Quantification by XPS – A Perspective   XPS:  A perspective on quantitation accuracy for composition analysis of homogeneous materials JVST, A38, 041001 (2020) https://doi.org/10.1116/1.5143897 (requested by JVST after oral presentation)  C. Richard Brundle C.R. Brundle and Associates 4215 Fairway Drive, Soquel, CA 95073, USA and  B. Vincent Crist The XPS Library Institute – NFP 1091 […]

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