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Cheat-Sheet B Vincent Crist 2019-10-27T18:17:46-07:00
Cheat-Sheet Check List (Do List)
Producing & Publishing XPS Data from Simple Materials
This list assumes that you are allowed to operate the XPS instrument, the Argon Ion (Ar+) etching gun, and know how to exchange sample mounts safely.
X-ray Type:Â Monochromatic Aluminum X-rays Â
Check “Instrument Status” before trying to use the XPS instrument
Is a sample still inside the analysis chamber?
If true, then remove sample
If there are no samples inside, then continue
Is the sample-viewing camera or microscope working?
Is vacuum in analysis chamber <1 x 10 (-7) mTorr?
If true, then you are ready to check instrument Calibration BEs, flood gun alignment, and X-ray beam position
Cut each Calibration Metal to ~5 x 10 mm size. Trap metals using screws or clips. Do NOT use double-sided conductive tape.
Using a clean single edged razor blade, scrape a 4×4 mm area on the Copper (Cu) sample used to check the Calibration BEs
Cut a piece of polypropylene to be ~5 x 5 mm size. Scrape the surface with a clean single edged razor blade or a knife. Use double sided tape (3×3 mm) to hold polypropylene.
Load sample mount that has all 3 Calibration Metals (Cu, Ag, Au), polypropylene (or Teflon), and X-ray Phosphor (P-31, ZnS) into Prep-Lock (Load-lock)
Wait until pressure is <1 x 10 (-7) mTorr
Pressure should be <5 x 10 (-8) if you want to collect data to be published
If pressure is >1 x 10 (-6) mTorr, absolutely do NOT turn on any filaments. Immediately Contact Service.
NOTE:Â If vacuum pressure is >1 x 10 (-6) mTorr, then all collected data will be bad and filaments oxidized or broken.
Is cooling water used to cool Aluminum X-ray source running?
Is water flow rate high enough? (>3 L/min). If true, then continue
Is water line cool, not cold, to touch? (If too cold, then condensation can cause corrosion.)
Record “Calibration BEs” and check X-ray Beam position using ZnS phosphor
If X-rays are ON, then turn X-rays OFF
If Flood Gun (FG) is ON, then turn FG OFF
Transfer “Calibration Metals” (Cu, Ag, Au), polymer (polypropylene or Teflon) and X-ray Phosphor (P-31) from Load-Lock into “Analysis Chamber”
Was Copper (Cu) Calibration Metal sample scraped? If not, then you will need longer ion etching to remove oxide.
Move “X-ray Phosphor” (ZnS, type P-31) to standard “Sample Analysis Position”
When pressure is <1 x 10 (-7) mTorr, continue
Turn ON X-rays
Maximum power settings
Largest spot size
Turn ON Argon Ion (Ar+) Gun to standby condition
Make sure that ion gun has Argon gas – Do not flood the ion gun with too much Argon (if too much Argon, then filament may break)
Select maximum acceleration voltage conditions (2-5 keV)
Select maximum current
Select 4 x 2 mm (or 4 x 4 mm) raster area
(We assume that Argon ion gun is already optimized for routine use.)
Adjust stage height to bring ZnS phosphor into good optical focus (Can you see grains?)
NOTE:Â Good Optical Focus can be different from Good Electronic Focus by as much as 200 microns up or down
When sample is not at good electronic focus, then count-rate drops by 10-15% of maximum countrate
When sample is not at good electronic focus, then the BEs can shift by 0.1-0.2 eV from true value
Verify that X-ray Beam center is nearly same as Green X-ray Spot on ZnS phosphor (Never ion etch ZnS)
If not, then adjust optical microscope (or camera) to match
Record Z-Height, and save as “Home Position” (record XYZ position)
Move Copper (Cu) to “Home Position”
Set analysis conditions to measure Cu (2p3) BE at 932.6 eV (KE = 554 eV) using a 10 eV narrow scan mode, or a SnapShot mode (~20 eV window)
Using fast scan conditions with a large Pass Energy, adjust Z-Height until you find Z-Height position that gives maximum count-rate for Cu (2p3) signal
Record XYZ position
Change argon ion gun from standby to operate (unblank) for a minimum of 60 seconds to remove carbon or oxygen from the freshly scraped Copper surface
Using fast scan conditions , adjust Z-Height to find Z-Height position that gives maximum count-rate for Cu (2p3) signal
If best count-rate position has changed, then record new XYZ position, and teach new position as new HOME position
Change fast scan conditions to measure Oxygen (1s) signal at 530 eV
Measure Oxygen (1s) signal for 1-2 scans or use SnapShot mode (10 sec or continuous).
If the Oxygen (1s) signal is very noisy, then the Copper surface is clean
If the Oxygen (1s) signal is large, then ion etch Copper again, for 2-3 minutes
NOTE: If ion gun is not properly aligned to overlap X-ray Spot, then argon ion etch rate is very small. Stop and adjust ion gun.
