Kr – Basic Spectra
- Kratos – XPS Handbook
- Kratos Application Notes, etc.
- Kratos SFs – Scofield SFs until 1995
- KSA Standards
- La – Basic Spectra
- Landing Page
- Laser-XPS
- Legal Witness
- Li – Basic Spectra
- Li, Na, K, Rb, Cs
- Licensing by Membership
- Lifetime of Clean Surfaces
- Limits & Weaknesses
- Linear Background
- Linear Background
- Linked-In people who want On-Line Self-training
- Links
- Links to >700 pages at TXL
- List of Members
- Literature Spectra (used as Reference Spectra)
- Log-In Here
- Logo’s
- Lorentzian % – Excessive
- Lorentzian % – Excessive
- Lu – Basic Spectra
- Lubricants
- Makers
- Mark C. Biesinger
- Materials Analysis Methods – List
- Matthew Linford
- Member Benefits
- Metal Oxides – Binary
- Mg – Basic Spectra
- Miscellaneous, 60 MB (*.txt)
- Mn – Basic Spectra
- Mo – Basic Spectra
- Molybdates
- Multi-Pak
- Multiplet Splitting
- Multiplet Splitting
- Multiplet Splitting
- Multiplet Splitting – 2p – Cr, Mn, Fe, Co, Ni, Cu
- Multiplet Splitting – 3s – Orbitals
- Multiplet Splitting – Cr, Mn, Fe, Co, Ni, Cu
- Multiplet Splitting – La, Ce, Pr, Nd, Sm, Eu, Gd, Tb
- Multiplet Splitting and BE Shifts
- Multiplet Splitting Calculated by P. Bagus
- MultiQuant – XPS
- My account
- My Personal Account
- N – Basic Spectra
- Na – Basic Spectra
- NanoParticle Suppliers
- National Labs and Research Institutes
- Native Oxide Spectra – BE of C (1s) ?
- Native Oxides
- Native Oxides – Examples
- Native Oxides FG ON-OFF, 5 MB (*.sdp)
- Native Oxides, 16 MB, FG OFF (*.vgd)
- Natural FWHM
- Natural Oxidation
- Nb – Basic Spectra
- Nd – Basic Spectra
- Ne – Basic Spectra
- Neal Fairley (UK)
- Necsa-Bio Polymers, 2 MB (*.mrs)
- Negligence
- News
- Ni – Basic Spectra
- Niobates
- NIST BEs
- Nitrides
- Noise
- Noisy Data – Coal
- Noisy Data – Ni metal
- O – Basic Spectra
- Old Links
- On-Site Professional Teachers
- On-Site Professional Teachers
- One Electron Approximation
- Operating Conditions
- Original S-Probe, 90 MB (*.mrs)
- Os – Basic Spectra
- Our Sponsors
- Overlaid Chemical State Spectra – Examples
- Overlapping Doublets – Sulfur
- Overlapping Peaks
- Overlapping Peaks
- Overlapping Peaks
- Oxidation Treatments
- P – Basic Spectra
- Partnerships & Sponsorships
- Pass Energies: 5-300 eV
- Paul S. Bagus
- Pb – Basic Spectra
- Pd – Basic Spectra
- PDMS – Silicone Oil
- Peak Area Ratios – PET
- Peak Area vs Background Endpoints
- Peak Base and Top
- Peak-fit Examples
- Peak-fit Models
- Peak-fit Quality
- Peak-Fit Review Service
- Peak-fits of Principal Signals – Elements
- Peak-fitted Spectra Examples
- Peak-fitting = Curve-fitting
- Peak-fitting a Single O (1s) Peak
- Peak-fitting a Single O (1s) Peak – Easy!
- Peak-fitting Flow-Chart
- Peak-fitting Guides
- Peak-fitting Process – Examples
- Peak-fitting Process – Examples
- Peak-fitting Results
- Peak-fitting Variables
- Peak-shape – Example #1
- Peak-shape – Example #1
- Peak-Shapes (charging)
- Peak-Shapes (charging)
- Peak-Shapes (G, L, V)
- Peak-Shapes (G, L, V)
- Peak-Shapes (G, L, V)
- Peak-Shapes (G, L, V)
- Performance vs Specification
- Periodic Table of BEs
- Periodic Tables
- Perovskite Suppliers
- Peroxides
- PHI – XPS Handbook of Spectra – The Elements
- PHI – XPS Handbooks
- PHI Handbook Pages
- PHI Handbook Spectra, 6 MB (*.spe)
- Phosphates
- Photoelectron BE Diagrams
- Photoemission Process
- Photos of Samples
- Physics & Theory
- Physics of XPS
- Physics of XPS
- Plasma Treatments
- Plasmon Loss Peaks
- Plasmon Loss Peaks (features)
- Plasmon or Shake-up – Which?
