XPS International  – Application Notes – PDFs

• • • Elemental Composition of Native Oxides
    • Polymer Degradation Study – 1988
    • Charge Control Improvement for PHI 5800 XPS System
    • Carbon (1s) BEs from Native Oxides versus Ion Etched Metals
    • BE Lookup Table
    • Asymmetry in Pure Iron (Fe), Cobalt (Co), and Nickel (Ni) Spectra
    • Technique Limits Chart 1
    • Technique Limits Chart 2
    • Signal to Noise versus Number of Scans – Optimization