Now we are ready to record the Calibration BE of Cu (2p3), Cu (3p) and Valence Band region
Select Pass Energy that you normally use to measure high energy resolution (chemical state) spectra
Use a 10 eV window to record Cu (2p3)Â (2 scans)Â [928 – 938 eV]
Use a 30 eV window to record Cu (3p)Â Â (2-3 scans)Â [60-90 eV]
Use a 30 eV window to record Cu Valence Band and Fermi Edge (3-4 scans)Â [ -10 to + 20 eV]
To check for cleanliness, and to check the “Transmission Function” of the instrument, collect two survey spectra from the copper sample
Energy range:Â -10 to 1100 eV
Pass Energies:Â Largest pass energy and pass energy used to measure high energy resolution (chemical state) spectra
Number of Scans: one (1) scan
Step Size:Â 0.7-1.0 eV/step
Move Gold (Au) to “Home Position”
Set analysis conditions to measure Au (4f) BE at 85 eV (KE = 1401 eV) using a 10 eV narrow scan mode, or a SnapShot mode (~20 eV window)
Using fast scan condition s with a large Pass Energy, adjust Z-Height until you find Z-Height position that gives maximum count-rate for Au (4f) signal
Record XYZ position
Change argon ion gun from standby to operate (unblank) for a minimum of 60 seconds to remove carbon from the Gold (Au) surface
Now record the Calibration BE of Au (4f) signal
Select Pass Energy that you normally use to measure high energy resolution (chemical state) spectra
Use a 10 eV window to record Au (4f)Â (2 scans)Â [79-89 eV]
Thank You. You have completed the essential recording of Calibration BEs from freshly cleaned Calibration Metals (Cu and Au)
If you prefer to include Ag (3d) signal, then repeat the Gold cleaning and analysis procedure using Ag (3d) BE at 368.2 eV
For Insulating Sample – check if Electron Flood Gun is properly aligned
Turn ON the electron Flood Gun (charge neutralizer)
Set FG voltage = ~4 eV (10 mA) for older instruments, or
For very modern instruments, set FG voltage = 0.1 eV
Move the polypropylene or Teflon sample to “Home Position”
Move sample 2-3 mm in X and Y to spray electrons over the entire surface which produces a uniform electrical charge over the sample
Move to the center of the polypropylene (or Teflon) sample
Set analysis conditions to measure C (1s) BE at 284 eV for polypropylene (or 292 eV for Teflon) using a 20 eV narrow scan mode, or a SnapShot mode (~20 eV window)
Using fast scan condition s with a large Pass Energy, adjust Z-Height until you find Z-Height position that gives maximum count-rate for C (1s) signal
Record XYZ position
If the electron Flood Gun is properly aligned, then the C (1s) signal will be symmetrical and have a FWHM <1.4 eV after peak-fitting
If you see a small shoulder or a slope on the low BE side, then the Flood Gun needs to be aligned (the shoulder is due to differential charging)
If you look at this webpage (https://xpslibrary.com/charge-compensation ) then you will see examples of differential charging and FWHM for polypropylene and Teflon
Place a transparent ruler or straight edge on your computer screen. Line the edge to the center of the C (1s) peak maximum
Adjust the X and Y voltage settings (or the physical position) of the flood gun
The C (1s) peak will shift to the right to lower BE if you are improving charge control
The C (1s) peak will shift to the left to higher BE if you are making the charge control worse
Adjust X and Y several times until the C (1s) BE for polypropylene is below 285.0 eV. For Teflon, the C (1s) BE is ~292 eV.
If the X and Y voltage positions are optimized, then the FWHM will be <1.3 eV.
If the C (1s) BE and FWHM are not improving enough, then increase the current and the voltage of the electron flood gun by 10%
NOTE: electrons from the flood gun can and do cause degradation of a few materials. Avoid very high voltage and high current settings
NOTE:Â if you place a 90% transparent metal mesh-screen ~1 mm above the surface of the sample, then the electric field will decrease and you will get better results (https://xpslibrary.com/charge-compensation )
Now, you are ready to collect useful and reliable BEs from both conductors and non-conductors (insulators)
Remove the Calibration Metals samples and load your samples.
If you have a large sample mount (e.g. >50 x 50 mm, then you should load your samples, the Calibration Metals, the polypropylene, and X-ray phosphor, all together to save time)
Prepare Sample
NOTES:
Do NOT wear latex gloves (cheap latex gloves have Silicone Oil on outside that contaminate your UHV chamber)
Do NOT rinse or wipe surface with acetone or IPA, unless you know that someone has touched the surface to be analyzed.
We use Scotch-brand double-sided adhesive tape – very small pieces
Smaller sample size minimizes waiting time for sample to finish outgassing, especially porous materials (paper, powder, soft plastic…)
Smaller sample size gives better charge control – near edge usually
Decide if sample will degrade by exposure to monochromatic X-rays
If you suspect that the sample will definitely degrade , then after collecting each spectrum, move sample by 2 mm before collecting next spectrum, and also collect fast 1 scan survey spectrum at start, and also at finish – compare – look for changes in peak heights
Solid sample – non-conductive (ceramic, plastic, glass, non-porous, insulator)
Avoid screws, masks, and clips to hold samples – they can cause differential charging near the metal piece
Place a 10 x 10 mm piece of Scotch brand non-conductive double sided tape on sample stage/mount (must be slightly bigger than sample size)
Use fine sandpaper to clean both edges of a single-edged razor blade or knife, then wipe edge with IPA or acetone
Cut or break sample until it is slightly smaller than ~9 x 9 mm (or ~9 x 20 mm). (This style stops outgas from still exposed tape.)
Scribe a line down the middle of the sample, or use Sharpie marker to make a line (Sharpie pens have silicone, but very little)
On one side of the scribe line, scrape a 3×3 mm region of surface at 90 deg angle with the freshly cleaned razor blade or knife
Use 2 pairs of tweezers – press corners of sample onto double-sided tape
Or, place clean Aluminum foil (kitchen) on top of sample, press to make flat, and discard Al foil
(Fresh exposed bulk of sample can also give useful results)
Small grain or powder sample (normal laboratory air)
NOTES:Â
Old powders collect moisture from air or CO2 and may change surface chemistry over time. Drying in a vacuum oven may help.
Brand new bottles of powders from chemical maker may be dirty with adventitious carbon, stabilizers, or contaminants
Brand new bottles of powders from cheap manufacturing companies will very likely be dirty, have water of hydration – not reported, and have contaminants
Clean mortar, pestle, and spatula with acetone and IPA 5 minutes before using. Blow dry with clean air or nitrogen. Do not use canned gases.
Using a clean mortar and pestle, grind grains or powder gently for ~5 minutes
Use freshly cleaned spatula to transfer and press powder onto non-conductive double sided tape (tape size: 5 x 5 mm)
Use swab or Q-tip to gently brush off excess powder – trap excess powder in empty glove. Tie glove closed. Dispose safely.
Solid sample – conductive (pure element, film, steel, alloy, wire, fiber, ball-bearing)
Use electrical ohm-meter to measure conductivity at surface. Metals often have thick insulating oxides or machine oils due to production
Clean edges of metal cutting shears with acetone and sandpaper before cutting sample
Cut sample to be 10 x 10 mm or 20 mm x 20 mm.