- Plots Comparing SFs
- Polymer Spectra
- Polymer Suppliers
- Polymers, 46 MB (*.sdp)
- Polymers2
- Posters & InfoGraphics
- PPT / PDF Presentations
- Pr – Basic Spectra
- Precision
- Press Center
- Price for Professional Membership
- Privacy Policy
- Professional Members
- Professional Teachers
- Professors who Donated
- Pt – Basic Spectra
- Pt overlaps Al – ratios
- Publishing XPS Data
- Publishing XPS Data
- Publishing XPS Data
- Publishing XPS Data
- Publishing XPS Data
- Publishing XPS Experimental Details – Journals
- Purchase Professional Membership (US$)
- Pure Element – Survey Spectra + L
- Pure Element Spectra – Main Signals
- Pure Element Spectra – Survey Scans
- Pure Elements
- Pure Single Crystal – CaCO3 (Calcite)
- Quantification – Atom%s
- Quantification – Atom%s
- Quantification – Atom%s
- Quantification – Atom%s
- Quantum Mechanics of XPS
- Quases
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- Synchrotrons for XPS
- Synthetic Peaks
- Ta – Basic Spectra
- Tables & Guides
- Tb – Basic Spectra
- Tc – Basic Spectra
- Te – Basic Spectra
- Teaching Members
- Team
- Technical Support
- Tellurides
- Temp
- Terms & Phrases for XPS
- Terms of Use
- Tesla Coil Irradiation
- Tesla Coil Irradiation Effects
- TEST
- Test Page
- Tests of RSFs
- Th – Basic Spectra
- The History of XPS
- Thermo Application Notes
- Thermo K-Alpha XPS
- Thermo’s Modified Scofield SFs Al X-rays
- Thickness Estimates
- Ti – Basic Spectra
- Titanates
- Tl – Basic Spectra
- Tm – Basic Spectra
- ToF-SIMS Information Depth
- Too Many Peaks – O (1s) – native SiOx
- Tougaard Backgound
- Tougaard Background
- Tougaard Background
- TPP-2M and IMFPs
- TPP-2M IMFP Calculator
- Trace level signals
- Training & Videos
- Translate TXL Website to Your Language
- Translate TXL Website to Your Language
- Transmission Function
- Transmission Function
- Trouble-Shooter Pro
- Troubleshooting
- Tungstates
- TXL #2, 2.0 GB (*.vgd)
- TXL HQ IP-eSF, 340 MB (*.vgd)
- TXL Members
- TXL Misc, 60 MB, (*.vgd)
- TXL Store
- TXL Ultimate, 3 GB (*.txt, *.sdp, *.vgd)
- U – Basic Spectra
- UHV Gas Capture, 1 MB (3d plots)
- UKSAF Links
- Ulvac-PHI Application Notes
- Ulvac-PHI ASFs
- Ulvac-PHI ASFs – March 2002
- Ulvac-PHI SFs as Plots
- Unifit
- University Labs
- Useful Websites
- V – Basic Spectra
- Valence Band Examples
- Valence Band Spectra – Elements
- Valence Band, 3 MB (*.txt, *.sdp)
- Vanadates
- Vegh Background
- VG Eclipse Database, 9 MB (*.dts)
- Vibrational Bands – Gases & Polymers
- Video of Website Menus
- Videos of TXL Website
- Vincent Fernandez
- Vincent S. Smentkowski (USA)
- Vocabulary
- Voigt Peak-shape
- W – Basic Spectra
- Wagner Book of XPS BEs (NIST)
- Wagner SFs – Al X-rays – PHI Modified for 5800 Omni-5
- Wagner SFs – Al X-rays – PHI Modified for MultiPak v8
- Wagner SFs – Al X-rays – Empirically Defined : F (1s)=1.0 vs C (1s)=1.0
- Wagner’s Original ASFs
- Wall Charts & Wall Posters
- Website Menus Display
- Wikipedia – XPS
- Work Functions of Elements
- X-pedia for Elements
- X-ray Beam Alignment
- X-ray Beam Size
- X-ray Data Booklet – LBL
- X-ray Degradation of Polymers, 1 MB (*.sdp)
- X-ray Energies
- X-ray Energies
- X-ray Sources
- XI – Application Notes
- XI Sample Spectra
- XML Site-Map of The XPS Library
- XPS
- XPS (.SDP format) 7304 data-sets
- XPS (.SDP format) 7304 data-sets
- XPS (.VMS, .ISO, .TXT) 3177 data-sets
- XPS (.VMS, .ISO, .TXT) 3177 data-sets
- XPS (.VMS, .ISO, .TXT) 3177 data-sets
- XPS Basics
- XPS Basics
- XPS BE On-line Database – NIST
- XPS by Element
- XPS Detection Limit
- XPS Detection Limits
- XPS Detection Limits
- XPS Instruments, Components & Parts Makers
- XPS International Application Notes
- XPS International Database Websites
- XPS Job Openings
- XPS Jobs at XPS Makers
- XPS Jobs at XPS Makers
- XPS Journals
- XPS Labs
- XPS Labs around the World
- XPS Library – SEO TERMS
- XPS Manufacturers who Donated
- XPS Opportunities at Contract Analysis Labs
- XPS Papers – NIST
- XPS Peak-fitting MOVIES
- XPS Service by TXL
- XPS Simplified, 14 MB (*.vgd)
- XPS Spectra & AES Spectra Libraries
- XPS Theory
- XPS Training Videos
- Y – Basic Spectra
- Yb – Basic Spectra
- Your Suggestions – Your Ideas to improve TXL
- Zn – Basic Spectra
- Zr – Basic Spectra
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