Ion Etching Variables
- Angle effects
- Argon vs Xenon ions
- Compucentric rotation
- Crater edge effects
- Etch calibration
- Etch rates
- Interface resolution
- Ion beam alignment
- Leak check
- Knock-in effect
- Mild surface cleaning
- Re-deposition
- Relative etch rates
- Rotation based profiling
- Stainless steel tubing not plastic
- Surface reconstruction
- Zalar rotation
Example of Cleaning Metal Surface using Argon Ion Etching using an Auger Instrument
- Angle effects
- Argon vs Xenon ions
- Atom % values
- Chemical state profiling
- Common contaminants
- Compucentric rotation
- Crater edge effects
- Depth profiling
- Detection limits
- Etch calibration
- Etch rates
- Interface resolution
- Ion beam alignment
- Leak check
- Knock-in effect
- Mild surface cleaning
- Plastic tubing
- Re-deposition
- Relative etch rates
- Reverse engineering
- Rotation based profiling
- SnapShot spectra
- Stainless steel tubing
- Surface reconstruction
- Target factor analysis
- Thickness calculations
- Unscanned mode
- XPS vs other techniques
- Zalar rotation