Scrape a small region where you put the screw or clip that traps sample
Scribe a line down the middle of the sample (or use Sharpie pen)
Scrape a 4 x 4 mm region with a clean single edged razor blade or knife
Solid wafer – semiconductor
Cleave wafer to be 10 x 10 mm. Gently scribe a line down the middle or use a Sharpie pen
Use a clip or a screw to trap the sample onto the sample mount, or use graphite paint to trap the sample
If you need true bulk information, then cleave the wafer in a glove box or cleave the wafer in air and very quickly load it into the load-lock
NOTE: Do NOT use the electron flood gun on semiconductors. BE sure the FG is turned OFF unless you truly need it to control charging.
Choose Instrument Settings for Data Collection
X-ray Power:Â Maximum power
X-ray Beam Size:Â Maximum beam size
Flood Gun Setting:Â ~4 eV with 10 mA current, or 0.1 eV for dual beam source (Ar+/e-) for truly insulating samples (NOT semiconductors)
Usual electron take-off-angle
Choose Data Collection Variables and Collection Settings for Each Position (Sample)
Always analyze as received first – before any ion etching
Survey Spectrum #1:Â -10 eV to 1,100 eV, 1 eV/step (1 eV/channel), 50 msec/step, 3-5 scans
C (1s) spectrum:Â 275 – 305 eV, PE =50 eV, 0.1 eV/step, 50 msec/step, 5-10 scans
O (1s) spectrum:Â 515 – 575Â eV, PE =50 eV, 0.1 eV/step, 50 msec/step, 5-10 scans
Element signal #1 spectrum:Â xxx-xxx eV (60 eV window), PE =50 eV, 0.1 eV/step, 50 msec/step, 5-10 scans
Element signal #2 spectrum:Â xxx-xxx eV (60 eV window), PE =50 eV, 0.1 eV/step, 50 msec/step, 5-10 scans
Valence Band spectrum:Â -10 – 40 eV, PE =100 eV, 0.2 eV/step, 50 msec/step, 10-20 scans
Auger Signal Spectrum: xxx-xxx eV (100 eV window), PE =100 eV, 0.2 eV/step, 50 msec/step, 5-10 scans
Survey Spectrum #2:Â -10 eV to 1,100 eV, 1 eV/step (1 eV/channel), 50 msec/step, 3-5 scans
NOTE:Â The repeat 2nd survey spectrum checks for sample degradation due to analysis
Collect the second survey spectrum after very soft ion etching that removes only 1-2 nm of adventitious carbon
Define and Record each position to be analyzed. Take photo of sample inside instrument if possible.
Move stage to locate center of each sample position to be analyzed
Select O (1s) signal at 530 eV (NOTE:Â Oxygen and carbon exist on all as-received samples)
Select “snapshot” or “fast scan conditions” to measure the O (1s) signal intensity
Adjust Z-Height to get the strongest intensity for the O (1s) signal
Define/Record each sample position to be analyzed
NOTE: Optical focus is often wrong by 100-200 microns. Better to use electronic focus
Collect Data
Define sample analysis position #1 using Snapshot mode or fast scan mode to find maximum (best) count rate from O (1s) or C (1s) signals
Continue collecting data from each sample or sample position
If degradation is suspected, then move to fresh position ~2 mm away, to define a new fresh position to collect the next spectrum
Do not use slits or apertures
Do not tilt sample
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Peak-Shapes (charging)
Peak-Shapes (G, L, V)
Peak-Shapes (G, L, V)
Peak-Shapes (G, L, V)
Peak-Shapes (G, L, V)
Performance vs Specification
Periodic Table of BEs
Periodic Tables
Perovskite Suppliers
Peroxides
PHI – XPS Handbook of Spectra – The Elements
PHI – XPS Handbooks
PHI Handbook Pages
PHI Handbook Spectra, 6 MB (*.spe)
Phosphates
Photoelectron BE Diagrams
Photoemission Process
Photos of Samples
Physics & Theory
Physics of XPS
Physics of XPS
Plasma Treatments
Plasmon Loss Peaks
Plasmon Loss Peaks (features)
Plasmon or Shake-up – Which?
Plots Comparing SFs
Polymer Spectra
Polymer Suppliers
Polymers, 46 MB (*.sdp)
Polymers2
Posters & InfoGraphics
PPT / PDF Presentations
Pr – Basic Spectra
Precision
Press Center
Price for Professional Membership
Professional Members
Professional Teachers
Professors who Donated
Pt – Basic Spectra
Pt overlaps Al – ratios
Publishing XPS Data
Publishing XPS Data
Publishing XPS Data
Publishing XPS Data
Publishing XPS Data
Publishing XPS Experimental Details – Journals
Purchase Professional Membership (US$)
Pure Element – Survey Spectra + L
Pure Element Spectra – Main Signals
Pure Element Spectra – Survey Scans
Pure Elements
Pure Single Crystal – CaCO3 (Calcite)
Quantification – Atom%s
Quantification – Atom%s
Quantification – Atom%s
Quantification – Atom%s
Quantum Mechanics of XPS
Quases
Rare Earth Materials…, 36 MB (*.vgd)
Rare Earth Metals – Principle
Rare Earth Suppliers
Rb – Basic Spectra
Re – Basic Spectra
Reference Materials
Registration Form – IXIR System
Reliable BEs ?
Reliable Peak-fits ?
Repeatability
Reproducibility
Research Members
Rh – Basic Spectra
Ru – Basic Spectra
S – Basic Spectra
s, p, d, f Peak-widths
S-Probe, 200 MB (*.mrs, ASCII)
Sample (Specimen)
Sample (specimen) Handling
Sample (specimen) History
Sample (specimen) Storage
Sample Degradation
Sample Mount Charge-up
Sample Mounts
Sample Prep Equipment
Sample Preparation Bench
Sample Preparation Methods
Sample Size, Shape & Form
Satellite Peaks?
Sb – Basic Spectra
Sb overlaps O – ratios
Sc – Basic Spectra
Scattering Effects
SCE Values
Scofield SFs – Al X-rays – Crist Modified for Thermo K-Alpha
Scofield SFs – Al X-rays – Theoretically Calculated – Central Field Potential – SCF
Scofield SFs – Al X-rays – Thermo Modified
SDP_v8 software
Se – Basic Spectra
Selenides
SEM-EDS Information Depth
Semiconductor Suppliers
Sessa
SF Table #6
Shake-up – Cu (2+) vs Cu (1+)
Shake-up – pi to pi*
Shake-up peaks
Shake-up Structures
Sherwood & Proctor Background
Shirley Background
Shirley Background
Shop
Si – Basic Spectra
Signal-to-Noise (S/N)
Silicates
Silicides
Simple Peak-fit Examples
Simple Peak-fit Examples 2
Single Crystal Suppliers
Single Crystal Suppliers
Single Crystals, 240 MB (*.vgd)
Single Xtals, 2D, Graphene, Nano, Perovskite
SiS Standards
Sm – Basic Spectra
Smoothing – Bad vs OK
Sn – Basic Spectra
Software
Software Operation
Source of Spectra in The XPS Library
SpecMaster Pro, 1.8 GB (*.sdp)
SpecMaster, 527 MB (*.sdp)
Spectra Data Processor (SDP) – 2 yrs Free
Spectra Data Processor v7 – Training Videos
Spectra Examples
Spectra Handbooks
Spectra-Bases #1
Spectra-Bases #2
Spin-Orbit Coupling
Spin-Orbit Coupling
Spin-Orbit Coupling
Sr – Basic Spectra
SRD 64 Electron Elastic Scattering Cross-Sections
SRD 71 Electron IMFP Database
SRD 82 Electron EAL Database
Standards
Statistics
Sticking Coefficients
Store
Strategic Partners
Sub-Structure
Subscriptions
Sulfates
Sulfides
Sulfides from H2S (air)
Summaries of BE Tables – NIST
Summaries of BE Tables – NIST
Super Coster-Kronig Effect – Ti (2p1) in TiO2
Surface Charging
Surface Chemical Reaction
Surface Chemistry
Surface Contaminants
Surface Photo-Chemistry
Surface Reactivity
Surface Science Western (UWO) Application Notes
SurfaceSpectra – XPS Handbook of Polymer Spectra
Survey Spectra Examples
Sven Tougaard
Synchrotron Labs
Synchrotrons
Synchrotrons for XPS
Synthetic Peaks
Ta – Basic Spectra
Tables & Guides
Tb – Basic Spectra
Tc – Basic Spectra
Te – Basic Spectra
Teaching Members
Team
Technical Support
Tellurides
Temp
Terms & Phrases for XPS
Terms of Use
Tesla Coil Irradiation
Tesla Coil Irradiation Effects
TEST
Test Page
Tests of RSFs
Th – Basic Spectra
The History of XPS
Thermo Application Notes
Thermo K-Alpha XPS
Thermo’s Modified Scofield SFs Al X-rays
Thickness Estimates
Ti – Basic Spectra
Titanates
Tl – Basic Spectra
Tm – Basic Spectra
ToF-SIMS Information Depth
Too Many Peaks – O (1s) – native SiOx
Tougaard Backgound
Tougaard Background
Tougaard Background
TPP-2M and IMFPs
TPP-2M IMFP Calculator
Trace level signals
Training & Videos
Translate TXL Website to Your Language
Translate TXL Website to Your Language
Transmission Function
Transmission Function
Trouble-Shooter Pro
Troubleshooting
Tungstates
TXL #2, 2.0 GB (*.vgd)
TXL HQ IP-eSF, 340 MB (*.vgd)
TXL Members
TXL Misc, 60 MB, (*.vgd)
TXL Store
TXL Ultimate, 3 GB (*.txt, *.sdp, *.vgd)
U – Basic Spectra
UHV Gas Capture, 1 MB (3d plots)
UKSAF Links
Ulvac-PHI Application Notes
Ulvac-PHI ASFs
Ulvac-PHI ASFs – March 2002
Ulvac-PHI SFs as Plots
Unifit
University Labs
Useful Websites
V – Basic Spectra
Valence Band Examples
Valence Band Spectra – Elements
Valence Band, 3 MB (*.txt, *.sdp)
Vanadates
Vegh Background
VG Eclipse Database, 9 MB (*.dts)
Vibrational Bands – Gases & Polymers
Video of Website Menus
Videos of TXL Website
Vincent Fernandez
Vincent S. Smentkowski (USA)
Vocabulary
Voigt Peak-shape
W – Basic Spectra
Wagner Book of XPS BEs (NIST)
Wagner SFs – Al X-rays – PHI Modified for 5800 Omni-5
Wagner SFs – Al X-rays – PHI Modified for MultiPak v8
Wagner SFs – Al X-rays – Empirically Defined : F (1s)=1.0 vs C (1s)=1.0
Wagner’s Original ASFs
Wall Charts & Wall Posters
Website Menus Display
Wikipedia – XPS
Work Functions of Elements
X-pedia for Elements
X-ray Beam Alignment
X-ray Beam Size
X-ray Data Booklet – LBL
X-ray Degradation of Polymers, 1 MB (*.sdp)
X-ray Energies
X-ray Energies
X-ray Sources
XI – Application Notes
XI Sample Spectra
XML Site-Map of The XPS Library
XPS
XPS (.SDP format) 7304 data-sets
XPS (.SDP format) 7304 data-sets
XPS (.VMS, .ISO, .TXT) 3177 data-sets
XPS (.VMS, .ISO, .TXT) 3177 data-sets
XPS (.VMS, .ISO, .TXT) 3177 data-sets
XPS Basics
XPS Basics
XPS BE On-line Database – NIST
XPS by Element
XPS Detection Limit
XPS Detection Limits
XPS Detection Limits
XPS Instrument Manufacturers
XPS International Application Notes
XPS International Database Websites
XPS Job Openings
XPS Jobs at XPS Makers
XPS Jobs at XPS Makers
XPS Journals
XPS Labs
XPS Labs around the World
XPS Library – SEO TERMS
XPS Manufacturers who Donated
XPS Opportunities at Contract Analysis Labs
XPS Papers – NIST
XPS Peak-fitting MOVIES
XPS Service by TXL
XPS Simplified, 14 MB (*.vgd)
XPS Spectra & AES Spectra Libraries
XPS Theory
XPS Training Videos
Y – Basic Spectra
Yb – Basic Spectra
Your Suggestions – Your Ideas to improve TXL
Zn – Basic Spectra
Zr – Basic Spectra
*** International BE Calibration – Status Reports
*** TEMPLATE – 3 column tables
***BE CALIBRATION – RULES
***BE CALIBRATION – RULES
**Membership
**PEAK-FITTING – FACTS, RULES & GUIDELINES
**PEAK-FITTING – FACTS, RULES & GUIDELINES
**Plot Examples
**Registration FORM
**Registration FORM
*Accuracy Limits – LiF as example
*Free Library Membership
*Suggestions
*Table of RSFs – Normalized Scofield SFs
– Periodic Table TEMPLATE v1
– Periodic Table TEMPLATE v2
2D Materials Suppliers
6 Tables of Sensitivity Factors
AAnalyzer
Abbe Criterion
About The XPS Library
Absolute Charge Referencing
Accuracy
Ads
Advanced Interpretation of XPS
Advanced Peak-fitting Examples
Advanced XPS
Advantages of XPS
Adventitious Carbon
Adventitious Carbon
Adventitious Carbon
Advertise
Advertising Members
AES (.SDP, .NPL, .VMS) 2281 data-sets
AES (.SDP, .NPL, .VMS) 2281 data-sets
AFNOR Standards
Ag – Basic Spectra
Al – Basic Spectra
Alberto Herrera Gomez
Alloy & Stainless Steel Samples Kit
amCharts v4 test
Anatomy / Features of Chemical State Spectra
Anatomy / Features of Survey Spectra
Angels who Donated
Anti-Static, Anti-Caking
Application Notes
Application Notes ©
Application Notes from Makers
Applications
Ar – Basic Spectra
AR-XPS
As – Basic Spectra
Assigning Chemical States
ASTM Standards
Asymmetric tail
Asymmetry
Atom% & Shake-up
Atom% gives Empirical Formula
Au – Basic Spectra
Auger (AES) Information Depth
Auger Parameter
Auger Signals
Auger Spectra from XPS – Examples
Avantage
AVS Training Courses
© 2019, Copyrights
B – Basic Spectra
B. Vincent Crist
B. Vincent Crist – CEO
Background
Background – Active Fitting
Background baseline
Background bulge
Background Endpoints
Background Endpoints
Background Noise
Background Shapes for Peak-fitting
Background Shapes for Peak-fitting
Background Subtraction-Removal
Background Type – Shirley or Linear
Background Width
Bad Data
Bad Peak-fits
Bad Peak-fits Explained
Bad Peak-fits Explained
Bad Peak-fits Published in Journals – Explained
Bad Peak-fitting Example
Bad Peak-fitting Example – Ni (2p3)
Bad Peak-fitting or Good Peak-fitting
Bad Survey Spectra
Bagus Papers
BAM Standards
Band Gaps
Band Gaps from Spectra
Baselines for Peak-fitting (S, L, T)
Be – Basic Spectra
BE Calibration – History
BE Calibration Values
BE Lookup Table
BE RELIABILITY – VITAL
BE Reliability Problem
BE Scale Calibration
BE Table – Atomic # Order
BE Tables
Beam Alignment
Beisinger SFs
Benefits
Bi – Basic Spectra
bi-Carbonates
Binary Oxides, 46 MB (*.sdp)
Binding Energy (BE) Scale Calibration
Blog
Books
Borates
Borides
Br – Basic Spectra
BSI Standards
Bubble Chart for Peak-fitting
C – Basic Spectra
C. Richard Brundle
C. Richard Brundle
Ca – Basic Spectra
Calculated IMFP Values
Calibration Checks – Validation
Calibration Metals
Capture of UHV Gases
Carbides
Carbon KLL Auger, 2 MB (*.sdp)
Carbonates
Carbonates from CO2
Careers at TXL
CasaXPS
Catalyst Surface
Catalysts
Cd – Basic Spectra
Ce – Basic Spectra
Ceramics Suppliers
Charge Compensation
Charge Compensation – Beisinger
Charge Control
Charge Correction (Referencing)
Charge Referencing
Charge Referencing (CS)
Charge Referencing Problems
Charge-Control Mesh-Screen
Charging
Charging artifact
Cheat-Sheet
Chemical Shift
Chemical Shifts
Chemical State Assignments
Chemical State Definition
Chemical State Groups, 1 GB (*.vgd)
Chemical State Identification – BE Lookup Table – Ag to Zr
Chemical State Identification – BE Lookup Table – Ag to Zr
Chemical State Peak-fits – Examples
Chemical State Spectra
Chemical State Spectra – OVERLAYS
Chemical State Spectra Peak-fits – Examples
Chemical States
Chemical States
Chemical Suppliers
Chemical Suppliers
Chemical Treatments
Chemical Treatments
Chi-Squared
Chlorides
Circular Dichroism in XPS
Cl – Basic Spectra
Clean Surface
Cleanliness of Surfaces
Client Portal
Co – Basic Spectra
Collections of XPS Spectra
Common Difficulties
Comparison of Background Types
Complex Peak-fits Explained
Components
ComPro v12 (SASJ)
Constrained Peak-fit
Consultants
Contact TXL
Contact TXL
Contact TXL
Contact TXL
Contamination
Contamination
Contract Analysis Labs
Contributing Editors
Contributing Editors
Contributors
Core Hole Lifetimes – FWHM
Corrosion
Cr – Basic Spectra
Creeping Lubricants
Crist – Handbooks of Monochromatic XPS
Crist – PDF Book of Commercially Pure Metal Oxides
Crist – PDF Book of Polymers
Crist – PDF Book of RE Oxides, Carbonates, Hydroxides, Sulfides, Nitrides…
Crist – PDF Book of Semiconductors
Crist – PDF Book of The Elements & Native Oxides
Crist – Spectra Handbook – Metal Oxides
Crist – Spectra Handbook – The Elements & Native Oxides
Crist Empirical IP eSFs – Scofield Base
Crist Handbook Series – Parameters
Crist Publications for Download
Crist Table of BEs & FWHMs
Crist Table of BEs & FWHMs
Crist Table of BEs & FWHMs
Critical Review of NIST XPS BEs
Cs – Basic Spectra
CSA Standards
Cu – Basic Spectra
Curve-fitting = Peak-fitting
Data
Data Collection Settings
Data Collection Settings
Data Collection Software
Data File Formats
Data Processing Steps
Data Processing Steps
Data Quality
Data Quality
Degradation
Degradation
Degradation due to Ar+ Ion Etching
Degradation due to Flood Gun Electrons
Degradation due to X-ray Flux
Degradation of Polymers
Deposited Gold
Deposited Gold
Deposited Gold
Deposition Methods
Depth of Information
Depth Profiling
Differential Charging
DIN Standards
DIN Standards
Documentary Standards and Guidelines
Don Baer (USA)
Donation Please
Donations
Downloads
Drawings and Schematics
Due to Bremsstrahlung
Due to High Vacuum
Due to Non-Mono Heat
Dy – Basic Spectra
EAG-EuroFin Application Notes
EAL, Effective Attenuation Length
Electron Configuration – Atomic Orbitals
Electronic State Info
Element Cyclopedia TEMPLATE
Element X-pedia TEMPLATE
Element XP-Cyclopedia
Endpoint Averaging
Energy loss peak
Energy Resolution
Energy Resolution (PE)
Environmental XPS
Er – Basic Spectra
ESCApe
Eu – Basic Spectra
EULA
Examples of Bad Peak-fitting
Excited States
Expert Members
Experts
Extending Spectrum Range Benefits
Extrinsic Background
F – Basic Spectra
Fe – Basic Spectra
Features
Features in Chemical State Spectra
Features in Survey Spectra
Fermi Edge
Fermi Edge (features)
FG Effect on Native Oxides
Final & Initial States
Final State Effects
flat-database-2
Flood Gun Effect on Native Oxides
Flood Gun on Native Oxides, 1 MB (plots)
Flood Gun Optimization & Alignment
Flowcharts & Guides
Fluorides
Free Membership
Free Software
Free XPS Spectra – Free XPS Software
Free XPS Spectra – ISO 14976
Frequently Asked Questions
From Auger Signals
From Survey Spectra
Future for XPS Instrument Sales
Future for XPS Instrument Sales
Future for XPS Instrument Sales
FWHM = Peak-width
FWHM = Peak-width
FWHM for Peak-fitting Chemical Compounds
FWHM for Pure Metals – Mono and Non-Mono
FWHM Information
FWHM Peak-width vs Pass Energy
FWHM Peak-width vs Pass Energy (ER)
Ga – Basic Spectra
Gas Capture of UHV Gases
Gas Phase XPS
Gas Treatments
Gaussian Lorentzian Model
Gaussian Lorentzian Models
Gaussian-Lorentzian Ratios
Gaussian-Lorentzian Ratios
Gd – Basic Spectra
Ge – Basic Spectra
GI-GO ?
GOST-R & RuStandards
Graphene Materials
Graphs and Charts
Groups as Members
gtest
H – Basic Spectra
Handbook Series, 34 MB (*.ISO, *.VMS)
Handbooks – XPS Spectra
Handbooks of XPS Spectra
HAXPES
He – Basic Spectra
Heat Treatments
HER Auger Spectra, 12 MB (*.sdp)
Hf – Basic Spectra
Hg – Basic Spectra
Hidden
High BE Endpoint
Histogram Plots of NIST BEs
Histogram Plots of NIST BEs
History of XPS
Ho – Basic Spectra
Home Page
Hydrocarbon Carbon (not for calibration)
Hydroxides
Hydroxides from Oxides
HyperPhysics
I – Basic Spectra
Imaging – Mapping
IMFP & AL
IMFP – Metal vs Metal Oxide
In – Basic Spectra
In-Situ Treatments
Index / Site-map
Industrial Goods, 67 MB (*.vgd)
Industrial Labs
Initial & Final States
Inside View – Analysis Chamber
Instrument Buying Guide
Instrument Component Suppliers
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Instrument Design
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Instrument Makers
Instrument Operation
Instrument Service
Instrument Training by Maker
Instruments
Insulator Band Gap
Integration Endpoints
Interactive Visualizations
International Conferences – XPS
International XPS Instrument Registry (IXIR)
Intrinsic and Extrinsic Losses
Intrinsic Signal
Ion Beam Etching
Ion Etch Rate Films
Ion Etch Rate Tables
Ion Etched Elements – Capture UHV Gases
Ion Etching
Ion Etching – Ag, Au, Cu
Ion Etching Variables
Ir – Basic Spectra
ISO 18115-1:2013 XPS Terms
ISO BE Standards
ISO Standards
IXIR
IXIR Database ON-LINE
σ, SF, ASF, RSF, and e-RSF
JEOL – XPS Handbook
JIS Standards
Job Openings for XPS
Job Openings for XPS
John Moulder (USA)
John T. Grant
Journal Editors
Journals & Publishers
K – Basic Spectra
Kateryna Artyushova
Knowledge Base
Kr – Basic Spectra
Kratos – XPS Handbook
Kratos Application Notes, etc.
Kratos SFs – Scofield SFs until 1995
KSA Standards
La – Basic Spectra
Landing Page
Laser-XPS
Legal Witness
Li – Basic Spectra
Li, Na, K, Rb, Cs
Licensing by Membership
Lifetime of Clean Surfaces
Limits & Weaknesses
Linear Background
Linear Background
Links
Links to >700 pages at TXL
List of Members
Literature Spectra (used as Reference Spectra)
Log-In Here
Logo’s
Lorentzian % – Excessive
Lorentzian % – Excessive
Lu – Basic Spectra
Lubricants
Makers
Mark S. Beisinger
Materials Analysis Methods – List
Matthew Linford
Member Benefits
Metal Oxides – Binary
Mg – Basic Spectra
Miscellaneous, 60 MB (*.txt)
Mn – Basic Spectra
Mo – Basic Spectra
Molybdates
Multi-Pak
Multiplet Splitting
Multiplet Splitting
Multiplet Splitting
Multiplet Splitting – 2p – Cr, Mn, Fe, Co, Ni, Cu
Multiplet Splitting – 3s – Orbitals
Multiplet Splitting – Cr, Mn, Fe, Co, Ni, Cu
Multiplet Splitting – La, Ce, Pr, Nd, Sm, Eu, Gd, Tb
Multiplet Splitting and BE Shifts
Multiplet Splitting Calculated by P. Bagus
MultiQuant – XPS
My Personal Account
N – Basic Spectra
Na – Basic Spectra
NanoParticle Suppliers
National Labs and Research Institutes
Native Oxide Spectra – BE of C (1s) ?
Native Oxides
Native Oxides – Examples
Native Oxides FG ON-OFF, 5 MB (*.sdp)
Native Oxides, 16 MB, FG OFF (*.vgd)
Natural FWHM
Natural Oxidation
Nb – Basic Spectra
Nd – Basic Spectra
Ne – Basic Spectra
Neal Fairley (UK)
Necsa-Bio Polymers, 2 MB (*.mrs)
Negligence
News
Ni – Basic Spectra
Niobates
NIST BEs
Nitrides
Noise
Noisy Data – Coal
Noisy Data – Ni metal
O – Basic Spectra
Old Links
On-Site Professional Teachers
On-Site Professional Teachers
One Electron Approximation
Operating Conditions
Original S-Probe, 90 MB (*.mrs)
Os – Basic Spectra
Our Sponsors
Overlaid Chemical State Spectra – Examples
Overlapping Doublets – Sulfur
Overlapping Peaks
Overlapping Peaks
Overlapping Peaks
Oxidation Treatments
P – Basic Spectra
Partnerships & Sponsorships
Pass Energies: 5-300 eV
Paul S. Bagus
Pb – Basic Spectra
Pd – Basic Spectra
PDMS – Silicone Oil
Peak Area Ratios – PET
Peak Area vs Background Endpoints
Peak Base and Top
Peak-fit Examples
Peak-fit Models
Peak-fit Quality
Peak-Fit Review Service
Peak-fits of Principal Signals – Elements
Peak-fitted Spectra Examples
Peak-fitting = Curve-fitting
Peak-fitting a Single O (1s) Peak
Peak-fitting a Single O (1s) Peak – Easy!
Peak-fitting Flow-Chart
Peak-fitting Guides
Peak-fitting Process – Examples
Peak-fitting Process – Examples
Peak-fitting Results
Peak-fitting Variables
Peak-shape – Example #1
Peak-shape – Example #1
Peak-Shapes (charging)
Peak-Shapes (charging)
Peak-Shapes (G, L, V)
Peak-Shapes (G, L, V)
Peak-Shapes (G, L, V)
Peak-Shapes (G, L, V)
Performance vs Specification
Periodic Table of BEs
Periodic Tables
Perovskite Suppliers
Peroxides
PHI – XPS Handbook of Spectra – The Elements
PHI – XPS Handbooks
PHI Handbook Pages
PHI Handbook Spectra, 6 MB (*.spe)
Phosphates
Photoelectron BE Diagrams
Photoemission Process
Photos of Samples
Physics & Theory
Physics of XPS
Physics of XPS
Plasma Treatments
Plasmon Loss Peaks
Plasmon Loss Peaks (features)
Plasmon or Shake-up – Which?
Plots Comparing SFs
Polymer Spectra
Polymer Suppliers
Polymers, 46 MB (*.sdp)
Polymers2
Posters & InfoGraphics
PPT / PDF Presentations
Pr – Basic Spectra
Precision
Press Center
Price for Professional Membership
Professional Members
Professional Teachers
Professors who Donated
Pt – Basic Spectra
Pt overlaps Al – ratios
Publishing XPS Data
Publishing XPS Data
Publishing XPS Data
Publishing XPS Data
Publishing XPS Data
Publishing XPS Experimental Details – Journals
Purchase Professional Membership (US$)
Pure Element – Survey Spectra + L
Pure Element Spectra – Main Signals
Pure Element Spectra – Survey Scans
Pure Elements
Pure Single Crystal – CaCO3 (Calcite)
Quantification – Atom%s
Quantification – Atom%s
Quantification – Atom%s
Quantification – Atom%s
Quantum Mechanics of XPS
Quases
Rare Earth Materials…, 36 MB (*.vgd)
Rare Earth Metals – Principle
Rare Earth Suppliers
Rb – Basic Spectra
Re – Basic Spectra
Reference Materials
Registration Form – IXIR System
Reliable BEs ?
Reliable Peak-fits ?
Repeatability
Reproducibility
Research Members
Rh – Basic Spectra
Ru – Basic Spectra
S – Basic Spectra
s, p, d, f Peak-widths
S-Probe, 200 MB (*.mrs, ASCII)
Sample (Specimen)
Sample (specimen) Handling
Sample (specimen) History
Sample (specimen) Storage
Sample Degradation
Sample Mount Charge-up
Sample Mounts
Sample Prep Equipment
Sample Preparation Bench
Sample Preparation Methods
Sample Size, Shape & Form
Satellite Peaks?
Sb – Basic Spectra
Sb overlaps O – ratios
Sc – Basic Spectra
Scattering Effects
SCE Values
Scofield SFs – Al X-rays – Crist Modified for Thermo K-Alpha
Scofield SFs – Al X-rays – Theoretically Calculated – Central Field Potential – SCF
Scofield SFs – Al X-rays – Thermo Modified
SDP_v8 software
Se – Basic Spectra
Selenides
SEM-EDS Information Depth
Semiconductor Suppliers
Sessa
SF Table #6
Shake-up – Cu (2+) vs Cu (1+)
Shake-up – pi to pi*
Shake-up peaks
Shake-up Structures
Sherwood & Proctor Background
Shirley Background
Shirley Background
Shop
Si – Basic Spectra
Signal-to-Noise (S/N)
Silicates
Silicides
Simple Peak-fit Examples
Simple Peak-fit Examples 2
Single Crystal Suppliers
Single Crystal Suppliers
Single Crystals, 240 MB (*.vgd)
Single Xtals, 2D, Graphene, Nano, Perovskite
SiS Standards
Sm – Basic Spectra
Smoothing – Bad vs OK
Sn – Basic Spectra
Software
Software Operation
Source of Spectra in The XPS Library
SpecMaster Pro, 1.8 GB (*.sdp)
SpecMaster, 527 MB (*.sdp)
Spectra Data Processor (SDP) – 2 yrs Free
Spectra Data Processor v7 – Training Videos
Spectra Examples
Spectra Handbooks
Spectra-Bases #1
Spectra-Bases #2
Spin-Orbit Coupling
Spin-Orbit Coupling
Spin-Orbit Coupling
Sr – Basic Spectra
SRD 64 Electron Elastic Scattering Cross-Sections
SRD 71 Electron IMFP Database
SRD 82 Electron EAL Database
Standards
Statistics
Sticking Coefficients
Store
Strategic Partners
Sub-Structure
Subscriptions
Sulfates
Sulfides
Sulfides from H2S (air)
Summaries of BE Tables – NIST
Summaries of BE Tables – NIST
Super Coster-Kronig Effect – Ti (2p1) in TiO2
Surface Charging
Surface Chemical Reaction
Surface Chemistry
Surface Contaminants
Surface Photo-Chemistry
Surface Reactivity
Surface Science Western (UWO) Application Notes
SurfaceSpectra – XPS Handbook of Polymer Spectra
Survey Spectra Examples
Sven Tougaard
Synchrotron Labs
Synchrotrons
Synchrotrons for XPS
Synthetic Peaks
Ta – Basic Spectra
Tables & Guides
Tb – Basic Spectra
Tc – Basic Spectra
Te – Basic Spectra
Teaching Members
Team
Technical Support
Tellurides
Temp
Terms & Phrases for XPS
Terms of Use
Tesla Coil Irradiation
Tesla Coil Irradiation Effects
TEST
Test Page
Tests of RSFs
Th – Basic Spectra
The History of XPS
Thermo Application Notes
Thermo K-Alpha XPS
Thermo’s Modified Scofield SFs Al X-rays
Thickness Estimates
Ti – Basic Spectra
Titanates
Tl – Basic Spectra
Tm – Basic Spectra
ToF-SIMS Information Depth
Too Many Peaks – O (1s) – native SiOx
Tougaard Backgound
Tougaard Background
Tougaard Background
TPP-2M and IMFPs
TPP-2M IMFP Calculator
Trace level signals
Training & Videos
Translate TXL Website to Your Language
Translate TXL Website to Your Language
Transmission Function
Transmission Function
Trouble-Shooter Pro
Troubleshooting
Tungstates
TXL #2, 2.0 GB (*.vgd)
TXL HQ IP-eSF, 340 MB (*.vgd)
TXL Members
TXL Misc, 60 MB, (*.vgd)
TXL Store
TXL Ultimate, 3 GB (*.txt, *.sdp, *.vgd)
U – Basic Spectra
UHV Gas Capture, 1 MB (3d plots)
UKSAF Links
Ulvac-PHI Application Notes
Ulvac-PHI ASFs
Ulvac-PHI ASFs – March 2002
Ulvac-PHI SFs as Plots
Unifit
University Labs
Useful Websites
V – Basic Spectra
Valence Band Examples
Valence Band Spectra – Elements
Valence Band, 3 MB (*.txt, *.sdp)
Vanadates
Vegh Background
VG Eclipse Database, 9 MB (*.dts)
Vibrational Bands – Gases & Polymers
Video of Website Menus
Videos of TXL Website
Vincent Fernandez
Vincent S. Smentkowski (USA)
Vocabulary
Voigt Peak-shape
W – Basic Spectra
Wagner Book of XPS BEs (NIST)
Wagner SFs – Al X-rays – PHI Modified for 5800 Omni-5
Wagner SFs – Al X-rays – PHI Modified for MultiPak v8
Wagner SFs – Al X-rays – Empirically Defined : F (1s)=1.0 vs C (1s)=1.0
Wagner’s Original ASFs
Wall Charts & Wall Posters
Website Menus Display
Wikipedia – XPS
Work Functions of Elements
X-pedia for Elements
X-ray Beam Alignment
X-ray Beam Size
X-ray Data Booklet – LBL
X-ray Degradation of Polymers, 1 MB (*.sdp)
X-ray Energies
X-ray Energies
X-ray Sources
XI – Application Notes
XI Sample Spectra
XML Site-Map of The XPS Library
XPS
XPS (.SDP format) 7304 data-sets
XPS (.SDP format) 7304 data-sets
XPS (.VMS, .ISO, .TXT) 3177 data-sets
XPS (.VMS, .ISO, .TXT) 3177 data-sets
XPS (.VMS, .ISO, .TXT) 3177 data-sets
XPS Basics
XPS Basics
XPS BE On-line Database – NIST
XPS by Element
XPS Detection Limit
XPS Detection Limits
XPS Detection Limits
XPS Instrument Manufacturers
XPS International Application Notes
XPS International Database Websites
XPS Job Openings
XPS Jobs at XPS Makers
XPS Jobs at XPS Makers
XPS Journals
XPS Labs
XPS Labs around the World
XPS Library – SEO TERMS
XPS Manufacturers who Donated
XPS Opportunities at Contract Analysis Labs
XPS Papers – NIST
XPS Peak-fitting MOVIES
XPS Service by TXL
XPS Simplified, 14 MB (*.vgd)
XPS Spectra & AES Spectra Libraries
XPS Theory
XPS Training Videos
Y – Basic Spectra
Yb – Basic Spectra
Your Suggestions – Your Ideas to improve TXL
Zn – Basic Spectra
Zr – Basic Spectra
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